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1. 发明公开

EP4224710A1 DIFFERENTIAL AMPLIFIER CIRCUIT 审中-实审
公开(公告)号：EP4224710A1
公开(公告)日：2023-08-09
申请号：EP21875302.8
申请日：2021-09-17
申请人： Hioki E.E. Corporation
发明人： KARASAWA, Yuki , NAKAZAWA, Koki , IKEDA, Kenta , YAMAGISHI, Kimihiko
IPC分类号： H03F3/34 , H03F3/45
摘要： A differential amplifier circuit includes a basic differential amplifier circuit including an operational amplifier configured to amplify a potential difference between output ends of a first input resistor and a second input resistor, a feedback resistor connected to the output end of the first input resistor, and a first resistance element connected to the output end of the second input resistor. Furthermore, the differential amplifier circuit includes a high-precision operational amplifier having an offset voltage or a drift voltage lower than that of the operational amplifier. The high-precision operational amplifier includes an inverting input terminal connected to the output end of the first input resistor and an output terminal connected to the output end of the second input resistor. A potential corresponding to a potential appearing at a non-inverting input terminal of the operational amplifier with only the basic differential amplifier circuit is input as a reference signal to a non-inverting input terminal of the high-precision operational amplifier.

2. 发明公开

EP4044536A1 SIGNAL GENERATING DEVICE AND SIGNAL READING SYSTEM 审中-实审
公开(公告)号：EP4044536A1
公开(公告)日：2022-08-17
申请号：EP20874105.8
申请日：2020-10-02
申请人： Hioki E.E. Corporation
发明人： YANAGISAWA Koichi , KASAI Shin , IKEDA Hiroyoshi , SAKAI Tomoharu
IPC分类号： H04L25/02
摘要： A code specifying signal is correctly generated while still using a configuration that connects to a communication path via a coupling capacitance. A signal generation apparatus 2A that generates a code specifying signal Sf capable of specifying a code corresponding to a logic signal Sa, based on the logic signal Sa that is transmitted via a CAN bus (or "communication path") SB composed of coated conductors La and Lb, includes: a signal restorer 8 that generates a restored signal Sre with a signal waveform that is equivalent to the signal waveform of the logic signal Sa by integrating a signal waveform corresponding to a differential waveform of the logic signal Sa detected from the coated conductors La and Lb; and a signal generator 6 that generates the code specifying signal Sf by binarizing the restored signal Sre in comparison with a threshold voltage Vth.

3. 发明公开

EP4007039A1 MEASUREMENT APPARATUS AND MEASUREMENT METHOD FOR POWER STORAGE DEVICE 审中-实审
公开(公告)号：EP4007039A1
公开(公告)日：2022-06-01
申请号：EP20846168.1
申请日：2020-04-15
申请人： Hioki E.E. Corporation
发明人： TAKAHASHI, Tetsuya
IPC分类号： H01M10/44 , H01M10/48 , H02J7/00 , G01R31/382 , G01R31/3835 , G01R31/385 , G01R31/389
摘要： A measurement apparatus of a power storage device supplies constant current to the power storage device, measures voltage of the power storage device, and computes an internal state of the power storage device on the basis of voltage change in the power storage device subjected to the measurement.

4. 发明公开

EP3829121A1 WAVEFORM SHAPING CIRCUIT, SIGNAL GENERATION DEVICE, AND SIGNAL READING SYSTEM 有权
公开(公告)号：EP3829121A1
公开(公告)日：2021-06-02
申请号：EP19842087.9
申请日：2019-07-24
申请人： Hioki E.E. Corporation
发明人： YANAGISAWA Koichi , IKEDA Hiroyoshi , KASAI Shin , SAKAI Tomoharu
IPC分类号： H04L25/06 , H03K5/003 , H04L25/02
摘要： A waveform shaping circuit is configured without including a diode that is affected by temperature. The waveform shaping circuit includes: a capacitor 42c with one end into which a differential signal Vd0 is inputted and another end connected to an output 42b; an impedance element 42d that has one end connected to the other end of the capacitor 42c and another end into which a target constant voltage Vtg is applied; a switch circuit SC that is constructed of a series circuit with an impedance element 42e and a switch 42f without including a diode, has one end connected to the output 42b, and has another end into which the target constant voltage Vtg is applied; and a switch control circuit SWC that shifts the switch 42f into an on state during a low voltage period in an AC component of the differential signal Vd0 and shifts the switch 42f to an off state during a high voltage period of the AC component. The waveform shaping circuit shapes the differential signal Vd0 into a single-ended signal Vd whose peak-to-peak voltage is equivalent to a peak-to-peak voltage of the AC component and whose voltage during a low voltage period is the target constant voltage Vtg, and outputs from the output 42b.

