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41. 发明公开

EP2075821A3 Sample holder, method for observation and inspection, and apparatus for observation and inspection 审中-公开
标题翻译：样品架，用于观察和测试设备，用于观察和检查方法
公开(公告)号：EP2075821A3
公开(公告)日：2010-12-08
申请号：EP08254133.5
申请日：2008-12-23
申请人： JEOL Ltd.
发明人： Suga, Mitsuo , Nishiyama, Hidetoshi
IPC分类号： H01J37/20 , H01J37/26 , G01N23/225
CPC分类号： H01J37/20 , H01J37/26 , H01J2237/2004 , H01J2237/2005 , H01J2237/201 , H01J2237/204 , H01J2237/206 , H01J2237/262 , H01J2237/28
摘要： A sample holder (102,150,151,153-157,160-163) used in SEM (scanning electron microscopy) or TEM (transmission electron microscopy) permitting observation and inspection at higher resolution. The common feature to SEM and TEM sample holders is that a sample containing liquid and placed under atmospheric pressure can be observed or inspected after a small amount of the sample is passed through a filter or a medicine is mixed with the sample. The holder has a framelike member (102a,150a) provided with an opening (102b,150b) that is covered with a film (101,150c,231,411,495,496). The film has a first surface on which a sample (315,414) is held. The thickness D of the film and the length L of the portion of the film providing a cover over the opening in the framelike member satisfy a relationship given by L/D

42. 发明授权

EP2801998B1 Transmission electron microscope, and method of observing specimen 有权
标题翻译：透射电子显微镜和观察样品的方法
公开(公告)号：EP2801998B1
公开(公告)日：2016-08-31
申请号：EP14002375.5
申请日：2009-04-27
申请人： Hitachi High-Technologies Corporation
发明人： Nakazawa, Eiko , Kobayashi, Hiroyuki , Kuwabata, Susumu
IPC分类号： H01J37/20 , G01N1/28 , G01N23/225 , G01N1/40 , H01J37/26
CPC分类号： H01J37/20 , G01N1/2813 , G01N23/04 , G01N23/2251 , G01N2001/4027 , H01J37/26 , H01J37/261 , H01J37/3007 , H01J2237/2002 , H01J2237/20214 , H01J2237/204 , H01J2237/206

43. 发明公开

EP2920807A4 A METHOD FOR FORMING AN ELECTRICAL CONNECTION TO A SAMPLE SUPPORT IN AN ELECTRON MICROSCOPE HOLDER 审中-公开
标题翻译：制造用于样本载体的电连接器在电子显微镜HOLDER
公开(公告)号：EP2920807A4
公开(公告)日：2016-07-13
申请号：EP13855383
申请日：2013-11-13
申请人： PROTOCHIPS INC
发明人： DAMIANO JR JOHN , NACKASHI DAVID P , GARDINER DANIEL STEPHEN , WALDEN II FRANKLIN STAMPLEY , CARPENTER WILLIAM BRADFORD
IPC分类号： H01J37/20 , G01N1/28 , H01J37/26
CPC分类号： H01R13/24 , H01J37/20 , H01J37/26 , H01J2237/2003 , H01J2237/2007 , H01J2237/2008 , H01J2237/206 , H01R12/721 , H01R12/79

44. 发明公开

EP3038131A1 Improved specimen holder for a charged particle microscope 审中-公开
标题翻译：改进带电粒子显微镜的样品架
公开(公告)号：EP3038131A1
公开(公告)日：2016-06-29
申请号：EP14199616.5
申请日：2014-12-22
申请人： FEI Company
发明人： Vystavel, Tomás , Sesták, Josef , Poloucek, Pavel , Tuma, Lubomír , Hrouzek, Michal , Trnkócy, Tomás , Cafourek, Martin
IPC分类号： H01J37/20 , H01J37/26
CPC分类号： H01J37/16 , H01J37/20 , H01J37/26 , H01J2237/2007 , H01J2237/202 , H01J2237/20207 , H01J2237/20214 , H01J2237/20278 , H01J2237/204 , H01J2237/206
摘要： A specimen holder (H) for a Charged Particle Microscope, comprising:
- A support structure (1);
- An elongated member (3), a first end (3a) of which is connected to said support structure (1) and the second end (3b) of which comprises a specimen mounting zone (5), the elongated member (3) having a longitudinal axis (3') that extends along its length between said first (3a) and second ends (3b),

