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    • 3. 发明公开
    • UNNEVENNESS LEVEL INSPECTING DEVICE, UNEVENNESS LEVEL INSPECTING METHOD, AND PROGRAM
    • EP4159379A1
    • 2023-04-05
    • EP22198451.1
    • 2022-09-28
    • TOPCON CORPORATION
    • KIKUCHI, Takeshi
    • B25H7/04G01C1/00G01C3/00G01C5/00G01C15/00
    • Provided is a technology to generate unevenness level display data that enables intuitive and visual recognition of an unevenness level inspection result. An unevenness level inspecting device 1 includes a target T at a known distance from a to-be-inspected surface, a traveling unit 21 for traveling on the to-be-inspected surface, a communication unit 29 capable of making communication with a surveying instrument 6 configured to measure three-dimensional position coordinates of the target T at predetermined intervals, and a control unit 10 configured to calculate a height of the to-be-inspected surface corresponding to a measurement position of the target T based on the three-dimensional position coordinates of the target T, the control unit 10 calculates a height of the to-be-inspected surface corresponding to a measurement position of the target T measured each time the unevenness level inspecting device 1 travels a predetermined distance based on the three-dimensional position coordinates of the target T, and generates display data for displaying unevenness level information associating a difference between the height of the to-be-inspected surface and a reference height with inspecting device position coordinates in a manner that the unevenness level information is superimposed on a site design drawing.
    • 5. 发明公开
    • INFORMATION PROCESSING SYSTEM, METHOD, AND PROGRAM
    • EP3978869A1
    • 2022-04-06
    • EP20814580.5
    • 2020-04-22
    • FURUNO ELECTRIC CO., LTD.
    • TAKASHIMA, YuyaMINOWA, MasahiroOKUMURA, Shigeaki
    • G01C1/00G01W1/00G06T7/70H04N5/232
    • To provide an information processing device, method and program capable of determining the orientation or slant of a camera while facilitating the installation work of the camera and reducing the number of sensors provided in the camera.
      The imaging processing device includes an image acquisition module 11 configured to acquire an image G1 [ G4 ] obtained by photographing the sky with a camera 10 having a known orientation or slant; a photographing time stamp acquisition module 12 configured to acquire a photographing date and time of the image G1 [ G4 ]; a photographing position acquisition module 13 configured to acquire position information of a photographing position of the image G1 [ G4 ]; a sun position determination module 14 configured to determine a photographed sun position S1 indicating a sun position in the image G1 [G4]; a reference sun position acquisition module 15 configured to calculate a reference sun position B1 indicating a sun position determined based on the photographing date and time and the position information; and a camera information identification module 17 configured to determine any one of unknown orientation and slant of the camera based on any one of the known orientation and slant of the camera 10, the photographed sun position S1 , and the reference sun position B1.