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81. 发明公开

EP2893331A1 COMBINED CONFOCAL X-RAY FLUORESCENCE AND X-RAY COMPUTERISED TOMOGRAPHIC SYSTEM AND METHOD 有权
标题翻译：联合共焦射线荧光和计算机辅助断层扫描X射线系统和方法
公开(公告)号：EP2893331A1
公开(公告)日：2015-07-15
申请号：EP13763415.0
申请日：2013-09-06
申请人： Carl Zeiss X-Ray Microscopy, Inc.
发明人： FESER, Michael , SESHADRI, Srivatsan
IPC分类号： G01N23/223 , G01N33/24
CPC分类号： G01N23/223 , G01N23/046 , G01N23/2206 , G01N33/24 , G01N2223/076 , G01N2223/419
摘要： A correlative evaluation of a sample using an x-ray computed tomography (CT) x-ray fluorescence (XRF) system and the method for analyzing a sample using x-ray CT and XRF is disclosed. The CT/XRF system includes an x-ray CT subsystem for acquisition of volume information and a confocal XRF subsystem for acquisition of elemental composition information. The CT/XRF system also includes a controller for managing the acquisitions by the x-ray CT subsystem and confocal XRF subsystem. Combining sub-micrometer spatial resolution 3-D imaging with elemental composition analysis in 3-D with ppm level sensitivity is important to elemental identification of precious metal grains in crushed and ground ores and floatation tailings in the mining industry.

82. 发明公开

EP2790015A4 X-RAY ANALYSIS DEVICE 有权
标题翻译： X射线分析装置
公开(公告)号：EP2790015A4
公开(公告)日：2015-07-15
申请号：EP12855929
申请日：2012-12-05
申请人： HORIBA LTD
发明人： NISHIKATA KENTARO , OHASHI SATOSHI , KOMATSUBARA TAKASHI
IPC分类号： G01N23/225 , G01N23/223
CPC分类号： G01N23/2252 , G01N23/223 , G01N2223/076
摘要： An X-ray analyzer is provided that enables quick positioning and enables the observation of temporal changes by repeating the generation of an element distribution image. The X-ray analyzer repeats scanning of a sample S by an electron beam from an electron gun (beam source) (11), detects a characteristic X-ray from the sample S by an X-ray detector (13), generates an element distribution image of the sample S by a signal processor (21) every scanning, and stores a plurality of element distribution images in a sequential order. Temporal changes of the element distribution image of the sample S are obtained. Moreover, by moving a stage (14) by a moving unit (22) concurrently with the scanning, an element distribution image of the sample S where the scanning position is varied is obtained. By generating the element distribution image while varying the scanning position, positioning of the range where the element distribution image is to be obtained on the sample S can be quickly performed based on the element distribution image itself.

83. 发明授权

EP2377309B1 SPEKTRALAUFLÖSENDE ELEKTRONISCHE RÖNTGENKAMERA 有权
标题翻译：高光谱电子射线照相机
公开(公告)号：EP2377309B1
公开(公告)日：2015-04-29
申请号：EP09760126.4
申请日：2009-10-27
申请人： IFG - Institute For Scientific Instruments GmbH , PNSensor GmbH
发明人： LANGHOFF, Norbert , BJEOUMIKHOV, Aniouar , SOLTAU, Heike , HARTMANN, Robert
IPC分类号： H04N5/32 , G01N23/223 , G01T1/29
CPC分类号： H04N5/32 , G01N23/2076 , G01T1/36

84. 发明授权

EP1764612B1 X-ray fluorescence spectrometer and x-ray fluorescence measurement method 有权转让
标题翻译： X射线荧光光谱仪和X射线荧光的测定方法
公开(公告)号：EP1764612B1
公开(公告)日：2015-04-15
申请号：EP06018857.0
申请日：2006-09-08
申请人： Rigaku Corporation
发明人： Kataoka, Yoshiyuki , Furusawa, Eiichi , Kohno, Hisayuki
IPC分类号： G01N23/223 , G01B15/02
CPC分类号： G01B15/02 , G01N23/223 , G01N2223/076

