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11. 发明公开

EP3425745A1 CONTACT TERMINAL, INSPECTION JIG, AND INSPECTION APPARATUS 有权
公开(公告)号：EP3425745A1
公开(公告)日：2019-01-09
申请号：EP18181358.5
申请日：2018-07-03
申请人： Nidec-Read Corporation
发明人： OTA, Norihiro
IPC分类号： H01R13/24
摘要： A contact terminal includes a tubular body Pa being tubular, and made of an electrically conductive material; and first and second central conductors Pb and Pc each of which is made of an electrically conductive material, and is in the shape of a stick. The first and second central conductors Pb and Pc include first and second stick-shaped bodies Pb1 and Pc1, first and second clasped portions Pb2 and Pc2 each of which is configured to have a diameter greater than that of each of the first and second stick-shaped bodies Pb1 and Pc1, and first and second swell portions Pb6 and Pc6 each of which is configured to have a diameter greater than that of each of the first and second stick-shaped bodies Pb1 and Pc1. The first and second central conductors Pb and Pc are arranged to have a distal end portion of each of the first and second swell portions Pb6 and Pc6 inserted into a joining portion Pf of the tubular body Pa, and to have a distal end surface of the first swell portion Pb6 and a distal end surface of the second swell portion Pc6 kept opposite to each other with a gap therebetween.

12. 发明公开

EP2871483A1 Inspection jig 审中-公开
标题翻译： Prüfvorrichtung
公开(公告)号：EP2871483A1
公开(公告)日：2015-05-13
申请号：EP14190845.9
申请日：2014-10-29
申请人： Nidec-Read Corporation
发明人： Ota, Norihiro , Tokimasa, Mitsunobu , Hirobe, Kosuke , Tsumara, Kohei
IPC分类号： G01R1/073 , G01R31/28 , G01R31/3185
CPC分类号： G01R31/2808 , G01R1/07357 , G01R31/2801 , G01R31/2886
摘要： An inspection jig (1) is provided with: a frame (40); an electrode body (6) provided with electrodes (7); conductive contactors (5) having a wire shape; a support block (100) having a facing surface (2a) opposite to which an inspection circuit board (A) is disposed, guiding one ends of the contactors (5) to the inspection points of the inspection circuit board (A) mounted on the facing surface (2a), guiding other ends of the contactors (5) to the electrodes (7), and configured to move relatively to the frame (40) in a moving direction which crosses the facing surface (2a); biasing parts (14) configured to bias the support block (100) in a direction moving away from the electrode body (6) and close to the inspection circuit board (A); and a regulating plate (9) disposed between the support block (100) and the frame (40) so as to extend in an extending direction directed from the support block (100) to the frame (40), having elasticity, and having regulation of deformation in a first direction which is parallel to the facing surface (2a) and which crosses the extending direction.
摘要翻译：检查夹具（1）设有：框架（40）; 设置有电极（7）的电极体（6）; 具有线形的导电接触器（5）具有与所述检查电路板（A）相对的对置面（2a）的支撑块（100），其将所述接触器（5）的一端引导到安装在所述检查电路基板（A）的检查点将所述接触器（5）的另一端引导到所述电极（7），并且被构造成在与所述相对表面（2a）相交的移动方向上相对于所述框架（40）移动; 偏压部件（14）构造成在远离电极体（6）并靠近检查电路板（A）的方向上偏压支撑块（100）; 以及设置在所述支撑块（100）和所述框架（40）之间的调节板（9），以沿着从所述支撑块（100）指向框架（40）的延伸方向延伸，具有弹性，并且具有调节在与所述相对表面（2a）平行并且与所述延伸方向交叉的第一方向上的变形。

13. 发明授权

EP1233275B1 Circuit board testing apparatus and method 有权
标题翻译：装置和方法用于测试电路板
公开(公告)号：EP1233275B1
公开(公告)日：2006-06-21
申请号：EP02003210.8
申请日：2002-02-19
申请人： Nihon Densan Read Kabushiki Kaisha, (Nidec-Read Corporation)
发明人： Tsuji, Yoshio, Nihon Densan Read Kabushiki Kaisha , Yamada, Masayoshi
IPC分类号： G01R31/28 , G01R31/308
CPC分类号： G01R31/2805 , G01R31/309

14. 发明公开

EP1055930A3 Printed circuit board testing apparatus and probe device for use in the same 审中-公开
标题翻译：一种用于测试印刷电路板和探针的使用在这种设备中
公开(公告)号：EP1055930A3
公开(公告)日：2003-10-15
申请号：EP00110969.3
申请日：2000-05-26
申请人： Nihon Densan Read Kabushiki Kaisha, (Nidec-Read Corporation)
发明人： Nishikawa, Hideo, Nihon Densan Read K.K.
IPC分类号： G01R1/067
CPC分类号： G01R1/0675 , G01R1/06705 , G01R1/06738
摘要： A probe device is mounted on a circuit provided with a holder mountable to a circuit board testing apparatus, a contact needle attachable to the holder. The contact needle is operable to resiliently bend in a specified direction immediately after coming into contact with a circuit board. The bending absorbs a contact impact to ensure accurate measurement.
摘要翻译：的测试装置被安装在设置有安装到电路板的测试设备，接触针附连到保持器的保持器的电路上。该接触针可操作以在指定的方向上弹性弯曲进入与电路板接触后立即。弯曲吸收接触影响，以确保精确的测量。

