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61. 发明公开

EP1948816A4 IMPROVED METHODS FOR BEAMING 有权
标题翻译：改进方法喜气洋洋
公开(公告)号：EP1948816A4
公开(公告)日：2009-11-04
申请号：EP06817236
申请日：2006-10-20
申请人： UNIV JOHNS HOPKINS
发明人： VOGELSTEIN BERT , DIEHL FRANK , KINZLER KENNETH W , LI MING
IPC分类号： C12P19/34
CPC分类号： C12Q1/6858 , G01R31/025 , G01R31/3277 , C12Q2565/537 , C12Q2563/155 , C12Q2527/125

62. 发明公开

EP1948816A2 IMPROVED METHODS FOR BEAMING 有权
标题翻译：改进方法喜气洋洋
公开(公告)号：EP1948816A2
公开(公告)日：2008-07-30
申请号：EP06817236.0
申请日：2006-10-20
申请人： The Johns Hopkins University
发明人： VOGELSTEIN, Bert , DIEHL, Frank , KINZLER, Kenneth, W. , LI, Ming
IPC分类号： C12P19/34
CPC分类号： C12Q1/6858 , G01R31/025 , G01R31/3277 , C12Q2565/537 , C12Q2563/155 , C12Q2527/125
摘要： Improvements on the basic method used for BEAMing increase sensitivity and increase the signal-to-noise ratio. The improvements have permitted the determination of intrinsic error rates of various DNA polymerases and have permitted the detection of rare and subtle mutations in DNA isolated from plasma of cancer patients.

63. 发明公开

EP1886161A1 AN APPARATUS AND METHOD FOR TESTING CIRCUIT BREAKERS 审中-公开
标题翻译：设备和检验方法BREAKER SWITCHES
公开(公告)号：EP1886161A1
公开(公告)日：2008-02-13
申请号：EP06741151.2
申请日：2006-06-01
申请人： Easytest Pty Ltd
发明人： REYNOLDS, Robert, Norman , BUNWORTH, Thomas, William
IPC分类号： G01R31/327 , H02H3/16
CPC分类号： G01R31/3277 , H02H3/335
摘要： The present invention relates to an apparatus and method for testing circuit breakers, and in particular, for testing Residual Current Devices (RCD's), otherwise known as Residual Current Circuit Breakers (RCCB's) or 'safety switches'. This apparatus is then used to perform a variety of integrity tests on the RCD. If an RCD is installed it must be tested on a regular basis so as to ensure it is functioning correctly and able to isolate the electrical circuit ultimately preventing a person from being electrocuted. The inbuilt 'push-button' test is only effective in 'trip' testing the RCD, it does not incorporate a 'no trip' test which is a test often performed in the industry to ensure that an RCD does not trip when a current below 30 mA is detected. The present invention also has diagnostic capabilities and can perform a variety of integrity tests on RCDs of different rated currents.

64. 发明授权

EP1673637B1 SCHALTERVORRICHTUNG 有权
标题翻译：交换机设备
公开(公告)号：EP1673637B1
公开(公告)日：2007-02-14
申请号：EP04765316.7
申请日：2004-09-16
申请人： Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V.
发明人： HACKNER, Michael
IPC分类号： G01R31/26
CPC分类号： G01R31/2608 , G01R31/2617 , G01R31/3277
摘要： Disclosed is a switch device (100) comprising a switch (S3) that is to be tested and is provided with a first connection (206), a second connection (208), and a gate (210) for controlling a resistance between the first connection (206) and the second connection (208). Said switch device (100) further comprises a resistor (R) and an apparatus (200) for supplying a measured current to the first connection (206) of the switch (S3) that is to be tested via the resistor (R). The gate (210) and the first connection (206) of the switch (S3) that is to be tested are coupled to each other in an electrically conductive manner. The inventive switch device (100) also comprises a mechanism for detecting a voltage between the gate (210) and the second connection (208) of the switch (S3) that is to be tested, said voltage being provided as a result of the measured current and indicating whether the switch (S3) that is to be tested is in working order. The inventive switch device (100) makes it possible to especially detect a larger number of potential flaws of the switch (S3) that is to be tested compared to conventional switch devices.

65. 发明公开

EP1591797A1 Circuit breakers test device 审中-公开
标题翻译：用于剩余电流断路器的测试设备
公开(公告)号：EP1591797A1
公开(公告)日：2005-11-02
申请号：EP04252469.4
申请日：2004-04-28
申请人： Megger Limited
发明人： Haynes, Simon Michael
IPC分类号： G01R31/327
CPC分类号： G01R31/3277 , G01R31/3272
摘要： According to the invention there is provided a device for testing an electric circuit, the electric circuit including a magnetic core (28) comprising means to generate an AC preconditioning signal with decaying amplitude;

means to apply the AC preconditioning signal to the magnetic element;
means to generate a test signal; and means to apply a test signal to the electric circuit, wherein the device is adapted to apply the test signal subsequent to the preconditioning signal.

The device may be a residual current circuit breaker (RCCB) trip time test instrument. Typically, RCCBs include a transformer core (20) onto which live (L) and neutral windings (N) are placed. Previous circuit activity can leave the transformer core (20) magnetised, even after the live and neutral currents have returned to an equal condition. This can affect subsequent tests. The device of the present invention applies a pre-conditioning decaying AC signal to the transformer core (20) in order to bring the residual magnetism to within a specified, acceptable level.