85. 发明公开

EP2454584A4 METHOD FOR DETERMINING THE ORE CONTENT OF DRILL CUTTINGS 有权转让
标题翻译：方法岩屑等级厘定
公开(公告)号：EP2454584A4
公开(公告)日：2014-10-29
申请号：EP10799483
申请日：2010-07-16
申请人： ATLAS COPCO ROCK DRILLS AB
发明人： AURANEN ILPO , RAATIKAINEN JUKKA
IPC分类号： G01N23/223
CPC分类号： G01N23/223 , G01N33/24 , G01N2223/076
摘要： The object of this invention is a method for determining ore contents of drill cuttings by irradiating and by detecting fluorescence radiation and scattering radiation. According to the method, drill cuttings being essentially immediately retrieved from the drill hole is arranged as a layer, the upper surface of which is at least partly free from water, a statistically sufficiently representative defined area of the layer is irradiated and the fluorescence of the irradiation is measured for element-characteristic intensities and for Compton-scattering or coherent scattering intensities. The element-characteristic intensities are corrected using coefficients empirically defined from Compton-scattering and/or coherent scattering in order to compensate for the damping due to the coverage effect of water.

86. 发明公开

EP2784490A1 X-ray Fluorescence Spectrometer 有权转让
标题翻译： Röntgenfluoreszenzspektrometer
公开(公告)号：EP2784490A1
公开(公告)日：2014-10-01
申请号：EP14161051.9
申请日：2014-03-21
申请人： Hitachi High-Tech Science Corporation
发明人： Hirose, Ryusuke , Takahashi, Haruo , Matoba, Yoshiki , Tamura, Koichi
IPC分类号： G01N23/223 , H05G1/02
摘要： An X-ray fluorescence spectrometer comprising a temperature sensor (6) close to the X-ray source (2), external-air fans (7), such as an intake fan or an exhaust fan, which exchange internal air with external air and a control section (C) which drives the external-air fans (7) based on temperature information detected by the temperature sensor (6).
The device may further comprise a circulation fan (8) and a heater (22)
摘要翻译：包括靠近X射线源（2）的温度传感器（6），与内部空气与外部空气进行交换的外部风扇（7），例如进风扇或排风扇的X射线荧光光谱仪，以及控制部（C），其基于由所述温度传感器（6）检测出的温度信息来驱动所述外部风扇（7）。该装置还可以包括循环风扇（8）和加热器（22）

87. 发明公开

EP2742494A1 MOBILE ASSAY FACILITY AND METHOD OF USING SAME TO PROCURE AND ASSAY PRECIOUS METALS 审中-公开
标题翻译：用于移动测试和系统方法用来获取及贵金属检查
公开(公告)号：EP2742494A1
公开(公告)日：2014-06-18
申请号：EP11870792.6
申请日：2011-12-22
申请人： AOW Holdings, LLC
发明人： NOYES, Chris M.
IPC分类号： G07F7/00 , G01N23/223
CPC分类号： C22B11/00 , B60P3/14 , G01N23/223 , G01N33/20 , G01N2223/076 , G01N2223/301 , Y10T436/2575
摘要： A self contained, mobile assay facility built in a modified armored truck is completely equipped to smelt and assay precious metals, particularly gold and silver. An induction furnace melts the metal that is then poured into an ingot. The ingot is weighed and analyzed using an XRF alloy analyzer and the percentage of gold and/or other metals recorded. The value of the gold at current market prices is calculated and the assay and the value of the ingot is printed and given to the seller. The seller may opt to receive the ingot and pay the assayer an assay fee. Alternately, the seller may ask to be paid cash or by wire transfer that may be initiated and confirmed from within the mobile assay facility. The ingots may be safely stored or shipped directly from the mobile facility to a wholesaler for further processing.

