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1. 发明公开

EP1684275A3 Near field optical memory head 审中-公开
标题翻译：近场光学记忆头
公开(公告)号：EP1684275A3
公开(公告)日：2007-12-05
申请号：EP06006226.2
申请日：1999-02-22
申请人： Seiko Instruments Inc.
发明人： Kasama, Nobuyuki , Mitsuoka, Yasuyuki , Chiba, Norio , Niwa, Tahashi , Nakajima, Kunio , Oumi, Manabu , Kato, Kenji , Shinogi, Masataka
IPC分类号： G11B7/135
CPC分类号： G11B7/122 , B82Y10/00 , G11B7/12 , G11B7/124 , G11B7/1387 , G11B7/22 , Y10S977/862
摘要： A near-field optical memory head for recording and/or reproducing information of a recording medium by utilizing near-field light
wherein near-field light forming means having a very small aperture portion (54) for forming near-field light on the recording medium and near-field light detecting means (56) for detecting the formed near-field light are provided on a same substrate (52) and the substrate is constituted to project from a substrate at an outer peripheral portion.
摘要翻译：一种利用近场光记录和/或再现记录介质信息的近场光存储头，其中近场光形成装置具有非常小的孔径部分（54），用于在记录介质上形成近场光和用于检测所形成的近场光的近场光检测装置（56）设置在同一基板（52）上，并且基板被构造成在外周部分从基板突出。

2. 发明公开

EP0617431A2 X-ray analysing apparatus 失效
标题翻译： X射线分析装置
公开(公告)号：EP0617431A2
公开(公告)日：1994-09-28
申请号：EP94302171.7
申请日：1994-03-25
申请人： SEIKO INSTRUMENTS INC.
发明人： Sudo, Shuzo , Nakajima, Kunio
IPC分类号： G21K4/00 , C09K11/84
CPC分类号： C09K11/7771 , C09K11/7769 , G21K4/00 , G21K2004/06
摘要： The present invention provides an X-ray analysing apparatus having high sensitivity and high position resolving power in which an X-ray fluorescent screen (48) including Gd₂O₂S : Tb as a material and having a surface density ranging from 5 mg/cm² to 30 mg/cm² is used, and an image intensifier (50) and a charge coupled device (CCD) (52) are combined to construct an X-ray diffraction two-dimensional detector; and also an image intensifier tube and the CCD are combined with a tapered fibre plate (49), and an alignment section of the mirror mount tube and a vacuum flexible tube are separated by an X-ray window into the atmosphere and the vacuum.
摘要翻译：本发明提供一种具有高灵敏度和高位置分辨能力的X射线分析设备，其中包括Gd 2 O 2 :Tb作为材料并具有5mg / cm 2至30mg表面密度范围的X射线荧光屏（48） / cm2，图像增强器（50）和电荷耦合器件（CCD）（52）组合构成X射线衍射二维检测器; 并且图像增强管和CCD与锥形纤维板（49）组合，并且镜像安装管和真空柔性管的对齐部分通过X射线窗口分隔成大气和真空。

3. 发明授权

EP0296737B1 X-ray radiation sensor 失效
标题翻译： X射线辐射传感器
公开(公告)号：EP0296737B1
公开(公告)日：1991-12-18
申请号：EP88305271.4
申请日：1988-06-09
申请人： SEIKO INSTRUMENTS INC.
发明人： Suzuki, Hiroyuki , Tamura, Kouichi , Sato, Tadashi , Nakajima, Kunio
IPC分类号： G01T1/00 , G01T1/20
CPC分类号： G01T1/2002 , G01T1/2018

4. 发明公开

EP1942501A1 Distance control in optical near-field recording/reproducing apparatus 审中-公开
标题翻译： Kontrolle des Abstands in Nahfeld- Aufzeichnungs- und Wiedergabe-Gerät
公开(公告)号：EP1942501A1
公开(公告)日：2008-07-09
申请号：EP08075136.5
申请日：1999-03-12
申请人： Seiko Instruments Inc.
发明人： Kasama, Nobuyuki , Chiba, Norio , Mitsuoka, Yasuyuki , Oumi, Manabu , Kato, Kenji , Niwa, Takashi , Nakajima, Kunio
IPC分类号： G11B7/135 , G11B7/09
CPC分类号： G11B7/0908 , B82Y10/00 , G11B7/127 , G11B7/1275 , G11B7/1387 , Y10S977/862 , Y10S977/947
摘要： The invention concerns a recording apparatus for reproducing information recorded on a recording medium by utilising near-field light. The recording apparatus comprises: an aperture element having two microscopic apertures to scatter near-field light; a light illuminating means for introducing illumination light to the recording medium such that near-field light is created on a surface of the recording medium; a first light detecting means for detecting first propagation light caused by one of the microscopic apertures scattering the near-field light and for converting the detected first propagation light into a reproduced signal the reproduced signal representative of recorded information; a second light detecting means for detecting second propagation light caused by the other of the microscopic apertures scattering the near-field light, and for converting the detected second propagation light into a control signal, the control signal for use in controlling the spacing between the aperture element and the recording medium; and a control means for controlling a spacing between the aperture element and the recording medium based on the control signal.
摘要翻译：本发明涉及用于通过利用近场光来再现记录在记录介质上的信息的记录装置。记录装置包括：具有两个微小孔径的孔径元件，用于散射近场光; 光照射装置，用于将照明光引入记录介质，使得在记录介质的表面上产生近场光; 第一光检测装置，用于检测散射近场光的微小孔之一引起的第一传播光，并将检测到的第一传播光转换成再现信号，表示记录信息的再现信号; 第二光检测装置，用于检测由另一个微观孔径散射近场光的第二传播光，并将检测到的第二传播光转换成控制信号，该控制信号用于控制孔径之间的间隔元件和记录介质; 以及控制装置，用于根据控制信号控制孔径元件和记录介质之间的间隔。