15. 发明授权

EP0862061B1 Circuit board inspection apparatus and method 失效
标题翻译：用于测试电路板的方法和装置
公开(公告)号：EP0862061B1
公开(公告)日：2003-01-15
申请号：EP98103453.1
申请日：1998-02-27
申请人： Nidec-Read Corporation
发明人： Yamashita, Munehiro
IPC分类号： G01R31/312 , G01R31/28
CPC分类号： G01R31/2805 , G01R31/2812 , G01R31/312 , H05K1/0266 , H05K1/11

16. 发明公开

EP0884596A3 Circuit board misalignment detection apparatus and method 失效
标题翻译：装置和方法，用于检测对准误差电路板
公开(公告)号：EP0884596A3
公开(公告)日：1999-12-22
申请号：EP98108722.4
申请日：1998-05-13
申请人： Nidec-Read Corporation
发明人： Nishikawa, Hideo
IPC分类号： G01R1/073 , G01R31/312
CPC分类号： G01R1/06794 , G01R31/2805 , G01R31/2887
摘要： [Object] To detect the misalignment of a printed circuit board for which a continuity test is conducted, in a non-contact manner using a simple structure. [Constitution] Position detection electrodes S1 and S2 are disposed so as to be point-symmetrical relative to an arbitrary point px on a line Lx that extends almost along the center of a printed pattern 34a on an opposite circuit board and that is parallel with the Y axis. Position detection electrodes S3 and S4 are disposed in the same manner. A probe selection switch section SW11 can provide a probe selection signal, and a position detection sensor selection switch section SW12 can provide a signal for selecting among the position detection electrodes S1 to S4. A detected voltage varies depending on how the position detection electrode S1 is opposed to a printed pattern 34a. Thus, misalignment can be detected by detecting the opposition relationship between each of the position detection electrodes S1 to S4 and the printed pattern 34a.

17. 发明公开

EP3401470A1 DOOR-USE IRIS AUTHENTICATION DEVICE, AND IRIS AUTHENTICATION SYSTEM 审中-公开
公开(公告)号：EP3401470A1
公开(公告)日：2018-11-14
申请号：EP16883794.6
申请日：2016-12-21
申请人： Nidec-Read Corporation
发明人： KUSUDA Tatsufumi
IPC分类号： E05B49/00 , E05B47/00 , E05B57/00 , G06T7/00
CPC分类号： E05B47/00 , E05B49/00 , E05B57/00 , G06T7/00
摘要： [Problem] To provide an door-use iris authentication device that is easy to install and an iris authentication system.
[Solution] A door-use iris authentication device configured to be attachable to a door to unlock the door, the door-use iris authentication device includes: an unlocking mechanism that unlocks the door to which the door-use iris authentication device is attached; an imaging unit that captures an image; an authentication unit that performs iris authentication based on the image captured by the imaging unit and unlocks the door using the unlocking mechanism when the iris authentication is successfully performed; and a housing that integrally accommodates the unlocking mechanism, the imaging unit, and the authentication unit.

18. 发明公开

EP2921868A1 APPARATUS FOR INSPECTING VERTICALLY ALIGNED FLEXIBLE CIRCUIT BOARDS 审中-公开
标题翻译： VORRICHTUNG ZUR INSPEKTION FLEXIBLER LEITERPLATTEN IN VERTIKALER ANORDNUNG
公开(公告)号：EP2921868A1
公开(公告)日：2015-09-23
申请号：EP15159319.1
申请日：2015-03-17
申请人： Nidec-Read Corporation
发明人： Nakagawa, Takashi , Matsukawa, Toshihide , Hikita, Osamu , Kaida, Michio
IPC分类号： G01R31/28 , H05K3/00 , H05K13/00 , H05K13/08 , G01N21/956
CPC分类号： G01R31/2808 , G01N2021/95638 , G01R1/06794 , G01R31/2805 , H05K3/0008 , H05K2203/1545 , H05K2203/162
摘要： A flexible circuit board inspecting apparatus (10) for conducting an inspection on a flexible circuit board (11) includes a transport path (23) and an inspection part mechanism (30). The transport path (23) is configured to successively transport the flexible circuit board (11) having a plurality of unit circuit boards (12) arranged thereon. The inspection part mechanism (30) is configured to bring and distance a jig (33, 34) for inspecting the flexible circuit board (11) transported on the transport path (23) close to and from the flexible circuit board (11). The transport path (23) includes a longitudinal transport portion (23a) for transporting the flexible circuit board (11) in a downward vertical direction. The inspection part mechanism (30) moves the jig (33, 34) in a direction perpendicular to the flexible circuit board (11) transported on the longitudinal transport portion (23a) to bring and distance the jig (33, 34) close to and from the flexible circuit board (11).
摘要翻译：用于在柔性电路板（11）上进行检查的柔性电路板检查装置（10）包括传送路径（23）和检查部分机构（30）。传送路径（23）被配置为连续地传送具有布置在其上的多个单元电路板（12）的柔性电路板（11）。检查部机构30构成为使用于检查在靠近柔性电路基板11的输送路径23上运送的柔性电路基板11的夹具33,34）。传送路径23包括用于在向下垂直方向上传送柔性电路板11的纵向传送部分23a。检查部机构30使夹具（33,34）沿与纵向传送部（23a）上传送的柔性电路板（11）垂直的方向移动，使夹具（33,34）靠近和从柔性电路板（11）。

