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    • 5. 发明公开
    • PARTICLE SIZE DISTRIBUTION MEASURING APPARATUS AND PARTICLE SIZE DISTRIBUTION MEASURING METHOD
    • 粒度分布测量装置和粒度分布测量方法
    • EP3203210A1
    • 2017-08-09
    • EP17154686.4
    • 2017-02-03
    • Horiba, Ltd.
    • YAMAGUCHI, TetsujiMORI, Tetsuya
    • G01N15/02G01N21/53
    • G01N15/0211G01N21/53G01N2015/0222G01N2015/025G01N2021/4707
    • Provided is a dynamic light scattering type particle size distribution measuring apparatus 100 capable of accurately measure the particle sizes of a sample obtained from slurry or the like. The dynamic light scattering type particle size distribution measuring apparatus 100 is configured to include: a filter member 6 that is interposed between any adjacent two of a light source 4, a cell 2, and a photodetector 5 and attenuates light passing therethrough; and an information processing device 8 that measures a particle size distribution multiple times with time and combines particle size distributions obtained at respective times of measurement to thereby calculate the particle size distribution of the whole of portions of the sample introduced at the respective times of measurement. In addition, the filter member 6 is also configured to be changeable to one having a different attenuation level at every time of measurement.
    • 本发明提供一种动态光散射式粒度分布测定装置100,其能够高精度地测定由浆液等得到的样品的粒径。 动态光散射式粒度分布测量装置100被构造成包括:过滤器构件6,该过滤器构件6插入在光源4,单元2和光电检测器5中的任何相邻的两个之间并且衰减穿过其中的光; 和信息处理装置8,该信息处理装置8随时间多次测量粒度分布,并组合在各个测量时间获得的粒度分布,从而计算在各个测量时间引入的样品的整个部分的粒度分布。 另外,过滤器构件6也构造成可以在每次测量时改变为具有不同衰减水平的滤波器构件。
    • 6. 发明公开
    • DEVICE FOR MEASURING PHYSICAL PROPERTY OF PARTICLE
    • VORRICHTUNG ZUR MESSUNG DER PHYSIKALISCHEN EIGENSCHAFTEN VON PARTIKELN
    • EP2333516A1
    • 2011-06-15
    • EP09816190.4
    • 2009-09-25
    • Horiba, Ltd.
    • YAMAGUCHI, TetsujiIGUSHI, TatsuoKUROZUMI, Takuji
    • G01N15/02G01N21/21G01N21/49G01N27/26
    • G01N15/0205G01N21/21G01N21/53G01N2015/0294G01N2015/03
    • Provided is a particle characterization instrument that can ensure measurement accuracy even though light detecting means has a single configuration, and enables the number of optical elements to be decreased as much as possible to suppress cost increase and reduce the number of adjustment places, and the particle characterization instrument has an incident side polarizer 24 and an incident side 1/4 wavelength plate 25 as an illumination optical system mechanism 2 and, as a light receiving optical system mechanism 3, an exit side 1/4 wavelength plate 33 and an exit side polarizer 34 that can be rotated to a plurality of angle positions around a cell 4, wherein light attenuating means 23 that prevents a polarization state from being changed is provided on a light path, and a light attenuation rate by the light attenuating means 23 is controlled such that a detected light intensity at each measurement position falls within a measurement range of light detecting means 31.
    • 提供了即使光检测装置具有单一结构也能够确保测量精度的粒子表征仪器,并且能够尽可能多地减少光学元件的数量以抑制成本增加并减少调整位置的数量,并且粒子 表征仪具有作为照明光学系统机构2的入射侧偏振器24和入射侧1/4波长板25,作为光接收光学系统机构3,出射侧1/4波长板33和出射侧偏振器 34,其可以旋转到围绕单元4的多个角度位置,其中防止偏振状态改变的光衰减装置23设置在光路上,并且由光衰减装置23控制光衰减率 每个测量位置处的检测光强度落在光检测装置31的测量范围内。