5. 发明公开

EP0801318A2 Probe, manufacturing method therefore and scanning probe microscope 失效
标题翻译： Abtastvorrichtung，Herstellungsverfahren derselben und Rasterabtastmikroskop
公开(公告)号：EP0801318A2
公开(公告)日：1997-10-15
申请号：EP97103779.1
申请日：1997-03-06
申请人： SEIKO INSTRUMENTS INC.
发明人： Muramatsu, Hiroshi , Yamamoto, Noritaka , Chiba, Norio , Nakajima, Kunio
IPC分类号： G02B21/00
CPC分类号： G01Q60/06 , G01Q60/22 , G01Q60/38 , Y10S385/902 , Y10S977/862 , Y10S977/878
摘要： A tip of a probe is sharpened and a level difference portion 6 in a boundary zone between a base portion 5 and an elastic functioning portion 4 is formed into a tapered configuration. The diameter of the elastic functioning portion 4 is made smaller than that of the base portion 5. Also, a part of the elastic functioning portion 4 is shaped into a constricted configuration. Also, the probe material is an optical fiber and this probe is composed of a core portion 2 that propagates light therethrough and clad portions 3 that differ in refractive index from each other. And the portion of the probe that excludes a aperture is clothed by a metal film cladding 7.
摘要翻译：探针的尖端被磨削，并且基部5和弹性功能部分4之间的边界区域中的水平差异部分6形成为锥形构造。弹性功能部分4的直径被制成小于基部5的直径。此外，弹性功能部分4的一部分成形为收缩构型。此外，探针材料是光纤，该探针由将光透过的芯部2和折射率不同的包层部3构成。并且不包括孔的探针的部分被金属膜包层7覆盖。

6. 发明授权

EP0617431B1 X-ray analysing apparatus 失效
标题翻译： X射线分析装置
公开(公告)号：EP0617431B1
公开(公告)日：1997-05-14
申请号：EP94302171.7
申请日：1994-03-25
申请人： SEIKO INSTRUMENTS INC.
发明人： Sudo, Shuzo , Nakajima, Kunio
IPC分类号： G21K4/00 , C09K11/84
CPC分类号： C09K11/7771 , C09K11/7769 , G21K4/00 , G21K2004/06

7. 发明公开

EP1939871A1 Recording apparatus 审中-公开
标题翻译：在Nahfeld - Aufzeichnungs- und Wiedergabe-Gerät的Kontrolle des Abstands
公开(公告)号：EP1939871A1
公开(公告)日：2008-07-02
申请号：EP08075135.7
申请日：1999-03-12
申请人： Seiko Instruments Inc.
发明人： Kasama, Nobuyuki , Mitsuoka, Yasuyuki , Oumi, Manabu , Kato, Kenji , Niwa, Takashi , Nakajima, Kunio , Chiba, Norio
IPC分类号： G11B7/135 , G11B7/09
CPC分类号： G11B7/0908 , B82Y10/00 , G11B7/127 , G11B7/1275 , G11B7/1387 , Y10S977/862 , Y10S977/947
摘要： The invention concerns a recording apparatus for reproducing information recorded on a recording medium by utilising near-field light. The recording apparatus comprises: an aperture element having a microscopic aperture to scatter near-field light; a light illuminating means for introducing illumination light to the recording medium such that near-field light is created on a surface of the recording medium, the illumination light comprising two different modulation frequencies; a first light detecting means for detecting first propagation light caused by the microscopic aperture scattering the near-field light having one of the two modulation frequencies, and for converting the detected first propagation light into a reproduced signal; a second light detecting means for detecting second propagation light caused by the microscopic aperture scattering the near-field light having the other of the two modulation frequencies, and for converting the detected second propagation light into a control signal; and a control means for controlling a spacing between the aperture element and the recording medium based on the control signal.
摘要翻译：本发明涉及用于通过利用近场光来再现记录在记录介质上的信息的记录装置。记录装置包括：具有微观孔径以散射近场光的孔径元件; 照明装置，用于将照明光引入记录介质，使得在记录介质的表面上产生近场光，所述照明光包括两个不同的调制频率; 第一光检测装置，用于检测由微小孔散射引起的具有两个调制频率之一的近场光的第一传播光，并将检测到的第一传播光转换成再现信号; 第二光检测装置，用于检测由微小孔径散射具有两个调制频率中的另一个的近场光引起的第二传播光，并将检测到的第二传播光转换成控制信号; 以及控制装置，用于根据控制信号控制孔径元件和记录介质之间的间隔。

