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    • 1. 发明公开
    • SYSTÈME D'ANALYSE D'UN SIGNAL HYPERFRÉQUENCE PAR IMAGERIE
    • SYSTÈMED'ANALYZE D'UN SIGNALHYPERFRÉQUENCEPAR IMAGERIE
    • EP3213093A1
    • 2017-09-06
    • EP15787937.0
    • 2015-10-22
    • THALESUniversität Leipzig
    • CHIPAUX, MayeulTORAILLE, LoïcDEBUISSCHERT, ThierryLARDAT, ChristianMORVAN, LoicMEIJER, JanPEZZAGNA, Sébastien
    • G01R23/17G01R23/163
    • G01R23/163G01R23/17G01R29/0878G01R33/32G01R33/60
    • The invention relates to a system (10) for analysis of a microwave frequency signal (HF) by imaging, comprising: - a solid material (M) having at least one optical property that is modifiable in at least one zone (Zo) of said material when said zone is simultaneously in the presence of an optical excitation (Eo) or electrical excitation (Ee) and a microwave frequency signal having at least one frequency coincident with a resonance frequency (f
      R ) of the material, said material also having the property that a value of said resonance frequency (f
      R (B)) varies as a function of the amplitude of a magnetic field, - a magnetic field generator (G
      B ) configured to generate a magnetic field (B) having, inside a part of said zone, a spatial amplitude variation (B(x)) along a direction X, said material therefore having a resonance frequency (f
      R (x)) function of a position (x) along said direction X, and - a detector (D) configured to receive an image (Im) of said zone (Zo) along said direction X.
    • 本发明涉及一种用于通过成像分析微波频率信号(HF)的系统(10),其包括:固体材料(M),其具有至少一种光学性质,所述光学性质在所述至少一个区域(Z 0)中可修改 当所述区域同时存在光激励(E 0)或电激励(E e)和具有至少一个与材料的谐振频率(f R)一致的频率的微波频率信号时,所述材料还具有材料 所述谐振频率的值(fR(B))作为磁场的振幅的函数而变化, - 磁场发生器(GB),其被配置为产生磁场(B),所述磁场在所述区域的一部分内 ,沿X方向的空间振幅变化(B(x)),所述材料因此具有沿着所述方向X的位置(x)的谐振频率(f R(x))函数,以及 - 检测器(D) 接收沿着所述方向X的所述区域(Z 0)的图像(I m)。