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1. 发明公开

EP4417983A1 MEASURING DEVICE, MEASURING SYSTEM, AND MEASURING METHOD 审中-实审
公开(公告)号：EP4417983A1
公开(公告)日：2024-08-21
申请号：EP22880779.8
申请日：2022-09-28
申请人： Hioki E.E. Corporation
发明人： NAGAI, Hideyuki
IPC分类号： G01R27/02 , G01R31/50
CPC分类号： Y02E60/10 , G01R31/50 , G01R27/02
摘要： A measuring device measures a state of a plurality of weld zones formed when a weldment is welded to a workpiece at a plurality of locations. This measuring device includes a plurality of application circuits that exclusively apply a current to each of one or more weld zones among the plurality of weld zones, and a detection circuit that detects a voltage obtained by combining voltages indicating magnitudes of voltage drops generated respectively by the plurality of more weld zones due to the application of the current. The measuring device further includes a processing unit that outputs information indicating the state of the plurality of weld zones on the basis of the voltages detected by the detection circuit.

2. 发明公开

EP4357798A1 SHORT CIRCUIT DETECTION DEVICE AND SHORT CIRCUIT DETECTION METHOD 审中-实审
公开(公告)号：EP4357798A1
公开(公告)日：2024-04-24
申请号：EP22825014.8
申请日：2022-06-14
申请人： Hioki E.E. Corporation
发明人： NISHIMURA, Kota , IIJIMA, Junji
IPC分类号： G01R31/52 , H01G13/00 , H01M10/48
CPC分类号： Y02E60/10 , G01R31/52 , H01M10/48 , H01G13/00
摘要： A short circuit detection device for detecting a short circuit occurring in a detection target measures an electrostatic capacitance value of the detection target and determines, on the basis of the measured electrostatic capacitance value, a current value of a current to be supplied to the detection target. Furthermore, the short circuit detection device supplies the current having the determined current value to the detection target and detects a short circuit in the detection target while the current is being supplied to the detection target.

3. 发明公开

EP2964006A1 MANUFACTURING DEVICE, MANUFACTURING MANAGEMENT SYSTEM AND MANUFACTURING CONTROL PROGRAM 有权转让
标题翻译： HERSTELLUNGSVORRICHTUNG，HERSTELLUNGSVERWALTUNGSSYSTEM UND HERSTELLUNGSSTEUERUNGSPROGRAMM
公开(公告)号：EP2964006A1
公开(公告)日：2016-01-06
申请号：EP13876743.9
申请日：2013-02-26
申请人： Fuji Machine Mfg. Co., Ltd. , Hioki E.E. Corporation
发明人： TOMOKAGE Hajime , KATOH Yoshihisa , KAWASE Hidemichi , MATSUOKA Hiroshi , MATSUZAWA Hirohiko , KUSUNOKI Kazuhiro , YAMAZAKI Hiroshi
IPC分类号： H05K13/04 , G01R31/28
摘要： Provide a manufacturing apparatus that manufactures a high-quality manufacturing object by using component information per unit of individual electronic component or per unit of package in a plurality of electronic components that have been packaged. The manufacturing apparatus is a manufacturing apparatus 10 that manufactures a product 15 by taking out each electronic component from packaged components 11 in which a plurality of electronic components are packaged. The manufacturing apparatus 10 is provided with: a component information reading unit 21 that reads component information 12 per unit of electronic component or per unit of package in the packaged components 11; a manufacturing control unit 23 that controls, using the read component information 12, the manufacturing treatment of product 15 into which electronic components indicated in the component information 12 are incorporated; and an incorporation information generating unit 24 that generates incorporation information 14a regarding a state of incorporation of each electronic component in the product 15. In addition, a manufacturing management system according to the present invention is provided with: the manufacturing apparatus 10; and a verification apparatus 50 that verify the product 15 using the incorporation information 14a.
摘要翻译：提供一种制造装置，其通过使用已经被封装的多个电子部件中的每个单独的电子部件或每个包装单元的部件信息来制造高质量的制造对象。制造装置是通过从封装有多个电子部件的封装部件11取出各电子部件来制造商品15的制造装置10。制造装置10设置有：组件信息读取单元21，其读取打包部件11中的每单位电子部件或每单位包装的部件信息12; 使用所读取的部件信息12来控制组件信息12中指示的电子部件的产品15的制造处理的制造控制部23; 以及结合信息生成单元24，其生成关于产品15中的每个电子部件的结合状态的结合信息14a。另外，根据本发明的制造管理系统具有：制造装置10; 以及使用并入信息14a验证产品15的验证装置50。

4. 发明公开

EP4431953A1 MEASUREMENT DEVICE AND MEASUREMENT METHOD 审中-实审
公开(公告)号：EP4431953A1
公开(公告)日：2024-09-18
申请号：EP22892557.4
申请日：2022-10-24
申请人： Hioki E.E. Corporation
发明人： HANEDA, Kazuaki , YOKOYAMA, Tomohiro
IPC分类号： G01R27/02
CPC分类号： G01R27/02
摘要： The present invention achieves a measurement device capable of highly accurate synchronous detection, while suppressing cost. A measurement device (100) is characterized by comprising: a current generation circuit (1) for generating a constant alternating current corresponding to a reference signal (Ss) having a prescribed frequency, and supplying the same to a measurement target object (200); a voltage detection circuit (2) for detecting a voltage v generated across the measurement target object (200); a signal generation circuit (3) for detecting a current i flowing through the measurement target object (200), and generating a binary signal (Sip) synchronized to the current i; a first synchronous detection unit (6) for performing synchronous detection of the voltage v on the basis of the reference signal (Ss), and calculating an amplitude |V| and a voltage phase difference ϕv of the voltage v; a second synchronous detection unit (7) for performing synchronous detection of the binary signal (Sip) on the basis of the reference signal (Ss), and calculating a current phase difference ϕi; and a computation unit (8) for calculating an electrical property of the measurement target object on the basis of the amplitude IVI and the voltage phase difference ϕv of the voltage, the current phase difference ϕi, and an amplitude |I| of the current.