5. 发明公开

EP4092805A1 DEVICE, MEASUREMENT DEVICE, METHOD, AND MEASUREMENT METHOD 审中-实审
公开(公告)号：EP4092805A1
公开(公告)日：2022-11-23
申请号：EP21741439.0
申请日：2021-01-15
申请人： Hioki E.E. Corporation
发明人： TAKAHASHI, Tetsuya
IPC分类号： H01M10/44 , H01M10/48 , H02J7/00 , H02J7/10 , G01R31/382
摘要： A measurement apparatus 1 detects a voltage change in a power storage device 10. The measurement apparatus 1 supplies constant current to the power storage device 10; measures voltage related to the power storage device 10 supplied with the constant current; and detects the voltage change in the power storage device 10 subjected to the measurement. The measurement apparatus 1 also acquires the voltage change in the power storage device 10 based on an electrical property serving as a reference of the power storage device 10.

6. 发明公开

EP3951373A1 STATE DETERMINATION APPARATUS, STATE DETERMINATION METHOD, AND STORAGE MEDIUM 审中-实审
公开(公告)号：EP3951373A1
公开(公告)日：2022-02-09
申请号：EP21189899.4
申请日：2021-08-05
申请人： Hioki E.E. Corporation
发明人： KAWAMURO, Yuki , SHIOIRI, Akihiro , NAKAYAMA, Naoto
IPC分类号： G01N27/02
摘要： A state determination apparatus includes: electrodes configured to apply AC signal to a mixture; measurement means configured to measure an impedance of the mixture for every frequency of the AC signal based on a response signal flowing through the mixture when the AC signal is applied; setting means configured to set an equivalent circuit including one or a plurality of parallel circuit(s) based on element(s) corresponding to electrical component(s) of a solid matter; calculating means configured to calculate a parameter of the parallel circuit by executing an equivalent circuit analysis for approximating impedance of the equivalent circuit to the impedance of the mixture; and derivation means configured to derive an index for specifying a state of the mixture based on the parameter of the parallel circuit.

7. 发明公开

EP2879064A1 INFORMATION ADMINISTRATION SYSTEM 有权转让
标题翻译：系统行政信息的
公开(公告)号：EP2879064A1
公开(公告)日：2015-06-03
申请号：EP12881908.3
申请日：2012-07-24
申请人： Fukuoka University , Keirex Technology Inc. , YDC Corporation , Zuken Inc. , Fuji Machine Mfg. Co., Ltd. , Hioki E.E. Corporation
发明人： TOMOKAGE Hajime , KAWASE Hidemichi , MATSUOKA Hiroshi , MATSUZAWA Hirohiko , KUSUNOKI Kazuhiro , YAMAZAKI Hiroshi
IPC分类号： G06F17/50
CPC分类号： H04L63/0428 , G06F21/6209 , G06F21/6218 , G06Q10/0631 , H04L41/28
摘要： Problem: To safely reflect non-public component information, from among component information on components constituting a production object, to designing information and manufacturing information without leaking to outsiders.
Solution: An information administration system configured of: a component information management apparatus (4) including a component information storing unit (41) for storing component information after sectionalizing the component information into public information and non-public information, and also sectionalizing the non-public information into information for designing and information for manufacturing, and an encryption processing unit (42) for encrypting the non-public information; a designing information management apparatus (2) including a first component information receiving unit (24) for receiving the component information, a first decryption unit (25) for decrypting non-public component information for designing, and a designing information storing unit (22) for storing designing information that is designed by adding the received component information thereto; and a manufacturing apparatus (3) including a second decryption unit (33) for decrypting the received non-public component information for manufacturing, and a drive controlling unit (34) for controlling driving of the manufacturing apparatus based on the received manufacturing information and component information.

