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    • 52. 发明公开
    • OPTICAL SYSTEM FOR MEASUREMENTS, AND LUMINANCE COLORIMETER AND COLORIMETER USING SAME
    • 优化系统FÜRMESSUNGEN SOWIE LEUCHTKRAFTKOLORIMETER UND KOLORIMETER DAMIT
    • EP2562520A1
    • 2013-02-27
    • EP11771704.1
    • 2011-03-15
    • Konica Minolta Optics, Inc.
    • TSURUTANI, Katsutoshi
    • G01J3/51
    • G01J3/51G01J3/02G01J3/0205G01J3/0216G01J3/0218G01J3/506G01J3/513
    • In a measuring probe 40, a measuring beam is diffused by a first diffusion plate 19, and when received by a plurality of light-receiving sensors 13B, 14B, 15B via a plurality of interference filters 13A, 14A, 15B, the measuring beam is made incident on the interference filters 13A, 14A, 15B via second diffusion plates 13C, 14C, 15C. Those interference filters 13A, 14A, 15B are formed such that transmittance characteristics corresponding to a measurement parameter are obtained correspondingly to intensity distribution conditions for an angle of incidence of light incident on the interference filters 13A, 14A, 15B. Therefore, the measuring probe 40 can reduce the effect of displacement of the transmission characteristic caused by the angle of incidence, while using the interference filters 13A, 14A, 15B.
    • 在测量探头40中,测量光束被第一扩散板19扩散,并且当多个受光传感器13B,14B,15B经由多个干涉滤光器13A,14A,15B接收时,测量光束为 通过第二扩散板13C,14C,15C入射到干涉滤光器13A,14A,15B上。 这些干涉滤光片13A,14A,15B形成为与入射到干涉滤光片13A,14A,15B上的光的入射角的强度分布条件对应地获得与测定参数对应的透射率特性。 因此,在使用干涉滤光片13A,14A,15B的同时,测量探头40可以减小由入射角引起的透射特性的位移的影响。