19. 发明公开

EP2899635A1 Touch panel inspecting apparatus 审中-公开
标题翻译： Berührungstafelinspektionsvorrichtung
公开(公告)号：EP2899635A1
公开(公告)日：2015-07-29
申请号：EP15152485.7
申请日：2015-01-26
申请人： Nidec-Read Corporation
发明人： Sakamoto, Koji , Matsukawa, Toshihide , Iwami, Koji , Fujita, Shigeki , Hikita, Osamu
IPC分类号： G06F11/22
CPC分类号： G06F3/044 , G06F3/03545 , G06F3/0414 , G06F11/2221
摘要： A touch panel inspecting apparatus (1) includes a workpiece holder (52), at least one pseudo finger (21), an X-Y movement mechanism, a memory part (17), an electric pneumatic regulator (42, 43), and a panel signal acquiring part (19). The workpiece holder (52) allows a touch panel (100), which is an inspection target, to be set thereon. The at least one pseudo finger (21) is contactable with the touch panel (100) set on the workpiece holder (52). The X-Y movement mechanism moves the at least one pseudo finger (21) relative to the touch panel (100). The memory part (17) stores therein a set value of pressing force of the at least one pseudo finger (21), in a changeable manner. The electric pneumatic regulator (42, 43) regulates the pressing force to bring the at least one pseudo finger (21) into contact with the touch panel (100), based on the set value stored in the memory part (17). The panel signal acquiring part (19) acquires an electric signal output from the touch panel (100).
摘要翻译：触摸屏检查装置（1）包括工件保持器（52），至少一个伪手指（21），XY移动机构，存储部分（17），电动气动调节器（42,43）和面板信号获取部（19）。工件保持器（52）允许将作为检查对象的触摸面板（100）设置在其上。所述至少一个伪手指（21）可与设置在所述工件保持器（52）上的触摸面板（100）接触。 X-Y移动机构相对于触摸面板（100）移动至少一个伪手指（21）。存储部（17）以可变方式存储至少一个伪指（21）的按压力的设定值。电动气动调节器（42,43）基于存储在存储器部分（17）中的设定值来调节按压力使至少一个伪手指（21）与触摸面板（100）接触。面板信号获取部（19）取得从触摸面板（100）输出的电信号。

20. 发明公开

EP2852271A1 Contact apparatus 审中-公开
标题翻译：接触装置
公开(公告)号：EP2852271A1
公开(公告)日：2015-03-25
申请号：EP14185058.6
申请日：2014-09-17
申请人： Nidec-Read Corporation
发明人： Nakagawa, Takashi , Matsukawa, Toshihide
IPC分类号： H05K13/04 , H01L21/67
CPC分类号： B25B28/00 , H01L21/67132 , H01L21/67138 , H01L21/67144 , H01L24/01
摘要： A contact head unit (11) provided in a contact apparatus (1) is provided with a contact rod (21), a housing (22), a thrust air passage (32), and a cancel air passage (33). The housing (22) supports the contact rod (21) linearly movably by a static pressure air bearing, which allows the contact rod (21) to be brought into contact with an object (3). If a compressed air is supplied to the thrust air passage (32), a force in a direction of approaching the object (3) acts on the contact rod (21). If the compressed air is supplied to the cancel air passage (33), a force in an opposite direction acts on the contact rod (21). A control unit (12) sets applied pressure on the object (3) by controlling the pressure of the compressed air of the thrust air passage (32) and the pressure of the compressed air of the cancel air passage (33) while the contact rod (21) is in contact with the object (3).
摘要翻译：设置在接触装置（1）中的接触头单元（11）设置有接触杆（21），壳体（22），推力空气通道（32）和取消空气通道（33）。壳体（22）通过静压空气轴承可线性移动地支撑接触杆（21），该静压空气轴承允许接触杆（21）与物体（3）接触。如果压缩空气供应到推力空气通道（32），则沿接近物体（3）的方向的力作用在接触杆（21）上。如果压缩空气供应到取消空气通道（33），则沿相反方向的力作用在接触杆（21）上。控制单元（12）通过控制推进空气通道（32）的压缩空气的压力和取消空气通道（33）的压缩空气的压力来设定物体（3）上的施加压力，同时接触杆（21）与物体（3）接触。

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