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1. 发明公开

EP2676128A2 SYSTEM AND METHOD FOR MULTI-SCANNER X-RAY INSPECTION 有权
标题翻译：系统在VERFAHRENFÜRRÖNTGENUNTERSUCHUNGENMIT MEHREREN SCANNERN
公开(公告)号：EP2676128A2
公开(公告)日：2013-12-25
申请号：EP12722827.8
申请日：2012-02-16
申请人： Smiths Heimann GmbH
发明人： DREISEITEL, Pia , MUENSTER, Matthias , KOENIG, Sebastian
IPC分类号： G01N23/04
CPC分类号： G06T3/0056 , G01N23/046 , G01V5/005 , G06T7/97 , G06T2207/30112
摘要： A method of analyzing a target item utilizing multiple scanners is disclosed. The method can include providing an item comprising a material. The method can further include acquiring a first set of scan data associated with the item using a first scanner, and acquiring a second set of scan data associated with the item using a second scanner. The method can further include generating a first set of transform data from the first set of scan data, analyzing the first set of transform data to identify a subset of the first set of transform data associated with a first region, and analyzing the second set of scan data to identify a subset of the second set of scan data associated with a second region. The method can also include generating a measure that at least a portion of scan data is consistent with a presence of a candidate material in the item, where the portion of scan data is selected from at least one of the set consisting of: the subset of the first set of transform data and the subset of the second set of scan data.
摘要翻译：公开了一种使用多台扫描仪分析目标物品的方法。该方法可以包括提供包括材料的物品。该方法还可以包括使用第一扫描仪来获取与物品相关联的第一组扫描数据，以及使用第二扫描器获取与物品相关联的第二组扫描数据。该方法还可以包括从第一组扫描数据生成第一组变换数据，分析第一组变换数据以识别与第一区域相关联的第一组变换数据的子集，以及分析第二组变换数据扫描数据以识别与第二区域相关联的第二组扫描数据的子集。该方法还可以包括生成测量，其中至少一部分扫描数据与项目中的候选材料的存在一致，其中扫描数据的部分从以下组中的至少一个中选择：该组的子集第一组变换数据和第二组扫描数据的子集。

2. 发明授权

EP2676128B1 SYSTEM AND METHOD FOR MULTI-SCANNER X-RAY INSPECTION 有权
公开(公告)号：EP2676128B1
公开(公告)日：2019-08-21
申请号：EP12722827.8
申请日：2012-02-16
申请人： Smiths Heimann GmbH
发明人： DREISEITEL, Pia , MUENSTER, Matthias , KOENIG, Sebastian
IPC分类号： G01V5/00 , G01N23/046 , G06T7/00 , G06T3/00

3. 发明公开

EP2677936A2 IMAGE RECONSTRUCTION BASED ON PARAMETRIC MODELS 有权转让
标题翻译：图像重建基于参数模型
公开(公告)号：EP2677936A2
公开(公告)日：2014-01-01
申请号：EP12742937.1
申请日：2012-02-23
申请人： Smiths Heimann GmbH
发明人： MUENSTER, Matthias , DREISEITEL, Pia
IPC分类号： A61B6/03 , G01N23/04 , G06T11/00 , G01V5/00
CPC分类号： G06F17/50 , A61B6/0471 , A61B6/4014 , A61B6/482 , A61B6/5205 , F04C2270/041 , G01N23/046 , G01N2223/401 , G01N2223/419 , G06T11/006 , G06T17/30
摘要： Systems and methods for modeling are provided. The method can include acquiring scan data associated with a plurality of x-ray projections of an item. The method can further include determining at least one closed boundary curve associated with the item. For example, the method can determine a first maximum area based on the scan data and determine at least one edge of the first maximum area. The method can further generate a model of the item using the closed boundary curve and a first material specific parameter for a material within the closed boundary curve. The method can utilize the model to generate computed scan data, compare the computed scan data to the scan data, and determine a goodness of fit. The method can further adjust the model of the item by altering at least one of the closed boundary curve and the material specific parameter.

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