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21. 发明公开

EP1540305A1 METHOD AND APPARATUS FOR PUMPING AND DILUTING A SAMPLE 审中-公开
标题翻译：方法和装置泵和薄样品
公开(公告)号：EP1540305A1
公开(公告)日：2005-06-15
申请号：EP03787896.4
申请日：2003-08-14
申请人： THERMO ELECTRON CORPORATION
发明人： Shaw, Philip Neil , Marriott, Philip
IPC分类号： G01N1/38 , G01N1/00 , G01N35/08
CPC分类号： G01N35/1097 , G01N1/38 , G01N35/08
摘要： A pumping apparatus (50) which isolates a sample (52) from a pump (72), thereby circumventing the so-called “memory effect” problem. The sample is pumped into an intermediary, or buffer region (64) using a first pump (54). The sample is displaced from this buffer region by pumping a second fluid (74) into the buffer region using second pump (72). When the sample is displaced from the buffer region it proceeds to a mixer (78) where it can be diluted before analysis. The second pump is required to operate with a high degree of accuracy so that the sample is diluted by a consistent amount. Preferably, the second pump is a highly accurate piston pump.

22. 发明公开

EP1357578A2 Spectroscopic analyser for surface analysis, and method therefor 审中-公开
标题翻译： SpektroskopischeOberflächenanalysevorrichtungund Verfahren
公开(公告)号：EP1357578A2
公开(公告)日：2003-10-29
申请号：EP03252540.4
申请日：2003-04-23
申请人： THERMO ELECTRON CORPORATION
发明人： Bryan, Robert Barnard
IPC分类号： H01J49/40
CPC分类号： H01J49/40
摘要： A spectroscopic analyser and method of use, for surface analysis spectroscopy, are disclosed. The spectroscopic analyser 10 has a time-of-flight (TOF) spectrometer which analyses secondary electrons emitted from a surface of a sample 30 on excitation by an irradiation source 40. The TOF spectrometer includes a gate 50, which receives and selectively passes a proportion of the secondary electrons by pulsed deflection or retardation of the electron beam using gating members 55. In that manner one or more pulses of electrons enter a magnetic field-free flight tube 90 and reach a detector 120 downstream of the gate 50. The flight times, and therefore energies, of the detected electrons through the flight tube 90 are thereby detected. A curved electron mirror 100 may be used to increase the flight path of the pulsed electrons in the flight tube 90, thereby increasing the spread of each electron pulse within the analyser 10.
摘要翻译：公开了用于表面分析光谱的光谱分析仪和使用方法。光谱分析仪10具有飞行时间（TOF）光谱仪，其分析由照射源40激发时从样品30的表面发射的二次电子。TOF光谱仪包括门50，其接收并选择性地通过比例的二次电子通过脉冲偏转或使用选通构件55延迟电子束。以这种方式，一个或多个电子脉冲进入无磁场飞行管90并到达门50下游的检测器120.飞行时间，因此检测到通过飞行管90检测到的电子的能量。可以使用弯曲电子反射镜100来增加飞行管90中的脉冲电子的飞行路径，从而增加分析器10内的每个电子脉冲的扩展。

23. 发明公开

EP0109290A3 Dewatering system with adjustable width suction slot 失效
标题翻译：具有可调节宽度吸收槽的排水系统
公开(公告)号：EP0109290A3
公开(公告)日：1985-05-15
申请号：EP83306919
申请日：1983-11-11
申请人： THERMO ELECTRON CORPORATION
发明人： Goodnow, Ronald F.
IPC分类号： D21F01/52
CPC分类号： D21F1/523
摘要： @ A suction dewatering system for a paper making machine has a suction device (10) with an opening (12) extending longitudinally in a direction transverse to the path (P) of material travel through the machine. Elongated wear strips (20a, 20b) are supported on opposite sides of the opening (12) to define a suction slot (22) therebetween. A guide channel (26) extends longitudinally through at least one of the wear strips (20a, 20b) in a direction parallel to the suction slot (22). An adjusting plate (38) is shiftable longitudinally within the or each guide channel (26). Oblique cam slots (40) in the or each adjusting plate (38) coact with fixed guide members (34) to laterally adjust the position of the one wear strip (20a or 20b) relative to the other wear strip (20b or 20a) thereby to vary the width of the suction slot.