66. 发明公开

EP1498996A2 Device for checking differential switches in low voltage systems 审中-公开
标题翻译： Niederspannungsanlagen的Vorrichtung zumPrüfenvon Difrifschaltern
公开(公告)号：EP1498996A2
公开(公告)日：2005-01-19
申请号：EP04381024.1
申请日：2004-07-14
申请人： Emilio HABA ARMERO
发明人： Emilio HABA ARMERO
IPC分类号： H02H3/33
CPC分类号： G01R31/3277 , H02H3/335
摘要： Device and method for checking differential switches in low voltage systems.
This consists of a device which is connected to the mains at the point in the current that is to be checked. The device has bridges which are automatically or manually activated; the checking is done by pulsation of connections. Selecting one, another or more pushbuttons together enables the status of the differentials associated with that point of current to be detected. It has means for automatically identifying the phase and branching this off to ground, with no need to know where the phase is prior to verification. The method consists in branching predetermined current values from phase to ground.
This is for application in manufacturing small electrical apparatus for checking differentials in low voltage systems.
摘要翻译：用于检查低压系统中的差动开关的装置和方法。这包括在要检查的电流中的点连接到电源的设备。该设备具有自动或手动启动的桥梁; 通过连接的脉动来进行检查。选择一个，另一个或多个按钮可以检测与该电流点相关联的差分状态。它具有自动识别相位并将其分支到地面的手段，无需知道相位在验证之前的位置。该方法包括从相到地分支预定的电流值。这适用于制造用于检查低压系统中的差动的小型电气设备。

67. 发明公开

EP0961129A1 Test circuit with time-limited fault current for a protection device 有权
标题翻译： Schaltung zumPrüfeneiner zeitlich begrenzten Fehlerstromschutzvorrichtung
公开(公告)号：EP0961129A1
公开(公告)日：1999-12-01
申请号：EP99201733.5
申请日：1999-05-31
申请人： Holec Holland N.V.
发明人： Niehoff, Ronaldus Hendrikus Maria , Limon, Edward Stanley
IPC分类号： G01R31/327 , G01R31/28
CPC分类号： G01R31/3277 , H02H3/044
摘要： Test circuit for testing a fault current protection device, comprising a test switch and a fault current simulation circuit, which can be switched on by means of the test switch and in which a test resistor is incorporated, and a timing circuit, which switches off the fault current simulation circuit at the end of a predetermined time after the fault current simulation circuit has been switched on. The switching path of a semiconductor switch, which is triggered by the test switch and time-control circuit, is incorporated in the fault current simulation circuit.
摘要翻译：用于测试故障电流保护装置的测试电路，包括可以通过测试开关接通的测试开关和故障电流模拟电路，并且其中包含测试电阻器以及定时电路，其关断在故障电流模拟电路已经接通之后的预定时间结束时的故障电流模拟电路。由测试开关和时间控制电路触发的半导体开关的开关路径被并入故障电流仿真电路中。

68. 发明公开

EP0928425A1 PRÜFEINRICHTUNG FÜR EINE ELEKTRONISCHE AUSLÖSEEINRICHTUNG 失效
标题翻译：测试设备的电子脱扣装置
公开(公告)号：EP0928425A1
公开(公告)日：1999-07-14
申请号：EP97913088.0
申请日：1997-09-24
申请人： SIEMENS AKTIENGESELLSCHAFT
发明人： BAUMGÄRTL, Ulrich , RÖHL, Wolfgang
IPC分类号： G01R31
CPC分类号： G01R31/3272 , G01R31/3277
摘要： The invention relates to a test device for an electronic tripping device, especially a low or medium-voltage overload tripping device, comprising a mains transformer. The test device (PE) is provided with a constant current sink (KS) controlled by a mains triggered function generator (FG) so that said current sink (KS) input signal is modulated according to frequency and phase by alternating current. Consequently, mains transformer should be designed for lower output. Such test devices are used to test low or medium voltage overload tripping devices.

69. 发明公开

EP0698900A1 Prüfeinrichtung für Druckschalter 失效
标题翻译： PrüfeinrichtungfürDruckschalter
公开(公告)号：EP0698900A1
公开(公告)日：1996-02-28
申请号：EP95112901.4
申请日：1995-08-17
申请人： S+B TECHNOLOGIE Schätzle + Bergmann GmbH
发明人： Schätzle, Bernd, Dipl.Wirtsch.-Ing. , Bergmann, Helmfried
IPC分类号： H01H11/00
CPC分类号： H01H11/0062 , G01R31/3277
摘要： Vorgeschlagen wird eine Prüfeinrichtung für Druckschalter mit zwei über einen Antrieb im wesentlichen parallel zueinander angeordneten und axial bewegten Stößeln (4), die gegenphasig eine oszillatorische Bewegung ausführen, wobei der Antrieb ein Schrittmotor (13) ist, der eine von außen einstellbare Steuerung aufweist, die den Geschwindigkeitsverlauf der Stößel (4) in Abhängigkeit von Weg und/oder Zeit und/oder Meßwerten von Sensoren bestimmt.
摘要翻译：该装置具有彼此平行布置并且可轴向移动的两个活塞（4）。活塞由驱动器移动，并进行彼此异相的振荡运动。驱动器是带外部可调控制器的步进电机。该控制根据传感器的方向和/或时间和/或测量值来确定活塞（4）的行程速率。在测试过程中，开关指向使得压力点位于活塞轴线的延伸处。选择开关与测试装置的距离，使得活塞（4）的行程足以移动开关，然后再次释放。每个活塞（4）的转向点设置成使其移动开关但不超过开关的冲击点。设定内部转折点使得开关被释放，使得开关进入另一位置的运动不被阻止。

70. 发明授权

EP3857243B1 VERFAHREN ZUM TESTEN EINES BIMETALLSCHALTERS 有权
公开(公告)号：EP3857243B1
公开(公告)日：2024-05-15
申请号：EP19786483.8
申请日：2019-09-27
IPC分类号： G01R31/327 , G01R31/333 , H02H3/04
CPC分类号： G01R31/3277 , G01R31/3333

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