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    • 41. 发明公开
    • Configurable probe pads to facilitate parallel testing of integrated circuit devices
    • Konfigurierbare Kontaktleiste zur bequemen parallellenPrüfungvon integrierten Schaltungen
    • EP0745859A2
    • 1996-12-04
    • EP96302949.1
    • 1996-04-26
    • SGS-THOMSON MICROELECTRONICS, INC.
    • Brannigan, Michael JosephLysinger, Mark AlanMcClure, David Charles
    • G01R1/04
    • G01R31/2884G01R31/2831G11C29/48
    • According to the present invention, parallel testing of integrated circuit devices are facilitated such that it is not necessary that integrated circuit devices to be parallel tested be "ends only" devices. A side pad located along the sides, rather than the ends, of the integrated circuit device is electrically connected by muitiplexing circuitry to a corresponding configurable probe pad located along the ends of the device. During parallel testing of the device, the side pad is effectively tested when the configurable probe pad is probed and tested. While the configurable probe pad is tested during parallel testing, the side pad is not directly exercised. Following parallel testing, the side pad is bonded to the device package but the configurable probe pad is not bonded to the device package.
    • 根据本发明,集成电路器件的并行测试方便,因此并不需要将并联测试的集成电路器件设为“仅限端”器件。 沿着集成电路器件的侧面而不是端部设置的侧焊盘通过多路复用电路电连接到沿着器件的端部设置的对应的可配置探针焊盘。 在对器件进行并行测试时,可以对可配置的探头焊盘进行探测和测试时,对侧面焊盘进行有效测试。 虽然在并行测试期间对可配置的探头焊盘进行了测试,但是侧面垫没有直接运行。 在进行并行测试之后,侧面焊盘接合到器件封装,但是可配置的探针焊盘没有粘合到器件封装。
    • 44. 发明公开
    • Output driver with programmable drive characteristics
    • Ausgangstreiber mit programmierbaren Treiberparametern
    • EP0735687A2
    • 1996-10-02
    • EP96302174.6
    • 1996-03-28
    • SGS-THOMSON MICROELECTRONICS, INC.
    • McClure, David C.
    • H03K19/0185
    • H03K19/00361H03K19/018585
    • An output driver circuit for an integrated circuit is disclosed, where the output driver drives an output terminal with a high logic level having a voltage limited from the power supply voltage of the integrated circuit. The limited voltage is provided by applying a limited output high voltage to an output buffer, such that the drive signal applied to the gate of the pull-up transistor in the output driver is limited by the limited output high voltage applied to the output buffer. A voltage reference and regulator circuit for generating the limited output high voltage is also disclosed, and is based on a current mirror. The sum of the current in the current mirror is controlled by a bias current source, which may be dynamically controlled within the operating cycle or programmed by way of fuses, so that the output impedance of the voltage reference and regulator circuit may be selected. Slew rate control for output driver transistors is also provided, under the control of a bias circuit that generates a tracking reference voltage; the reference voltage may also be programmed by way of fuses or by control signals, so that the slew rate may also be selected.
    • 公开了用于集成电路的输出驱动器电路,其中输出驱动器驱动具有从集成电路的电源电压限制的电压的高逻辑电平的输出端子。 通过将有限的输出高电压施加到输出缓冲器来提供有限的电压,使得施加到输出驱动器中的上拉晶体管的栅极的驱动信号受到施加到输出缓冲器的受限输出高电压的限制。 还公开了用于产生有限输出高电压的电压参考和调节器电路,并且基于电流镜。 电流镜中的电流之和由偏置电流源控制,偏置电流源可以在操作周期内动态控制或通过熔断器编程,从而可以选择电压基准和调节器电路的输出阻抗。 在产生跟踪参考电压的偏置电路的控制下,还提供输出驱动晶体管的转换速率控制; 参考电压也可以通过熔丝或控制信号进行编程,从而也可以选择转换速率。
    • 45. 发明授权
    • A semiconductor memory with precharged redundancy multiplexing
    • 半导体存储器预充电冗余复用器
    • EP0491523B1
    • 1996-09-11
    • EP91311569.7
    • 1991-12-12
    • SGS-THOMSON MICROELECTRONICS, INC.
    • McClure, David Charles
    • G06F11/20
    • G11C29/84
    • An integrated circuit memory is disclosed which includes redundant columns associated with a sub-array (12), and in which multiple input/output terminals are placed in communication with multiple columns in the sub-array in read and write cycles. The number of redundant columns per sub-array is less than the number of input(38)/output(20) terminals. A multiplexer connects the selected redundant column to a selected sense amplifier and write circuit for the input/output with which the replaced column was associated. The multiplexer includes pass gates connected to the bit lines of the redundant column, and fuses connected between each of the pass gates and each of the sense/write circuits selectable for the redundant (25) column. Those of the fuses which are not associated with the selected input/output are opened, and the fuses associated with the selected input/output are left intact. Precharge transistors are connected to the fuse sides of the pass gates, for precharging each of the floating nodes after the pass gates are turned off. This precharging negates the effect of any charge which may be trapped on the fuse side of the pass gates for those lines where the fuses are opened, so that the access time for the next cycle will not be degraded.