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    • 5. 发明公开
    • BASE MATERIAL PROCESSING APPARATUS AND BASE MATERIAL PROCESSING METHOD
    • EP3715137A1
    • 2020-09-30
    • EP20165132.0
    • 2020-03-24
    • SCREEN Holdings Co., Ltd.
    • YOSHIDA, Mitsuhiro
    • B41J11/44B41J15/04B41J2/01
    • A base material processing apparatus includes a tension detector (50) that detects tension on a base material that is being transported, an encoder (40) that detects the amounts of rotational drive of rollers (12) that transport the base material, edge position detectors (31, 32) that detect the position of an edge (91) of the base material in the width direction, and a transport displacement calculation part (81) that calculates a transport displacement of the base material in the transport direction. The transport displacement calculation part (81) includes an operation unit (200) that has completed learning through machine learning and outputs the transport displacement of the base material in the transport direction on the basis of at least one of the result of detecting the tension on the base material, the result of detecting the amounts of rotational drive of the rollers (12), and the result of detecting the position of the edge (91) of the base material in the width direction. Accordingly, the transport displacement of the base material in the transport direction can be detected with high accuracy and low cost even in cases where the base material is transported at high speeds or where the edge (91) of the base material has fine irregularities smaller than the interval of measurements by sensors.
    • 6. 发明公开
    • BASE MATERIAL PROCESSING APPARATUS AND DETECTION METHOD
    • EP3626656A1
    • 2020-03-25
    • EP19193667.3
    • 2019-08-27
    • SCREEN Holdings Co., Ltd.
    • YOSHIDA, Mitsuhiro
    • B65H23/02B41J2/01B41J11/42
    • A displacement amount calculation part (41) in a base material processing apparatus calculates the degree of matching between an upstream data section (D1) included in an upstream detection result (R1), which indicates a time-varying change in the position of an edge (91) of the base material in the width direction at an upstream detection position (Pa), and a downstream data section (D2) included in a downstream detection result (R2), which indicates a time-varying change in the position of the edge (91) of the base material in the width direction at a downstream detection position (Pb). This calculation uses the results of comparison between signals (RIM) in a predetermined frequency band extracted from the upstream detection result (R1) and signals (R2M) in the predetermined frequency band extracted from the downstream detection result (R2). Accordingly, a downstream data section (D2) that is highly matched with the upstream data section (D1) can be identified with high accuracy, and the amount of displacement of the base material in the transport direction can be detected with high accuracy on the basis of an identification result.
    • 9. 发明公开
    • BASE MATERIAL PROCESSING APPARATUS AND METHOD OF PREDICTING MEANDERING
    • 基础材料加工装置和预测手段的方法
    • EP3275676A1
    • 2018-01-31
    • EP17178639.5
    • 2017-06-29
    • SCREEN Holdings Co., Ltd.
    • KAMIGIKU, TakashiYOSHIDA, Mitsuhiro
    • B41J15/04B41J11/00B65H23/02
    • B41J13/0009B41J11/008B41J11/0095B41J11/42B41J15/04B65H23/0204B65H2557/242B65H2601/272B65H2801/15
    • A base material processing apparatus detects the amount of widthwise misregistration of a base material in each detection position (Po, and Pa to Pd) lying on a transport path, and then calculates a difference between a detection value in the reference position (Po) and a detection value in each of the remaining detection positions (Pa to Pd) as a meandering amount. Subsequently, the base material processing apparatus determines coefficients obtained when a variation with time in each meandering amount is applied to a predetermined model function, and thereafter calculates coefficients of the model function predicted as the meandering of the base material in each processing position (P1 to P4), based on the determined coefficients and a positional relationship between the reference position (Po), the remaining detection positions (Pa to Pd) and the processing positions (P1 to P4). This achieves the prediction of the meandering of the base material in the processing positions (P1 to P4) with accuracy without any detector disposed in the processing positions (P1 to P4).
    • 基材处理装置检测位于输送路径上的各检测位置(Po,Pa〜Pd)中的基材的宽度方向偏移量,计算基准位置(Po)中的检测值与 将每个剩余检测位置(Pa至Pd)中的检测值确定为蜿蜒量。 随后,基材处理设备确定当将每个蜿蜒量随时间的变化应用于预定的模型函数时获得的系数,并且此后计算预测为每个处理位置(P1至P)中的基材的蜿蜒的模型函数的系数 基于所确定的系数以及参考位置(Po),剩余检测位置(Pa到Pd)和处理位置(P1到P4)之间的位置关系来确定第一位置(P4)。 由此,无需在处理位置(P1〜P4)配置检测器就能够高精度地预测处理位置(P1〜P4)中的基材的弯曲。