5. 发明公开

EP4394401A1 IMPEDANCE MEASURING DEVICE 审中-实审
公开(公告)号：EP4394401A1
公开(公告)日：2024-07-03
申请号：EP22861129.9
申请日：2022-08-08
申请人： Hioki E.E. Corporation
发明人： KITAMURA Naoya , YOSHIHARA Ryohei , HANEDA Kazuaki
IPC分类号： G01R27/02 , G01R31/54 , G01R31/56
CPC分类号： G01R31/54 , G01R31/50 , G01R27/02 , G01R31/56
摘要： The present invention addresses the problem of providing an impedance measuring device that enables a coupling capacitor to be charged in a short time period, and that enables a line break to be detected. This problem can be resolved by means of an impedance measuring device (200) comprising: a measuring unit (220) for obtaining an internal impedance of an object (230) being measured, by measuring a voltage generated between contact terminals that are respectively in contact with two terminals of the object (230) being measured, the voltage being generated by means of an alternating current supplied to the object (230) being measured; a line break detection current source (241) which supplies an alternating current for line break detection to an electric current path (201) between the measuring unit (220) and the object (230) being measured, via a coupling capacitor (C3); and a charge acceleration unit (242) which is connected between the coupling capacitor (C3) and the line break detection current source (241), and which charges the coupling capacitor (C3) if a terminal-to-terminal voltage of the line break detection current source (241) exceeds a prescribed voltage range.

6. 发明公开

EP4365604A1 MEASUREMENT RESULT DISPLAY DEVICE, MEASUREMENT SYSTEM, AND MEASUREMENT RESULT DISPLAY PROCESSING PROGRAM 审中-实审
公开(公告)号：EP4365604A1
公开(公告)日：2024-05-08
申请号：EP22832506.4
申请日：2022-03-25
申请人： Hioki E.E. Corporation
发明人： KITAMURA, Naoya , IIJIMA, Junji
IPC分类号： G01R13/00 , G01R27/02 , G01D7/00
CPC分类号： G01D7/00 , G01R13/00 , G01R27/02
摘要： Changes over time in a measured impedance are displayed in an easy to identify manner. A system includes a processing unit that executes a measurement result display process that displays measurement results on a display unit 5 based on measurement result data produced by encoding impedances that have been measured by a measurement apparatus. During the measurement result display process, the processing unit displays, on the display unit 5 and based on a plurality of measurement result data of impedances that satisfy a predetermined comparison condition and were produced by the measurement apparatus at different measurement times, a first measurement result display screen 20 with measurement result displays 21a to 21d (graphs) in which the impedances for respective measurement result data are aligned in order of measurement time.

7. 发明授权

EP4001930B1 MEASURING APPARATUS 有权
公开(公告)号：EP4001930B1
公开(公告)日：2023-06-28
申请号：EP21208663.1
申请日：2021-11-17
发明人： Nishijima, Katsutoshi
IPC分类号： G01R27/26 , G01R31/64

8. 发明公开

EP3671237A1 MOUNTING STRUCTURE FOR CAPACITOR AND RESISTOR, INPUT UNIT, AND MEASURING APPARATUS 有权
公开(公告)号：EP3671237A1
公开(公告)日：2020-06-24
申请号：EP19217318.5
申请日：2019-12-18
申请人： Hioki E.E. Corporation
发明人： YAMADA, Shuhei , HAYASHI, Kazunobu , SEKI, Kenichi , YODA, Hajime , HEISHI, Toshio
IPC分类号： G01R31/30 , H01C13/02 , H01G17/00
摘要： A mounting structure minimizes the influence of displacements, along a length direction (A) of a resistor, in mounting positions of capacitor electrodes (11,12) on the electrical characteristics of a circuit including a parallel circuit composed of a capacitor (3A) and the resistor. The capacitor (3A) has first and second electrodes (11,12), which respectively include first and second side surface portions (11a, 11b,12a,12b) disposed in parallel to a length direction (A) of the resistor. The resistor has a first resistance body (22) corresponding to the first side surface portions (11a,11b) and a second resistance body (23) corresponding to the second side surface portions (12a,12b) that are separately disposed along the length direction (A) and connected in series via a wire (26), and is mounted so that the first resistance body (22) is positioned directly facing the first side surface portions (11a,11b) and the second resistance body (23) is positioned directly facing the second side surface portions (12a,12b).

9. 发明授权

EP3671237B1 MOUNTING STRUCTURE FOR CAPACITOR AND RESISTOR, INPUT UNIT, AND MEASURING APPARATUS 有权
公开(公告)号：EP3671237B1
公开(公告)日：2024-08-28
申请号：EP19217318.5
申请日：2019-12-18
IPC分类号： G01R31/30 , H01C13/02 , H01G17/00
CPC分类号： G01R31/30 , H01G2/02 , H01G4/40 , H01C1/01

10. 发明授权

EP3829121B1 WAVEFORM SHAPING CIRCUIT, SIGNAL GENERATION DEVICE, AND SIGNAL READING SYSTEM 有权
公开(公告)号：EP3829121B1
公开(公告)日：2023-08-30
申请号：EP19842087.9
申请日：2019-07-24
发明人： YANAGISAWA Koichi , IKEDA Hiroyoshi , KASAI Shin , SAKAI Tomoharu
IPC分类号： H04L25/02 , H03K5/003

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