8. 发明公开

EP4431953A1 MEASUREMENT DEVICE AND MEASUREMENT METHOD 审中-实审
公开(公告)号：EP4431953A1
公开(公告)日：2024-09-18
申请号：EP22892557.4
申请日：2022-10-24
申请人： Hioki E.E. Corporation
发明人： HANEDA, Kazuaki , YOKOYAMA, Tomohiro
IPC分类号： G01R27/02
CPC分类号： G01R27/02
摘要： The present invention achieves a measurement device capable of highly accurate synchronous detection, while suppressing cost. A measurement device (100) is characterized by comprising: a current generation circuit (1) for generating a constant alternating current corresponding to a reference signal (Ss) having a prescribed frequency, and supplying the same to a measurement target object (200); a voltage detection circuit (2) for detecting a voltage v generated across the measurement target object (200); a signal generation circuit (3) for detecting a current i flowing through the measurement target object (200), and generating a binary signal (Sip) synchronized to the current i; a first synchronous detection unit (6) for performing synchronous detection of the voltage v on the basis of the reference signal (Ss), and calculating an amplitude |V| and a voltage phase difference ϕv of the voltage v; a second synchronous detection unit (7) for performing synchronous detection of the binary signal (Sip) on the basis of the reference signal (Ss), and calculating a current phase difference ϕi; and a computation unit (8) for calculating an electrical property of the measurement target object on the basis of the amplitude IVI and the voltage phase difference ϕv of the voltage, the current phase difference ϕi, and an amplitude |I| of the current.

9. 发明公开

EP4394401A1 IMPEDANCE MEASURING DEVICE 审中-实审
公开(公告)号：EP4394401A1
公开(公告)日：2024-07-03
申请号：EP22861129.9
申请日：2022-08-08
申请人： Hioki E.E. Corporation
发明人： KITAMURA Naoya , YOSHIHARA Ryohei , HANEDA Kazuaki
IPC分类号： G01R27/02 , G01R31/54 , G01R31/56
CPC分类号： G01R31/54 , G01R31/50 , G01R27/02 , G01R31/56
摘要： The present invention addresses the problem of providing an impedance measuring device that enables a coupling capacitor to be charged in a short time period, and that enables a line break to be detected. This problem can be resolved by means of an impedance measuring device (200) comprising: a measuring unit (220) for obtaining an internal impedance of an object (230) being measured, by measuring a voltage generated between contact terminals that are respectively in contact with two terminals of the object (230) being measured, the voltage being generated by means of an alternating current supplied to the object (230) being measured; a line break detection current source (241) which supplies an alternating current for line break detection to an electric current path (201) between the measuring unit (220) and the object (230) being measured, via a coupling capacitor (C3); and a charge acceleration unit (242) which is connected between the coupling capacitor (C3) and the line break detection current source (241), and which charges the coupling capacitor (C3) if a terminal-to-terminal voltage of the line break detection current source (241) exceeds a prescribed voltage range.

10. 发明公开

EP4365604A1 MEASUREMENT RESULT DISPLAY DEVICE, MEASUREMENT SYSTEM, AND MEASUREMENT RESULT DISPLAY PROCESSING PROGRAM 审中-实审
公开(公告)号：EP4365604A1
公开(公告)日：2024-05-08
申请号：EP22832506.4
申请日：2022-03-25
申请人： Hioki E.E. Corporation
发明人： KITAMURA, Naoya , IIJIMA, Junji
IPC分类号： G01R13/00 , G01R27/02 , G01D7/00
CPC分类号： G01D7/00 , G01R13/00 , G01R27/02
摘要： Changes over time in a measured impedance are displayed in an easy to identify manner. A system includes a processing unit that executes a measurement result display process that displays measurement results on a display unit 5 based on measurement result data produced by encoding impedances that have been measured by a measurement apparatus. During the measurement result display process, the processing unit displays, on the display unit 5 and based on a plurality of measurement result data of impedances that satisfy a predetermined comparison condition and were produced by the measurement apparatus at different measurement times, a first measurement result display screen 20 with measurement result displays 21a to 21d (graphs) in which the impedances for respective measurement result data are aligned in order of measurement time.

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