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1. 发明公开

CN106208977A 低频低噪声测量放大器无效
公开(公告)号：CN106208977A
公开(公告)日：2016-12-07
申请号：CN201610535557.4
申请日：2016-07-08
申请人：孙祝兵
发明人：孙祝兵 , 高鹏
IPC分类号： H03F1/26 , H03F3/45 , G01R31/26
CPC分类号： H03F1/26 , G01R31/2646 , H03F3/45484
摘要：本发明涉及一种低频低噪声测量放大器，其特征在于：包括噪声匹配变压器、前置级放大电路、带通滤波器和后级放大电路四部分；本发明噪声测量放大器的噪声系数和共模抑制比远大于市场上大部分低频低噪声放大器的数值，并且设计电路满足0.90Hz-80.20kHz范围内对低频噪声测量的要求。

2. 发明公开

CN106841968A 光电耦合器抗辐照能力无损筛选方法及装置无效
公开(公告)号：CN106841968A
公开(公告)日：2017-06-13
申请号：CN201710063087.0
申请日：2017-01-19
申请人：深圳市量为科技有限公司
发明人：石强 , 李兆成
IPC分类号： G01R31/26 , G01R31/265
CPC分类号： G01R31/2601 , G01R31/2646 , G01R31/2656
摘要：本发明提供了一种光电耦合器抗辐照能力无损筛选方法及装置，方法包括：获取作为随机子样的光电耦合器辐照前的电流传输比和1/f噪声幅值；获取作为随机子样的光电耦合器经过辐照后的电流传输比；计算辐照前后的电流传输比变化量；对数据进行预处理，以噪声幅值作为信息参数，以电流传输比变化量作为辐照性能参数，建立多元线性回归方程，并计算线性回归方程中的系数向量；基于系数向量，建立所述信息参数和辐照性能参数之间的无损筛选回归预测方程；利用无损筛选回归预测方程，预测单个光电耦合器件的抗辐照性能，对同批其他光电耦合器器件进行筛选。本发明能够实现在对光电耦合器无损坏的前提下，进行对元器件准确、高效的抗辐照能力的测试筛选。

3. 发明公开

CN106124877A 电子芯片的噪声信息发送方法及系统无效
公开(公告)号：CN106124877A
公开(公告)日：2016-11-16
申请号：CN201610545844.3
申请日：2016-07-12
申请人：张升泽
发明人：张升泽
IPC分类号： G01R29/26 , G01R31/26
CPC分类号： G01R29/26 , G01R31/2646
摘要：本发明提供了一种电子芯片的噪声信息发送方法及系统，所述方法包括如下步骤：获取电子芯片的噪声信息；将该噪声信息进行处理分析；如处理分析该噪声信息非正常，则将该噪声信息发送。本发明提供的技术方案具有噪声信息自动发送的优点。

4. 发明公开

CN106056837A 电子芯片的噪声报警方法及系统无效
公开(公告)号：CN106056837A
公开(公告)日：2016-10-26
申请号：CN201610478523.6
申请日：2016-06-27
申请人：张升泽
发明人：张升泽
IPC分类号： G08B21/00 , G01R31/26
CPC分类号： G08B21/00 , G01R31/2646
摘要：本发明提供了一种电子芯片的噪声报警方法及系统，所述方法包括如下步骤：获取电子芯片的噪声，将该噪声与预先存储的噪声阈值对比，如该噪声高于该噪声阈值，进行报警。本发明提供的技术方案具有噪声自动报警的优点。

5. 发明公开

EP0522614A1 Method of determining an electrical spectrum 失效
标题翻译： Verfahren zum Bestimmen eines elektrischen Spektrums。
公开(公告)号：EP0522614A1
公开(公告)日：1993-01-13
申请号：EP92201674.6
申请日：1992-06-10
申请人： Koninklijke PTT Nederland N.V.
发明人： van den Brink, Robertus Francisus Maria
IPC分类号： G01R31/26
CPC分类号： G01R31/2646
摘要： Method of determining a noise spectrum of an optical receiver comprising a detector and a preamplifier, in which, starting from a standardised light source, the output signal of said light source is presented to the input of the receiver and the equivalent noise spectrum of the optical receiver is compared with and expressed in the electrical response spectrum of the light source. If the light source has also to be standardised beforehand, this is done by comparing the electrical response spectrum of the light source with, and expressing it in, the noise spectrum of a known electrical noise source, for example a resistor.
The method can be used, in particular, if the electrical input of the preamplifier is not accessible from outside, if the optical input of the receiver is accessible only via a glass fibre, if the noise contribution of the receiver is relatively large, if the receiver is very broadband, and if its sensitivity is unknown but also frequency-dependent.
摘要翻译：一种确定包括检测器和前置放大器的光接收机的噪声频谱的方法，其中，从标准化光源开始，将所述光源的输出信号呈现给接收机的输入端，并将光学器件的等效噪声谱接收机与光源的电响应谱进行比较和表达。如果光源也要被预先标准化，则通过将光源的电响应光谱与已知电噪声源（例如电阻器）的噪声谱进行比较来表示。如果接收机的光输入只能通过玻璃光纤访问，则如果接收机的噪声贡献相对较大，则可以使用该方法，如果前置放大器的电输入不能从外部访问，则如果接收机是非常宽带的，如果其灵敏度是未知的，但也是频率依赖的。

6. 发明授权

EP0522614B1 Method of determining an electrical spectrum 失效
标题翻译：确定电光谱的方法
公开(公告)号：EP0522614B1
公开(公告)日：1997-08-06
申请号：EP92201674.6
申请日：1992-06-10
申请人： Koninklijke PTT Nederland N.V.
发明人： van den Brink, Robertus Francisus Maria
IPC分类号： G01R31/26
CPC分类号： G01R31/2646