88. 发明公开

EP2589956A4 FLUORESCENT X-RAY ANALYSIS DEVICE AND METHOD 有权
标题翻译： DEVICE AND METHOD FOR荧光X射线研究
公开(公告)号：EP2589956A4
公开(公告)日：2014-04-02
申请号：EP11800500
申请日：2011-04-21
申请人： RIGAKU DENKI CO LTD
发明人： KITA HIROAKI , KOBAYASHI HIROSHI
IPC分类号： G01N23/223
CPC分类号： G01N23/223 , G01N2223/076 , G01N2223/3306 , G01N2223/6116

89. 发明公开

EP2690432A1 X-ray spectroscopic technique using merged spectral data 有权
标题翻译： öen en en en en en en en en
公开(公告)号：EP2690432A1
公开(公告)日：2014-01-29
申请号：EP13176585.1
申请日：2013-07-16
申请人： FEI COMPANY
发明人： Stoks, Sander
IPC分类号： G01N23/223 , G01N23/225
CPC分类号： G01N23/225 , G01N23/223 , G01N2223/076
摘要： A method of examining a sample using a spectroscopic apparatus, such as energy-dispersive X-ray spectroscopy (EDX), comprising the following steps:
- Mounting the sample on a sample holder;
- Directing a focused input beam of radiation, such as an electron beam or X-ray beam, onto a location on the sample, thereby producing an interaction that causes a flux of stimulated photonic radiation, such as fluorescent X-rays, to emanate from said location;
- Examining said flux using a multi-channel photon-counting detector, thus accruing a measured spectrum for said location;
- Automatically repeating said directing and examining steps for a series of successive locations on the sample,

which method comprises the following steps:
- Choosing a beam parameter of the input beam, such as the beam curent or beam spot size, that will influence a magnitude of said flux of stimulated photonic radiation;
- For each location within a first set of locations on the sample, accruing a spectrum using a first value of said beam parameter;
- For each location within a second set of locations on the sample, accruing a spectrum using a second value of said beam parameter, different from said first value.
One application consists in detecting and flagging events during EDX analysis when pile-up is too high and re-acquire EDX data for the locations corresponding to these flagged events.
摘要翻译：使用能量色散X射线光谱法（EDX）等分光装置检查样品的方法，包括以下步骤：将样品安装在样品架上; - 将聚焦投射射束（如电子束或X射线束）引导到样品上的位置，从而产生相互作用，导致受激光子辐射（如荧光X射线）的通量从说位置; - 使用多通道光子计数检测器检查所述通量，从而产生所述位置的测量光谱; - 对样本上的一系列连续位置自动重复所述指导和检查步骤，该方法包括以下步骤： - 选择将影响幅度的输入光束的光束参数，例如光束固定或光点尺寸，的所述通量的受激光子辐射; - 对于采样上的第一组位置内的每个位置，使用所述光束参数的第一值产生光谱; - 对于样本上的第二组位置内的每个位置，使用不同于所述第一值的所述波束参数的第二值产生频谱。一个应用包括在堆叠过高时EDX分析期间检测和标记事件，并重新获取与这些标记事件相对应的位置的EDX数据。

90. 发明公开

EP2685247A1 WAVELENGTH-DISPERSIVE X-RAY FLUORESCENCE ANALYSIS DEVICE 有权
标题翻译： ÖEN ES ES UNG UNG UNG UNG SION SION SION SION SION SION SION SION SION SION SION SION
公开(公告)号：EP2685247A1
公开(公告)日：2014-01-15
申请号：EP12788736.2
申请日：2012-04-03
申请人： Rigaku Corporation
发明人： KATAOKA, Yoshiyuki , INOUE, Hisashi , KAWAKYU, Kosuke
IPC分类号： G01N23/223
CPC分类号： G01N23/223 , G01N23/2076 , G01N2223/076
摘要： In the wavelength dispersive X-ray fluorescence spectrometer of the present invention, a counting loss correcting unit (11), when correcting a counting rate of pulses determined by a counting unit (10) on the basis of a dead time of a detector (7), stores beforehand a correlation between a predetermined pulse height range, within which pulses are selected by a pulse height analyzer (9), and the dead time and determines the dead time so as to correspond to the predetermined pulse height range during a measurement on the basis of the stored correlation.
摘要翻译：在本发明的波长色散X射线荧光光谱仪中，计数损失校正单元（11）根据检测器（7）的死区时间校正由计数单元（10）确定的脉冲的计数率）预先存储由脉冲高度分析器（9）选择脉冲的预定脉冲高度范围与死区时间之间的相关性，并且在测量期间确定死区时间以对应于预定脉冲高度范围存储相关的基础。

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