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31. 发明公开

EP2690447A2 Inspection jig and contact 审中-公开
标题翻译： Prüfkopfund Kontakt
公开(公告)号：EP2690447A2
公开(公告)日：2014-01-29
申请号：EP13177051.3
申请日：2013-07-18
申请人： Nidec-Read Corporation
发明人： Numata, Kiyoshi , Yamamoto, Masami , Kim, Sukkwi
IPC分类号： G01R1/067
CPC分类号： G01R31/2801 , G01R1/06722 , G01R1/06761
摘要： A contact that can maintain the function of a spring portion even under relatively high current conditions, and an inspection jig equipped with the contact are provided. A contact (50) of an inspection jig (10) includes a columnar portion (52) and a cylindrical portion (54) disposed around the columnar portion (52). The columnar portion (52) includes a front end portion (52f) protruding from the cylindrical portion (54), and a rear end portion (52r). The cylindrical portion (54) has a spring portion (54s), and the spring portion (54s) is configured to expand and compress to change a dimension between the front end portion (52f) of the columnar portion (52) and the rear end portion of the cylindrical portion (54). The cylindrical portion (54) is formed of an alloy of nickel (Ni) and phosphorus (P).
摘要翻译：提供即使在相对高的电流条件下也可以保持弹簧部分的功能的接触件，以及配备有触点的检查夹具。检查夹具（10）的接触件（50）包括圆柱形部分（52）和围绕柱状部分（52）设置的圆柱形部分（54）。柱状部（52）具有从圆筒部（54）突出的前端部（52f）和后端部（52r）。圆柱形部分（54）具有弹簧部分（54s），并且弹簧部分（54s）构造成膨胀和压缩以改变柱状部分（52）的前端部分（52f）和后端圆柱形部分（54）的一部分。圆筒部（54）由镍（Ni）和磷（P）的合金形成。

32. 发明公开

EP1055932A2 Apparatus and method for inspecting wiring on board 审中-公开
标题翻译： Vorrichtung und Verfahren zumPrüfender Leiter auf einer Leiterplatte
公开(公告)号：EP1055932A2
公开(公告)日：2000-11-29
申请号：EP00110909.9
申请日：2000-05-24
申请人： Nidec-Read Corporation
发明人： Yamashita, Munehiro
IPC分类号： G01R31/28
CPC分类号： G01R31/2805 , G01R31/304 , G01R31/315
摘要： A magnetic field applying portion is positioned right above a magnetic field applied region, and applies a magnetic field to the magnetic field applied region. Among probes which are abutted against ball grids of wirings, two probes are selectively connected electrically to a current detector section whereby a closed circuit is formed. This causes the closed circuit to carry an induced current as the magnetic flux through the magnetic field the magnetic field applied region changes with time. A current detector of the current detector section detects the value of the induced current, and whether there is a short-circuit is judged based on the detected current value.
摘要翻译：磁场施加部位于磁场施加区域的正上方，并向磁场施加区域施加磁场。在与布线的球栅接触的探针中，两个探针选择性地电连接到电流检测器部分，从而形成闭合电路。这导致闭路通过磁场施加感应电流，磁场随着时间的推移而变化。电流检测器部分的电流检测器检测感应电流的值，并且基于检测到的电流值来判断是否存在短路。

33. 发明公开

EP0862062A3 Circuit board inspection apparatus and method 失效
标题翻译：用于测试电路板的方法和装置
公开(公告)号：EP0862062A3
公开(公告)日：2000-02-02
申请号：EP98103455.6
申请日：1998-02-27
申请人： Nidec-Read Corporation
发明人： Takahashi, Tadashi
IPC分类号： G01R31/312 , G01R31/28
CPC分类号： H05K1/0268 , G01R31/312
摘要： The present invention provides an inexpensive and reliable circuit board inspection apparatus and method that is applicable to a densely wired circuit board. [Solution] A sensor module 50 is disposed on a pad section 38 on an inspected circuit board. The sensor module 50 is formed by integrating four sensor units 52, 54, 56 and 58 together. Each sensor unit is capacitively coupled to a plurality of corresponding pads so that a signal can be independently obtained from each sensor unit. By selecting a pad 36b of a pad section 36 and a sensor unit 54 and providing a predetermined signal between them to inspect the continuity, it can be determined whether a printed pattern 34x is open-circuited between a pad 38b and a pad 38x. This invention enables the continuity of complicated or irregular printed patterns to be inspected accurately and inexpensively.