wherein said specimen mounting zone (5) comprises:
- A rotor (7) that is rotatable about a transverse axis (7') extending substantially perpendicular to said longitudinal axis (3');
- A paddle (9) connected to said rotor (7) so as to be rotatable about said transverse axis (7'), the paddle (9) comprising a specimen mounting area (11);
- Driving means (13) connected to said rotor (7), which can be invoked to rotate said paddle (9) through a rotational range that allows the paddle (9) to be inverted relative to an initial orientation thereof.
摘要翻译：一种用于带电粒子显微镜的样品架（H），包括： - 支撑结构（1）; - 细长构件（3），其第一端部（3a）连接到所述支撑结构（1），并且其第二端部（3b）包括样本安装区域（5），细长构件（3）具有（3a）和第二端部（3b）之间沿其长度延伸的纵向轴线（3'），其中所述样品安装区域（5）包括： - 转子（7），其能够围绕横向轴线 '）基本上垂直于所述纵向轴线（3'）延伸; - 连接到所述转子（7）以便可绕所述横向轴线（7'）旋转的桨叶（9），所述桨叶（9）包括试样安装区域（11）; - 连接到所述转子（7）的驱动装置（13），其可以被调用以使所述桨叶（9）旋转经过允许所述桨叶（9）相对于其初始定向被翻转的旋转范围。

45. 发明授权

EP2838107B1 CIRCUIT PROBE FOR CHARGED PARTICLE BEAM SYSTEM 有权
标题翻译： SWITCHING PROBE货物的承载梁系统
公开(公告)号：EP2838107B1
公开(公告)日：2016-06-01
申请号：EP14180858.4
申请日：2014-08-13
申请人： FEI COMPANY
发明人： Barends, Paul , Van den Boogaard, Ron , Brundage, Philip
IPC分类号： H01J37/20 , G01R31/28 , H01J37/305
CPC分类号： G01R1/06705 , H01J37/20 , H01J2237/2008 , H01J2237/206 , H01J2237/208 , H01J2237/24564 , H01J2237/24592

46. 发明授权

EP2482061B1 System and method for localization of large numbers of fluorescent markers in biological samples 有权
标题翻译：系统和方法，用于定位在生物样品中的大量荧光标记的
公开(公告)号：EP2482061B1
公开(公告)日：2016-05-11
申请号：EP12152791.5
申请日：2012-01-27
申请人： FEI Company
发明人： Parker, N. William , Utlaut, Mark
IPC分类号： G01N23/225 , H01J37/28 , H01J37/22 , G01N21/64
CPC分类号： G01N21/6428 , G01N21/6458 , G01N21/6486 , G01N23/225 , H01J37/228 , H01J37/28 , H01J37/285 , H01J2237/206 , H01J2237/2443 , H01J2237/24455 , H01J2237/2448 , H01J2237/2803 , H01J2237/2857

47. 发明公开

EP2598857A4 IN SITU HOLDER ASSEMBLY 审中-公开
标题翻译：原位HOLD安排
公开(公告)号：EP2598857A4
公开(公告)日：2015-09-16
申请号：EP11813193
申请日：2011-07-28
申请人： E A FISCHIONE INSTR INC
发明人： DESHMUKH PUSHKARRAJ V , GRONSKY JEFFREY J , FISCHIONE PAUL E
IPC分类号： G01N1/44 , H01J37/20
CPC分类号： G01N21/0303 , H01J37/20 , H01J37/228 , H01J2237/2002 , H01J2237/2003 , H01J2237/206 , H01J2237/2065

