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31. 发明公开

EP2720036A3 Vorrichtung zur Prüfung von Erzeugnissen 有权转让
标题翻译：设备的产品测试
公开(公告)号：EP2720036A3
公开(公告)日：2015-01-07
申请号：EP13004521.4
申请日：2013-09-16
申请人： Seidenader Maschinenbau GmbH
发明人： Ringer, Fabrice , Baumgartner, Hans
IPC分类号： G01N27/92 , B65G29/02 , G01N35/04
CPC分类号： G01N27/92 , B65G29/02 , B65G2201/0244 , G01N35/04 , G01N2035/0439
摘要： Vorrichtung zur Prüfung von Erzeugnissen, insbesondere von Ampullen, Flaschen und dergleichen, mit Mitteln zur Bewegung der zu prüfenden Erzeugnisse und mit Erfassungsmitteln zur Hochspannungsprüfung für die Erzeugnisse, wobei sie ein drehbar antreibbares Inspektionskarussel aufweist, wobei die Erzeugnisse mittels mindestens zwei schräg zueinander angeordneter rotierenden Transportsternen von einer vertikalen Aufnahmeposition in eine zumindest waagerechte Prüfposition und umgekehrt überführbar sind.

32. 发明公开

EP2659266A4 A METHOD AND A DEVICE FOR DETECTING DEFECTS IN A PACKAGING MATERIAL 有权
标题翻译： VERFAHREN UND VORRICHTUNG ZUR FEHLERDETEKTION IN EINEM VERPACKUNGSMATERIAL
公开(公告)号：EP2659266A4
公开(公告)日：2014-09-10
申请号：EP11853638
申请日：2011-12-22
申请人： TETRA LAVAL HOLDINGS & FINANCE
发明人： HALLSTADIUS HANS , LINGOIS PHILIPPE
IPC分类号： G01N27/92 , B65B57/00 , G01M3/40 , G01N27/61 , G01R31/12
CPC分类号： G01N27/92 , G01M3/40 , G01R31/1227

33. 发明公开

EP2534474A2 AUTOMATED DRILLING FLUID ANALYZER 审中-实审
标题翻译：自动化BOHRFLÜSSIGKEITEN-ANALYSEGERÄT
公开(公告)号：EP2534474A2
公开(公告)日：2012-12-19
申请号：EP11742797.1
申请日：2011-02-10
申请人： Schlumberger Norge AS
发明人： STOCK, Tore , RONAES, Egil , HILTON, Thomas
IPC分类号： G01N27/30 , G01N21/64 , G01N33/18 , E21B47/00
CPC分类号： E21B21/01 , E21B47/00 , G01N11/10 , G01N11/14 , G01N21/64 , G01N23/223 , G01N27/92 , G01N33/2823
摘要： An automated viscometer comprises a housing having an inlet and an outlet, a viscometer sleeve disposed in the housing, a bob disposed in the sleeve, wherein an annulus is formed between the viscometer sleeve and the bob, and wherein at least one of the viscometer sleeve and the bob is configured to rotate, a motor operatively coupled to at least one of the viscometer sleeve and the bob, a torque measuring device operatively coupled to the viscometer sleeve and the bob.
摘要翻译：自动粘度计包括具有入口和出口的壳体，设置在壳体中的粘度计套筒，布置在套筒中的凸轮，其中在粘度计套筒和摇摆之间形成有环，并且其中至少一个粘度计套筒并且所述摆锤构造成旋转，马达可操作地联接到所述粘度计套筒和所述摇摆中的至少一个，可操作地联接到所述粘度计套筒和所述摇摆器的扭矩测量装置。

34. 发明公开

EP2217788A2 AUTOMATED ELECTRICAL STABILITY METER 审中-公开
标题翻译： AUTOMATED电稳定性刀
公开(公告)号：EP2217788A2
公开(公告)日：2010-08-18
申请号：EP08848125.4
申请日：2008-11-07
申请人： M-I LLC
发明人： GROWCOCK, Frederick, B. , BARANOWSKI, Marian , BALLI, Donovan
IPC分类号： E21B21/08 , E21B44/06
CPC分类号： G01N33/2823 , G01N27/92
摘要： A method for automatically measuring a property of a fluid associated with a drilling application, including obtaining a sample of the fluid, wherein the sample of the fluid is obtained by directing the fluid through an electrode probe assembly comprising an electrode probe and depositing the fluid in a probe gap between electrodes of the electrode probe, ramping up a voltage applied to the electrodes of the electrode probe until a threshold current is obtained, recording the breakdown voltage at the threshold current value, and using the breakdown voltage to compute the property of the sample of the fluid.

35. 发明授权

EP1065502B1 METHOD FOR ANALYZING THE BREAKDOWN CHARACTERISTICS OF A GASEOUS DIELECTRIC IN A HIGHLY NON-UNIFORM FIELD 失效
标题翻译：程序用于在强不均匀的场气体电介质的PUNCH行为
公开(公告)号：EP1065502B1
公开(公告)日：2006-06-07
申请号：EP98929951.6
申请日：1998-06-19
申请人： Starikov, Valery Venginovich
发明人： Zhuravkov, Igor Viktorovich
IPC分类号： G01N27/68 , H01J37/32 , H05H1/24 , G01R31/12
CPC分类号： G01R31/1281 , G01N27/92 , H05H1/48 , H05H2001/483
摘要： The present invention pertains to testing techniques and may be used in the research on the dielectric rigidity of a gaseous isolation in high-voltage equipment. This invention provides a method for performing the breakdown of a gaseous dielectric using a power supply with a reduced voltage. A corona discharge is generated by supplying an initial voltage to electrodes defining a discharge gap so as to create a three-dimensional load at the corona-producing electrode. The corona discharge is then redistributed along the discharge gap by lowering the intensity of said corona discharge. A voltage pulse base is then generated in the supply circuit and added to the initial voltage so as to ensure the complete breakdown of the gaseous dielectric. This method comprises lowering the intensity of the corona discharge and forming the pulse base using a dynamic secondary discharge device which is integrated to the supply circuit and has its electrodes switched from a closed state into an open one before being bridged by the electrical arc.