8. 发明公开

EP1705475A2 Optical waveguide probe and its manufacturing method 有权
标题翻译： Optische Wellenleitersonde und deren Herstellungsverfahren。
公开(公告)号：EP1705475A2
公开(公告)日：2006-09-27
申请号：EP06013102.6
申请日：1998-12-15
申请人： SEIKO INSTRUMENTS INC. , Sato, Kazuo , Shikita, Mitsuhiro
发明人： Sato, Kazuo , Shikita, Mitsuhiro , Kato, Kenji , Shinogi, Masataka , Nakajima, Kunio , Chiba, Norio , Ichihara, Susumu , Niwa, Takashi , Mitsuoka, Yasuyuki , Kasama, Nobuyuki
IPC分类号： G01N13/14 , G01N37/00 , G01B11/30 , G02B21/00 , G01B7/34
CPC分类号： G02B6/132 , G01B11/30 , G01Q60/06 , G01Q60/22 , G01Q60/38 , G02B6/241 , G02B6/262 , Y10S977/862
摘要： The present invention has an object to obtain an optical waveguide probe which is formed in a hook form to illuminate and detect light by a manufacture using a silicon process.
This optical waveguide probe is formed in a hook form and structured by an optical waveguide 1 sharpened at a probe needle portion 5 and formed of dielectric and a substrate 2 supporting this optical waveguide 1. This optical waveguide 1 is formed overlying the substrate 2. The optical waveguide 1 is structured by a core 8 to transmit light and a cladding 9 smaller in refractive index than the core 8.
摘要翻译：本发明的目的是获得一种形成为钩形的光波导探针，以通过使用硅工艺的制造来照亮和检测光。该光波导探针形成为钩形，并由在探针针5上被锐化并由电介质构成的光波导1和支撑该光波导1的基板2构成。该光波导1形成在基板2的上方。光波导1由芯8构成，以透射光和比芯8更小的折射率的包层9。

9. 发明授权

EP0594441B1 Semiconductor device 失效
公开(公告)号：EP0594441B1
公开(公告)日：2002-09-25
申请号：EP93308403.0
申请日：1993-10-21
申请人： SEIKO INSTRUMENTS INC.
发明人： Takahashi, Kunihiro , Suzuki, Mizuaki , Yamazaki, Tsuneo , Takasu, Hiroaki , Nakajima, Kunio , Sakurai, Atsushi , Iwaki, Tadao , Kojima, Yoshikazu , Kamiya, Masaaki
IPC分类号： H01L23/36 , H01L21/76 , H01L27/12 , G02F1/13
CPC分类号： G02F1/13454 , G02F1/133512 , G02F2001/136281 , H01L23/36 , H01L23/367 , H01L27/12 , H01L27/1203 , H01L2924/0002 , H01L2924/3011 , H01L2924/00

10. 发明公开

EP0801318A3 Probe, manufacturing method therefore and scanning probe microscope 失效
标题翻译：扫描装置，扫描探针显微镜及其制造方法
公开(公告)号：EP0801318A3
公开(公告)日：1998-04-01
申请号：EP97103779.1
申请日：1997-03-06
申请人： SEIKO INSTRUMENTS INC.
发明人： Muramatsu, Hiroshi , Yamamoto, Noritaka , Chiba, Norio , Nakajima, Kunio
IPC分类号： G02B21/00
CPC分类号： G01Q60/06 , G01Q60/22 , G01Q60/38 , Y10S385/902 , Y10S977/862 , Y10S977/878
摘要： A tip of a probe is sharpened and a level difference portion 6 in a boundary zone between a base portion 5 and an elastic functioning portion 4 is formed into a tapered configuration. The diameter of the elastic functioning portion 4 is made smaller than that of the base portion 5. Also, a part of the elastic functioning portion 4 is shaped into a constricted configuration. Also, the probe material is an optical fiber and this probe is composed of a core portion 2 that propagates light therethrough and clad portions 3 that differ in refractive index from each other. And the portion of the probe that excludes a aperture is clothed by a metal film cladding 7.

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