48. 发明授权

EP1735811B1 METHOD AND SYSTEM FOR ULTRAFAST PHOTOELECTRON MICROSCOPE 有权
标题翻译：方法和系统便于高速光电子显微镜
公开(公告)号：EP1735811B1
公开(公告)日：2015-09-09
申请号：EP05743023.3
申请日：2005-04-01
申请人： CALIFORNIA INSTITUTE OF TECHNOLOGY
发明人： ZEWAIL, Ahmed , LOBASTOV, Vladimir
IPC分类号： H01J37/26 , H01J37/073 , H01J37/065 , H01J37/24 , G01N23/04
CPC分类号： H01J37/26 , H01J37/065 , H01J37/073 , H01J37/24 , H01J37/243 , H01J37/265 , H01J2237/0432 , H01J2237/06333 , H01J2237/06341 , H01J2237/206 , H01J2237/2065 , H01J2237/24585 , H01J2237/2482 , H01J2237/2803 , H01J2237/2809 , H01J2237/2813 , H01J2237/2855

49. 发明公开

EP2896060A2 DOUBLE TILT HOLDER AND MULTICONTACT DEVICE 审中-公开
标题翻译：带双BANK AND MORE接触器持有人
公开(公告)号：EP2896060A2
公开(公告)日：2015-07-22
申请号：EP13784005.4
申请日：2013-09-13
申请人： Denssolutions B.V.
发明人： ZANDBERGEN, Hendrik Willem
IPC分类号： H01J37/20
CPC分类号： G02B21/26 , G21K5/08 , H01J37/20 , H01J2237/2007 , H01J2237/20207 , H01J2237/20214 , H01J2237/206 , H01J2237/2065 , H01J2237/26 , Y10T29/49826
摘要： The present invention is in the field of a holder and multicontact device for use in microscopy, a method of loading the multicontact device, a container for the multicontact device, and a microscope comprising said holder and device. The present invention is in the field of microscopy, specifically in the field of electron and focused ion beam microscopy. However it application is extendable in principle to any field of microscopy.

50. 发明公开

EP2801998A3 Transmission electron microscope, and method of observing specimen 有权
标题翻译：透射电子显微镜和观察标本的方法
公开(公告)号：EP2801998A3
公开(公告)日：2014-12-10
申请号：EP14002375.5
申请日：2009-04-27
申请人： Hitachi High-Technologies Corporation
发明人： Nakazawa, Eiko , Kobayashi, Hiroyuki , Kuwabata, Susumu
IPC分类号： H01J37/20 , G01N1/28 , G01N23/225 , G01N1/40 , H01J37/26
CPC分类号： H01J37/20 , G01N1/2813 , G01N23/04 , G01N23/2251 , G01N2001/4027 , H01J37/26 , H01J37/261 , H01J37/3007 , H01J2237/2002 , H01J2237/20214 , H01J2237/204 , H01J2237/206
摘要： Provided is means which enables observation of the shape of a specimen as it is without deforming the specimen. Observation is made by allowing a specimen-holding member having an opening (for example, microgrid and mesh) to hold an ionic liquid and charging a specimen thereto, to allow the specimen to suspend in the ionic liquid. Furthermore, in the proximity of the specimen-holding member, a mechanism of injecting an ionic liquid (ionic liquid introduction mechanism) and/or an electrode are provided. When a voltage is applied to the electrode, the specimen moves or deforms in the ionic liquid. How the specimen moves or deforms can be observed. Furthermore, in the proximity of specimen-holding member, an evaporation apparatus is provided to enable charge of the specimen into the ionic liquid while evaporating. Furthermore, in the proximity of the specimen-holding member, a microcapillary is provided to charge a liquid-state specimen into the ionic liquid. Note that the specimen-holding member is designed to be rotatable.
摘要翻译：提供了一种能够在不使试样变形的情况下直接观察试样形状的装置。通过使具有开口的样品保持部件（例如，微细网和网状物）保持离子液体并将样品充电到其中以使样品悬浮在离子液体中来进行观察。此外，在试样保持部件附近，设置注入离子液体（离子液体导入机构）和/或电极的机构。当电压施加到电极上时，试样在离子液体中移动或变形。可以观察到标本如何移动或变形。此外，在样本保持部件附近设置有蒸发装置，以使样本在蒸发的同时能够充入离子液体中。此外，在样本保持部件附近，提供微型毛细管以将液态样本充入离子液体中。请注意，标本保持部件被设计成可旋转的。

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