34. 发明公开

EP0846953A2 Printed circuit board inspecting apparatus, and method of using a universal-type printed circuit board inspecting apparatus 失效
标题翻译：印刷电路板检查装置和使用通用型印刷电路板检查装置的方法
公开(公告)号：EP0846953A2
公开(公告)日：1998-06-10
申请号：EP97121442.4
申请日：1997-12-05
申请人： Nidec-Read Corporation
发明人： Nishikawa, Hideo , Miki, Takashi, c/o Read Elec. Corp.
IPC分类号： G01R1/073
CPC分类号： G01R1/07328 , G01R1/07378
摘要： An inspecting apparatus for inspecting conductivity between and among inspection points on a printed circuit board. The apparatus comprises a plurality of probes arranged in a predetermined patter, a translator board including a first set of terminals arranged in the same pattern as that of the probes and a second set of terminals arranged in the same pattern as that of the inspection points on a printed circuit board to be inspected, the first set of terminals being respectively interconnected with corresponding terminals of the second set, the translator board being exchangeably mounted on the apparatus, and interconnecting pins for electrically interconnecting the probes with corresponding the terminals of the first set of the translator board.
摘要翻译：一种用于检查印刷电路板上的检查点之间的导电性的检查装置。该设备包括以预定图案排列的多个探针，包括以与探针相同的图案布置的第一组端子的转换器板以及以与检测点上的图案相同的图案布置的第二组端子待检测的印刷电路板，第一组端子分别与第二组的相应端子相互连接，转换器板可交换地安装在设备上，以及互连管脚，用于将探针与第一组的相应端子电互连的翻译委员会。

35. 发明公开

EP2908229A1 Method for detecting touched position on touch panel, method and apparatus for inspecting a touch panel 审中-公开
标题翻译：的检测上的触摸屏方法和设备的触摸位置用于检测触摸屏的方法
公开(公告)号：EP2908229A1
公开(公告)日：2015-08-19
申请号：EP15155317.9
申请日：2015-02-17
申请人： Nidec-Read Corporation
发明人： Kusuda, Tatsufumi , Honda, Mutsuhiro , Kurihara, Yasuhito
IPC分类号： G06F3/041 , G06F3/044
CPC分类号： G06F3/0418 , G06F3/044 , G06F2203/04104
摘要： A method for detecting a touched position on a touch panel (100) includes: acquiring a capacitance value (S2, 3) detected in each sensing area (101) of the touch panel; correcting each capacitance value (13), based on a correlation value table (6) that stores therein a numerical influence to be exerted on the capacitance value in each sensing area by the capacitance value in the sensing area adjacent to each sensing area, and calculating a correlation correction value for each sensing area (S4); retrieving the maximum value from among the correlation correction values (S12, 14); and defining the sensing area for which the correlation correction value is the maximum value, as a maximum area, calculating a centroid position as to an area including the maximum area and the sensing areas adjacent to the maximum area, based on the correlation correction values (S16), and acquiring the calculated centroid position as a touched position (S17, 15).
摘要翻译：一种用于检测触摸面板（100）上的触摸位置的方法，包括：获取的电容值（S2，3）检测到的在每个感测区（101）的触摸面板; 校正每个电容值（13）的基础上的相关值表（6）并在其中存储一个数值影响到对电容值中的每个感测区域通过在感测区域相邻感测区域的电容值来施加，并计算对于每个感测区域的相关修正值（S4）; 从相关的修正值（S12，14）中检索所述最大值; 和限定感测区域的量，相关的修正值是最大值，作为最大面积，计算为（一个区域包括最大区域和感测区域毗邻的最大面积，基于相关的修正值的质心位置 S16），并获取计算重心位置作为触摸位置（S17，15）。

36. 发明公开

EP2851940A1 Processing object transport system, and substrate inspection system 审中-公开
标题翻译： Verarbeitungsobjekttransportsystem和Substratinspektionssystem
公开(公告)号：EP2851940A1
公开(公告)日：2015-03-25
申请号：EP14184928.1
申请日：2014-09-16
申请人： Nidec-Read Corporation
发明人： Nakagawa, Takashi , Matsukawa, Toshihide , Hikita, Osamu , Ogata, Akira , Kaida, Michio
IPC分类号： H01L21/67 , H01L21/677
CPC分类号： H01L21/67721 , H01L21/67173 , H01L21/67242 , H01L21/67253 , H01L21/67703 , H01L21/67748 , H01L21/6776
摘要： A substrate inspection system (1) includes a plurality of processing units (12, 13, and 14), and each processing unit is provided with: a transport mechanism (2) configured to transport an substrate W to be inspected along a transport passage which extends substantially horizontally; a lift mechanism (5) configured to lift the substrate (W) to be inspected to a height position (P1), at a set position (P2) on the transport passage; and processors (A and B) each configured to perform a predetermined process on the substrate (W) to be inspected positioned at the height position (P1). The processing units (12, 13, and 14) are arranged such that transport passages thereof are aligned and such that the transport directions thereof are the same direction. Between two adjacent transport passages, the substrate (W) to be inspected is delivered from the transport passage on an upstream side to the transport passage on a downstream side. Another substrate (W) to be inspected which is different from the substrate (W) to be inspected can be transported under the substrate (W) to be inspected while the processing object is positioned at the retracted position, when the substrate (W) to be inspected is positioned at the height position (P1) by the lift mechanism (5) in the corresponding processing unit.
摘要翻译：基板检查系统（1）包括多个处理单元（12,13,14），并且每个处理单元设置有：传送机构（2），其构造成沿着传送通道传送待检查的基板W，大致水平地延伸; 提升机构（5），其构造成将待检查的基板（W）提升到高度位置（P1），位于所述输送通道上的设定位置（P2）处; 以及处理器（A和B），每个处理器（A和B）被配置为在待检查的基板（W）上执行预定处理，位于高度位置（P1）。处理单元（12,13和14）被布置成使得其输送通道对齐并使其输送方向相同。在两个相邻的输送通道之间，待检查的基板（W）在输送通道的上游侧在下游侧被输送到输送通道。当待处理对象位于缩回位置时，待检查的另一基板（W）被检查不同于待检查的基板（W）可以在基板（W）下被传送，以便当基板（W）到被检查通过相应的处理单元中的提升机构（5）定位在高度位置（P1）。