36. 发明公开

EP1499880A2 METHOD FOR CHARACTERIZING WATER-IN-OIL EMULSIONS USING ELECTRICAL WAVE FORMS 审中-公开
标题翻译：方法油包水J表征BY电波形
公开(公告)号：EP1499880A2
公开(公告)日：2005-01-26
申请号：EP03747502.7
申请日：2003-04-29
申请人： Halliburton Energy Services, Inc.
发明人： MURPHY, Robert, J., Jr. , JAMISON, Dale, E.
IPC分类号： G01N27/06 , C09K7/06
CPC分类号： C09K8/36 , G01N27/92 , G01N33/2823
摘要： A method is provided for characterizing emulsion stability to evaluate suitability of the emulsion for use as a drilling fluid in drilling subterranean boreholes. The method provides a supplement or alternative to the standard method of determining Electrical Stability of the emulsion. In the method of the invention, Breakdown Energy is calculated. Breakdown Energy can be measured at the same test point as Electrical Stability. A digital storage oscilloscope and a computer are used in addition to an electrical stability meter.

37. 发明公开

EP0487302A3 Method for testing electrical properties of silicon single crystal 失效
标题翻译：用于测试硅单晶电性能的方法
公开(公告)号：EP0487302A3
公开(公告)日：1993-11-18
申请号：EP91310648.0
申请日：1991-11-19
申请人： SHIN-ETSU HANDOTAI COMPANY LIMITED
发明人： Fusegawa, Izumi , Yamagishi, Hirotoshi , Fujimaki, Nobuyoshi , Karasawa, Yukio
IPC分类号： G01N27/92 , C30B33/00 , C30B33/08
CPC分类号： G01N27/92 , G01R31/2831 , Y10S148/06 , Y10S148/162
摘要： The evaluation of the oxide film dielectric breakdown voltage of a silicon semiconductor single crystal is caried out by cutting a wafer out of the single crystal rod, etching the surface of the wafer with the mixed solution of hydrofluoric acid and nitric acid thereby relieving the wafer of strain, then etching the surface of the wafer with the mixed solution of K₂Cr₂O₇, hydrofluoric acid, and water therby inducing occurrence of pits and scale-like patterns on the surface, determining the density of the scale-like patterns, and computing the oxide film dielectric breakdown voltage by making use of the correlating between the density of scale-like patterns and the oxide film dielectric breakdown voltage. This fact established the method of this invention to be capable of effecting an evaluation equivalent to the evaluation of the oxide film dielectric breakdown voltage of a PW wafer prepared from the single crystal rod.

38. 发明公开

EP0487302A2 Method for testing electrical properties of silicon single crystal 失效
标题翻译：伊斯兰法兰西共和国电力公司。
公开(公告)号：EP0487302A2
公开(公告)日：1992-05-27
申请号：EP91310648.0
申请日：1991-11-19
申请人： SHIN-ETSU HANDOTAI COMPANY LIMITED
发明人： Fusegawa, Izumi , Yamagishi, Hirotoshi , Fujimaki, Nobuyoshi , Karasawa, Yukio
IPC分类号： G01N27/92 , C30B33/00 , C30B33/08
CPC分类号： G01N27/92 , G01R31/2831 , Y10S148/06 , Y10S148/162
摘要： The evaluation of the oxide film dielectric breakdown voltage of a silicon semiconductor single crystal is caried out by cutting a wafer out of the single crystal rod, etching the surface of the wafer with the mixed solution of hydrofluoric acid and nitric acid thereby relieving the wafer of strain, then etching the surface of the wafer with the mixed solution of K₂Cr₂O₇, hydrofluoric acid, and water therby inducing occurrence of pits and scale-like patterns on the surface, determining the density of the scale-like patterns, and computing the oxide film dielectric breakdown voltage by making use of the correlating between the density of scale-like patterns and the oxide film dielectric breakdown voltage. This fact established the method of this invention to be capable of effecting an evaluation equivalent to the evaluation of the oxide film dielectric breakdown voltage of a PW wafer prepared from the single crystal rod.
摘要翻译：通过从单晶棒切割晶片来实现对硅半导体单晶的氧化膜介电击穿电压的评价，用氢氟酸和硝酸的混合溶液蚀刻晶片的表面，从而使晶片然后用K2Cr2O7，氢氟酸和水的混合溶液蚀刻晶片的表面，从而在表面上引起凹坑和鳞片状图案的发生，确定鳞片状图案的密度，并计算氧化膜通过利用鳞片状图案的密度和氧化膜介电击穿电压之间的相关性来获得介电击穿电压。这个事实确定了本发明的方法能够进行与从单晶棒制备的PW晶片的氧化膜介电击穿电压的评估相当的评估。

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