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51. 发明公开

EP1482076A1 Hard coating for cutting tool 有权转让
标题翻译： Harte SchichtfürSchneidwerkzeug
公开(公告)号：EP1482076A1
公开(公告)日：2004-12-01
申请号：EP04011295.5
申请日：2004-05-12
申请人： UNION TOOL CO.
发明人： Wakui, Hideo , Sato, Akira , Mezaki, Shunsuke
IPC分类号： C23C30/00 , C23C14/06
CPC分类号： C23C14/0641 , C23C14/0664 , C23C30/005
摘要： A hard coating film provided for a cutting tool characterized in that a first coating film containing Ti as a metal element and one or two of N and C as non-metal elements is provided directly on a surface of a base material, and a second coating film in which metal and semi-metal compositions are nitride, carbon nitride, oxygen nitride or carbon oxygen nitride represented in terms of % by atom by:

Ti (100-X-Y) Cr (X) Si (Y)

where X: 10≦Cr≦30, Y: 10≦Si≦40
is provided as an uppermost layer.
摘要翻译：硬质涂膜包括含有钛作为金属元素的第一涂膜和作为在金属表面上提供的非金属元素的氮和碳; 以及作为最上层设置的含有氮化物，氮化碳，氮氧化物或碳氮氧化物的第二涂膜。所述硬涂膜包含含有钛作为金属元素的第一涂膜和作为在金属表面上提供的非金属元素的氮和碳; 以（原子％）Ti（1 0 0 -X -Y）CrXSiY表示的含有氮化物，氮化碳，氮氧化物或碳氮氧化物的第二涂膜作为最上层。其中X = 10 = Cr = 30，Y = 10 = Si = 40。

52. 发明公开

EP1250981A3 Drill-polishing system and dust-removing apparatus 有权
标题翻译：钻抛光系统和除尘装置
公开(公告)号：EP1250981A3
公开(公告)日：2004-01-07
申请号：EP02007934.9
申请日：2002-04-09
申请人： Union Tool Co., Ltd.
发明人： Katayama, Ichiro, c/oUnion Tool Co., Ltd.
IPC分类号： B24B55/06 , B24B19/04 , B24B3/24
CPC分类号： B24B3/245 , B24B19/04 , B24B55/06 , Y10T408/35 , Y10T408/381
摘要： Disclosed are a drill-polishing system in which a series of processes associated with the polishing of the drill can be carried out automatically and continuously, and also the efficiency of a drill-polishing process can be enhanced. A drill-polishing system includes a working unit (21) and a loading unit (36), which are disposed adjacent to each other. The working unit (21) includes five holder units (28), each of which holds a drill (26) and which are arranged at 72-degree intervals around the center of an index plate (22). A plurality of processor units are fixedly arranged around the index plate (22) as well as around the loading unit (36).

53. 发明公开

EP1250981A2 Drill-polishing system and dust-removing apparatus 有权
标题翻译： Bohrer-Poliersystem und Vorrichtung zur Staubentfernung
公开(公告)号：EP1250981A2
公开(公告)日：2002-10-23
申请号：EP02007934.9
申请日：2002-04-09
申请人： Union Tool Co., Ltd.
发明人： Katayama, Ichiro, c/oUnion Tool Co., Ltd.
IPC分类号： B24B55/06 , B24B19/04 , B24B3/24
CPC分类号： B24B3/245 , B24B19/04 , B24B55/06 , Y10T408/35 , Y10T408/381
摘要： Disclosed are a drill-polishing system in which a series of processes associated with the polishing of the drill can be carried out automatically and continuously, and also the efficiency of a drill-polishing process can be enhanced.
A drill-polishing system includes a working unit (21) and a loading unit (36), which are disposed adjacent to each other. The working unit (21) includes five holder units (28), each of which holds a drill (26) and which are arranged at 72-degree intervals around the center of an index plate (22). A plurality of processor units are fixedly arranged around the index plate (22) as well as around the loading unit (36).
摘要翻译：公开了一种钻削抛光系统，其中可以自动且连续地执行与钻削的抛光相关联的一系列工艺，并且还可以提高钻削抛光工艺的效率。钻抛光系统包括彼此相邻布置的工作单元（21）和装载单元（36）。工作单元（21）包括五个保持单元（28），每个保持单元（28）保持钻头（26），并围绕指数板（22）的中心以72度的间隔布置。多个处理器单元固定地布置在索引板（22）周围以及围绕装载单元（36）周围。

