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    • 2. 发明公开
    • FILTER STRUCTURES FOR PIM MEASUREMENTS
    • 用于PIM测量的滤波器结构
    • EP3203575A1
    • 2017-08-09
    • EP17154615.3
    • 2017-02-03
    • Spinner GmbH
    • Graßl, MartinKaiser, Günther
    • H01P1/205H01P1/208
    • H01P1/2053H01P1/208
    • A PIM (Passive InterModulation) test bench comprises a first duplexer having a first port connected via a first filter to a third port and a second port connected via a second filter to the third port. The first port is fed by signal sources providing RF signals at a first frequency and at a second frequency. A spectrum analyzer is connected to the second port. A DUT (Device under Test) is connected between said third port and a third port of a second duplexer. Each of the first and second ports of the second duplexer are connected to a PIM optimized load and/or a standard load. The second duplexer is preferably identical to the first duplexer. For minimizing self-intermodulation, at least the first duplexer comprises at least one filter component and a metal housing, the housing further comprises a monolithic metal body and a metal cover capacitively coupled to the body without any galvanic contact.
    • PIM(无源互调)测试台包括第一双工器,其具有经由第一滤波器连接到第三端口的第一端口和经由第二滤波器连接到第三端口的第二端口。 第一端口由提供第一频率和第二频率的RF信号的信号源馈送。 频谱分析仪连接到第二个端口。 DUT(被测设备)连接在所述第三端口和第二双工器的第三端口之间。 第二双工器的第一和第二端口中的每一个都连接到PIM优化负载和/或标准负载。 第二双工器优选与第一双工器相同。 为了最小化自互调,至少第一双工器包括至少一个滤波器部件和金属外壳,外壳还包括单片金属体和金属盖,金属盖电容耦合到主体而没有任何电流接触。