37. 发明公开

EP2811304A1 Circuit board inspection method, circuit board inspection apparatus and circuit board inspection tool 有权
标题翻译： Leiterplattenprüfverfahren，LeiterplattenprüfvorrichtungundLeiterplattenprüfwerkzeug
公开(公告)号：EP2811304A1
公开(公告)日：2014-12-10
申请号：EP14170256.3
申请日：2014-05-28
申请人： Nidec-Read Corporation
发明人： Matsuoka, Shinji
IPC分类号： G01R1/067 , G01R31/28
CPC分类号： G01R31/2887 , G01R1/06705 , G01R31/2808 , G01R31/2812
摘要： There is provided a circuit board inspection tool configured to electrically connect a circuit board with a built-in electronic component and a circuit board inspection apparatus configured to inspect a plurality of wiring patterns formed on the circuit board, said circuit board inspection tool provided with: a plurality of contactors, one ends of which abut on inspection points on the wiring patterns; an electrode body having electrode units on which the respective contactors abut at the other end and which are electrically connected to the circuit board inspection apparatus; and a holding body having an inspection-side holding unit configured to guide one ends of the contactors to the inspection points and an electrode-side holding unit configured to guide the other ends of the contactors to the electrode units; wherein an amount of projection of a contactor which abuts on an inspection point of a wiring pattern conductively connected to the electronic component is formed to be greater than an amount of projection of the other contactors.
摘要翻译：提供了一种电路板检查工具，其被配置为将电路板与内置电子部件电连接，以及电路板检查装置，被配置为检查形成在电路板上的多个布线图案，所述电路板检查工具具有：多个接触器，其一端邻接布线图案上的检查点; 具有电极单元的电极体，各个接触器在另一端抵接并与电路板检查装置电连接; 以及保持体，具有被配置为将所述接触器的一端引导到所述检查点的检查侧保持单元以及被配置为将所述接触器的另一端引导到所述电极单元的电极侧保持单元; 其特征在于，形成与所述电子部件导电连接的布线图形的检查点相邻的接触器的突出量大于其他接触器的投影量。

38. 发明授权

EP1233275B2 Circuit board testing apparatus and method 有权
标题翻译：装置和方法用于测试电路板
公开(公告)号：EP1233275B2
公开(公告)日：2009-12-09
申请号：EP02003210.8
申请日：2002-02-19
申请人： Nihon Densan Read Kabushiki Kaisha, (Nidec-Read Corporation)
发明人： Tsuji, Yoshio, Nihon Densan Read Kabushiki Kaisha , Yamada, Masayoshi
IPC分类号： G01R31/28 , G01R31/308
CPC分类号： G01R31/2805 , G01R31/309

39. 发明公开

EP1233275A3 Circuit board testing apparatus and method 有权
标题翻译：装置和方法用于测试印刷电路板的
公开(公告)号：EP1233275A3
公开(公告)日：2004-03-31
申请号：EP02003210.8
申请日：2002-02-19
申请人： Nihon Densan Read Kabushiki Kaisha, (Nidec-Read Corporation)
发明人： Tsuji, Yoshio, Nihon Densan Read Kabushiki Kaisha , Yamada, Masayoshi
IPC分类号： G01R31/28 , G01R31/308
CPC分类号： G01R31/2805 , G01R31/309
摘要： A circuit board testing apparatus for testing continuity and/or short-circuit of wirings formed on a circuit board, includes an electromagnetic wave irradiator which irradiates first terminals of the wirings with an electromagnetic wave so that electrons are discharged from the first terminals by photoelectric effect. Discharged electrons are trapped by an electrode which is electrically biased to have a higher potential than that of the second terminals of the wirings, thereby causing an electric current to flow through the wirings via the electrode. Existence of open-circuit and/or short-circuit of the wirings is judged based on the current flowing the wirings.

40. 发明授权

EP0862062B1 Circuit board inspection apparatus and method 失效
标题翻译：用于测试电路板的方法和装置
公开(公告)号：EP0862062B1
公开(公告)日：2002-11-13
申请号：EP98103455.6
申请日：1998-02-27
申请人： Nidec-Read Corporation
发明人： Takahashi, Tadashi
IPC分类号： G01R31/312 , G01R31/28
CPC分类号： H05K1/0268 , G01R31/312

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