54. 发明公开

EP0908270A3 Drill-tip sharpening apparatus 失效
标题翻译：钻头磨刀机
公开(公告)号：EP0908270A3
公开(公告)日：2001-01-10
申请号：EP98112387.0
申请日：1998-07-03
申请人： Union Tool Co., Ltd.
发明人： Katayama, Ichiro , Shinbo, Yoshiharu , Nakajima, Yuichi , Watanabe, Yoshinobu
IPC分类号： B24B3/26 , B24B47/22
CPC分类号： B24B47/22 , B24B3/26
摘要： A drill-tip sharpening apparatus which facilitates attachment/removal of a drill. In an attachment (12) of the drill-tip sharpening apparatus, a pair of phase rotation rollers (54) rotatably attached to a main block (50) supports the shank portion of the drill (18), while a body receptor that is provided on a main plate (20) in a vertically movable manner supports the body portion of the drill (18). A shank pressing member (70) is swingably provided on the main block. Through operation of a shank pressing cylinder (48), the shank pressing member (70) swings to hold and release the drill (18) in cooperation with the phase rotation rollers (54). A tip end positioning motor (44) moves a positioning spindle (86) via a drive gear (84) and a slide gear (88) in order to move the drill in the axial direction. A phase adjustment motor (46) rotates a drive roller that is in contact with the phase rotation rollers (54), thereby rotating the drill (18) about its axis via the phase rotation rollers.

55. 发明公开

EP0310231A2 Optical measuring apparatus 失效
标题翻译： Optischer Messapparat。
公开(公告)号：EP0310231A2
公开(公告)日：1989-04-05
申请号：EP88307228.2
申请日：1988-08-05
申请人： UNION TOOL CO LTD
发明人： Katayama, Ichiro
IPC分类号： G01B11/00 , G01B11/02
CPC分类号： G01B11/02 , G01B11/00
摘要： An optical measuring apparatus includes a light scanning section (20) for converting a light beam (61) from a first light source (10) to a parallel scanning light beam (63), into which an object (M) is placed, the dimension of which is to be measured. The apparatus further includes a focusing section (40) including a first focusing lens (41) for focusing the parallel scanning light beam, an electric signal generating section (50) for converting focused light to an electric signal, a measuring reference signal generating section and an electric signal processing section ( 70 ).
The light scanning section (20) comprises a first mirror (31) and a vertically displaced second mirror (32), each mirror being rotated synchronously. The measuring reference section comprises a transparent scale (61) which is rotated in synchronism with the first and second mirrors, a light source, a second focusing lens and a second photoelectric conversion element. The electric signal processing section (70) processes the electric signal from the electric signal generating section (50) by employing the measuring reference signal.
摘要翻译：一种光学测量装置，包括用于将来自第一光源（10）的光束（61）转换成放置有物体（M）的平行扫描光束（63）的光扫描部分（20），其尺寸其中有待测量。该装置还包括聚焦部分（40），其包括用于聚焦平行扫描光束的第一聚焦透镜（41），用于将聚焦光转换成电信号的电信号产生部分（50），测量参考信号产生部分电信号处理部（70）。光扫描部分（20）包括第一反射镜（31）和垂直移动的第二反射镜（32），每个反射镜同步旋转。测量基准部分包括与第一和第二反射镜同步旋转的透明标尺（61），光源，第二聚焦透镜和第二光电转换元件。电信号处理部（70）通过采用测量参考信号来处理来自电信号发生部（50）的电信号。

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