7. 发明公开

EP3226138A4 DATA ACQUISITION CHIP TEST SYSTEM AND DEVICE AND CONTROL METHOD THEREFOR 有权
公开(公告)号：EP3226138A4
公开(公告)日：2018-03-28
申请号：EP16863197
申请日：2016-07-08
申请人： SHENZHEN GOODIX TECH CO LTD
发明人： QIN WEIHE , GUAN ZHOU , SONG HAIHONG , YANG LIAN
IPC分类号： G06F11/22 , G01R29/26 , G01R31/26 , G01R31/28 , G06K9/00 , H04B1/38
CPC分类号： G01R31/2646 , G01R29/26 , G01R31/2834 , G06K9/00013 , H04B1/38
摘要： A test device of a data collecting chip (10) and control method thereof, and the test device (10) includes: a data collecting module (200) for receiving multiple frames of sampling data sampling data collected by the data collecting chip; a storing module (300) ; a processing module (400) for calculating noise of a plurality of data sampling points to obtain a noise test result; a data transceiving module (500) for uploading the noise test result; and a control module (600) . The test device (10) only uploads the noise test result by calculating the noise of the plurality of data sampling points, so that the efficiency of a chip test is improved, the cost of the chip test is reduced, and the test reliability is ensured better.

8. 发明授权

US12085603B2 Noise monitoring apparatus, noise monitoring system and a noise monitoring method 有权
公开(公告)号：US12085603B2
公开(公告)日：2024-09-10
申请号：US17879752
申请日：2022-08-02
申请人： Taiwan Semiconductor Manufacturing Company, Ltd.
发明人： Chin Yin , Chih-Lin Lee , Kuo-Yu Chou
IPC分类号： G01R31/26
CPC分类号： G01R31/2646 , G01R31/2607
摘要： A noise monitoring apparatus includes a row selection circuit, a direct current (DC) cancellation circuit and an amplifier circuit. The row selection circuit selects a row of a DUT array to be a selected row during a readout period, wherein the selected row comprises a plurality of selected DUTs. The DC cancellation circuit is coupled to unselected DUTs of the DUT array during the readout period, generates a DC current signal based on bias current signals from a group of unselected DUTs and subtract the DC current signal from a first noise signal of the selected DUT to generate a second noise signal. The amplifier circuit is coupled to the plurality of selected DUTs of the selected row during the readout period, and amplifies the second noise signal from each of the selected DUTs to generate an output signal.

9. 发明授权

US11796621B2 Fast convergence method for cross-correlation based modulation quality measurements 有权
公开(公告)号：US11796621B2
公开(公告)日：2023-10-24
申请号：US17524850
申请日：2021-11-12
申请人： NATIONAL INSTRUMENTS CORPORATION
发明人： Sartaj Chaudhary
IPC分类号： G01R35/00 , G01R31/26
CPC分类号： G01R35/005 , G01R31/2646
摘要： Techniques are disclosed related to determining a modulation quality measurement of a device-under-test (DUT). A modulated signal is received from a source a plurality of times, and each received modulated signal is transmitted to each of a first vector signal analyzer (VSA) and a second VSA. The first VSA and the second VSA demodulate the received modulated signals to produce first error vectors and second error vectors, respectively. A cross-correlation calculation is performed on the first error vectors and second error vectors of respective received modulated signals to produce a complex-valued cross-correlation measurement, and a real component of the cross-correlation measurement is averaged over the plurality of received modulated signals. A modulation quality measurement is determined based on the averaged cross-correlation measurement.

10. 发明申请

US20150212131A1 Apparatuses and Methods for Measuring Flicker Noise 有权
标题翻译：用于测量闪烁噪声的装置和方法
公开(公告)号：US20150212131A1
公开(公告)日：2015-07-30
申请号：US14165292
申请日：2014-01-27
申请人： PROPLUS ELECTRONICS CO., LTD.
发明人： Zhihong LIU
IPC分类号： G01R29/26 , H03F3/45 , H03F1/26 , G01R31/26 , G01R1/30
CPC分类号： G01R29/26 , G01R31/2646 , H03F1/0277 , H03F1/52 , H03F3/195 , H03F3/45475 , H03F3/72 , H03F2200/261 , H03F2200/411 , H03F2200/462 , H03F2200/471 , H03F2203/7215 , H03F2203/7221 , H03F2203/7236
摘要： Apparatuses and methods for measuring flicker noise are disclosed. In one embodiment, a noise measurement system may include a first circuit path configured to drive a first terminal of a device under test (DUT) in the noise measurement system, an amplification circuit configured to amplify an output signal of the DUT, a second circuit path configured to drive a second terminal of the DUT, a third circuit path configured to couple a third terminal of the DUT to a circuit ground, and a decoupling circuit configured to decouple the DUT and the amplification circuit, logic configured to detect output signal characteristics of the DUT, logic configured to adjust input impedance of the amplification circuit based on the output signal characteristics of the DUT, and logic configured to measure a flicker noise of the DUT using the amplification circuit with adjusted input impedance.
摘要翻译：公开了用于测量闪烁噪声的装置和方法。在一个实施例中，噪声测量系统可以包括被配置为驱动噪声测量系统中被测器件（DUT）的第一端子的第一电路路径，被配置为放大DUT的输出信号的放大电路，第二电路被配置为驱动DUT的第二端子的路径，被配置为将DUT的第三端子耦合到电路地的第三电路路径，以及被配置为将DUT和放大电路去耦的去耦电路，被配置为检测输出信号特性被配置为基于DUT的输出信号特性来调整放大电路的输入阻抗的逻辑，以及被配置为使用具有调节的输入阻抗的放大电路来测量DUT的闪烁噪声的逻辑。

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