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    • 128. 发明公开
    • Polarization controlled interferometric chirp characterization
    • Polarisationsgesteuerte interferometrische Chirp-Charakterisierung
    • EP1962069A1
    • 2008-08-27
    • EP07102961.5
    • 2007-02-23
    • Agilent Technologies, Inc.
    • Maestle, Ruediger
    • G01J11/00G01M11/00
    • H01S5/0014
    • The invention relates to determining a chirp property (chirp(t)) of an optical device (1), comprising: receiving an input optical signal (S1) from the optical device (1) and generating an output optical signal (S4) by providing a change of a state of polarization by means of a polarization controller operating at a first setting and an interferometric superposition of two signal parts in any order, determining an optical intensity (PA(t), PB(t), PC(t) P out.1 (t), P out.2 (t), P out.3 (t), P out.4 (t)) of the output optical signal (S4), controlling the polarization controller (21) to operate at a second setting in order to provide a different change of the state of polarization and repeating previous steps for determining a corresponding optical intensity, and determining the chirp property by evaluating the optical intensities (PA(t), PB(t), PC(t) P out.1 (t), P out.2 (t), P out.3 (t), P out.4 (t)) determined in response to the different polarization controller settings.
    • 本发明涉及确定光学装置(1)的啁啾特性(啁啾(t)),包括:从光学装置(1)接收输入光信号(S1)并通过提供输出光信号(S4)产生输出光信号 确定光强度(PA(t),PB(t),PC(t)P),通过在第一设置操作的偏振控制器和两个信号部分的干涉叠加以任何顺序改变偏振状态 输出光信号(S4)的输出1(t),P out.2(t),P out.3(t),P out.4(t)),控制偏振控制器(21) 第二设置,以便提供极化状态的不同改变并重复用于确定相应光强度的先前步骤,以及通过评估光强度(PA(t),PB(t),PC(t))来确定啁啾特性 )P out.1(t),P out.2(t),P out.3(t),P out.4(t))。
    • 130. 发明公开
    • System and method for security inspection using microwave imaging
    • 系统和Verfahren zurSicherheitsüberprüfung手套Mikrowellenbildgebung
    • EP1662275A3
    • 2008-07-16
    • EP05257070.2
    • 2005-11-16
    • Agilent Technologies, Inc.
    • Baharav, IzhakTaber, RobertLee, Gregory StevenKofol, John Stephan
    • G01V8/00
    • H01Q1/2216G01S13/887G01S13/89G01V8/005H01Q1/22H01Q21/065
    • A security inspection system (10) uses microwave radiation to image targets (420) on a human subject (30) or other item. The system includes an array of antenna elements (200) that are programmable with a respective phase delay to direct a beam of microwave illumination toward a target (420) on the human subject (30) or item. The antenna elements (200) are further capable of receiving reflected microwave illumination reflected from the target (420). A processor (100) is operable to measure an intensity of the reflected microwave illumination to determine a value of a pixel within an image of the human subject (30) or item. Multiple beams can be directed towards the human subject or item to obtain corresponding pixel values for use by the processor (100) in constructing the image.
    • 安全检查系统(10)使用微波辐射来对人类对象(30)或其他物品上的目标(420)进行成像。 该系统包括天线元件阵列(200),其可用相应的相位延迟来编程,以将微波照射束引向人体对象(30)或物体上的目标(420)。 天线元件(200)还能够接收从目标(420)反射的反射的微波照射。 处理器(100)可操作以测量反射的微波照明的强度,以确定人体对象(30)或物体的图像内的像素的值。 多个光束可以被引向人体对象或物体以获得相应的像素值,以供处理器(100)在构建图像时使用。