24. 发明公开

EP1877770A2 METHOD AND APPARATUS FOR MONITORING MERCURY IN A GAS SAMPLE 有权转让
标题翻译：方法和设备汞在气体抽样监测
公开(公告)号：EP1877770A2
公开(公告)日：2008-01-16
申请号：EP06752007.2
申请日：2006-05-02
申请人： Thermo Electron Corporation , Grassi, James H.
发明人： SOCHA, Jeffrey , KITA, Dieter , APPEL, Dirk
IPC分类号： G01N31/00
CPC分类号： B01D53/64 , B01D53/30 , B01D53/346 , B01D2257/602 , C22B7/001 , C22B7/02 , C22B43/00 , G01N33/0013 , G01N33/0045 , G01N33/203 , Y02P10/214
摘要： A calibration assembly generates elemental mercury and oxidized mercury for calibrating components of a mercury monitoring system, including making necessary adjustments to efficiencies of a mercury compound converter and an elemental mercury detector. The calibrator generates an elemental mercury sample having a known elemental mercury concentration, [Hg 0 ] 1 and combines an oxidizing component with the elemental mercury sample, thereby producing a reduced concentration of elemental mercury [Hg 0 ] 2 within the sample. The calibrator measures the concentration of elemental mercury [Hg 0 ] 2 within the sample and calculates a difference between the known elemental mercury concentration, [Hg 0 ] 1 and the reduced concentration [Hg 0 ] 2 . The difference between [Hg 0 ] 1 and [Hg 0 ] 2 is substantially equal to the concentration of oxidized mercury produced by the calibrator. The concentration of oxidized mercury can also be calculated as the difference between elemental mercury detected after passing a sample stream containing oxidized mercury through a channel which includes the converter and the reduced concentration [Hg 0 ] 2 detected after passing the sample stream through a channel which bypasses the converter. By providing oxidized mercury at calculated concentrations, the calibrator allows a user to calibrate continuous emission monitoring systems for accurate response to both elemental mercury and oxidized mercury.

25. 发明公开

EP1683180A2 CARBON NANOTUBE ELECTRON IONIZATION SOURCES 有权
标题翻译：碳纳米管电子电离源
公开(公告)号：EP1683180A2
公开(公告)日：2006-07-26
申请号：EP04810933.4
申请日：2004-11-12
申请人： THERMO ELECTRON CORPORATION
发明人： TRAYNOR, Peter J. , WRIGHT, Robert G.
IPC分类号： H01J49/14
CPC分类号： H01J49/147 , B82Y10/00 , B82Y30/00 , H01J2201/30434 , Y10S977/939
摘要： An ion source for use in a mass spectrometer includes an electron emitter assembly (30) configured to emit electron beams, wherein the electron emitter assembly comprises carbon nanotube bundles fixed to a substrate for emitting the electron beams, a first control grid configured to control emission of the electron beams, and a second control grid configured to control energies of the electron beams; an ionization chamber (34) having an electron-beam inlet (38) to allow the electron beams to enter the ionization chamber, a sample inlet for sample introduction, and an ion-beam outlet (29) to provide an exit for ionized sample molecules; an electron lens (31) disposed between the electron emitter assembly and the ionization chamber to focus the electron beams; and at least one electrode (37) disposed proximate the ion-beam outlet to focus the ionized sample molecules exiting the ionization chamber.
摘要翻译：用于质谱仪的离子源包括配置成发射电子束的电子发射器组件（30），其中电子发射器组件包括固定到衬底以发射电子束的碳纳米管束，第一控制栅格，配置成控制发射以及配置成控制电子束的能量的第二控制栅格; 具有允许电子束进入电离室的电子束入口（38）的离子化室（34），用于样品引入的样品入口和离子束出口（29），以提供离子化样品分子的出口 ; 设置在电子发射器组件和电离室之间以聚焦电子束的电子透镜（31）和靠近离子束出口设置的至少一个电极（37），以聚焦离开电离室的离子化样品分子。

26. 发明公开

EP0109290A2 Dewatering system with adjustable width suction slot 失效
标题翻译：系统用于排出具有可调宽度的抽吸间隙。
公开(公告)号：EP0109290A2
公开(公告)日：1984-05-23
申请号：EP83306919.8
申请日：1983-11-11
申请人： THERMO ELECTRON CORPORATION
发明人： Goodnow, Ronald F.
IPC分类号： D21F1/52
CPC分类号： D21F1/523
摘要： @ A suction dewatering system for a paper making machine has a suction device (10) with an opening (12) extending longitudinally in a direction transverse to the path (P) of material travel through the machine. Elongated wear strips (20a, 20b) are supported on opposite sides of the opening (12) to define a suction slot (22) therebetween. A guide channel (26) extends longitudinally through at least one of the wear strips (20a, 20b) in a direction parallel to the suction slot (22). An adjusting plate (38) is shiftable longitudinally within the or each guide channel (26). Oblique cam slots (40) in the or each adjusting plate (38) coact with fixed guide members (34) to laterally adjust the position of the one wear strip (20a or 20b) relative to the other wear strip (20b or 20a) thereby to vary the width of the suction slot.

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