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    • 8. 发明专利
    • ANALYSIS PROCESSING UNIT FOR DEFECT INSPECTION DATA OF THIN PIPE
    • JPS62121348A
    • 1987-06-02
    • JP26172885
    • 1985-11-21
    • TOUDEN KOGYO KKKENSA GIKEN KK
    • MIYAMOTO TAKEHIKOURATA TOSHIMITSU
    • G01N27/90
    • PURPOSE:To save trouble of an expert, and to curtail the quantity of clerical work by providing a unit containing a computer for executing an analysis processing of a data, when executing a defect inspection of a thin pipe by an eddy current flaw detector. CONSTITUTION:An analysis processing unit 1 of an inspection data is provided with a microcomputer (MC), etc. mainly composed of a CPU 5. Also, as for an eddy current flaw detector 11, two kinds of high frequency power sources whose frequencies are different are connected to its coil. Accordingly, each signal of Y, X, V, and U is inputted to the unit 1, and among them, three signals excluding U are inputted to the MC through a buffer 4, and an A/D converting element 3, but since they are digitized, the analysis is executed easily. In this state, a signal of the flaw detector 11 is brought to an analysis processing by the MC and its result passes through a level converting circuit 6, becomes a signal S and inputted to a recorder 13. A reference signal R, analog signals X, Y and V are also inputted to the recorder 13. In this way, the quantity of clerical work can be curtailed.
    • 9. 发明专利
    • DEFECT INSPECTING METHOD FOR THIN PIPE
    • JPS62121347A
    • 1987-06-02
    • JP26172785
    • 1985-11-21
    • TOUDEN KOGYO KKKENSA GIKEN KK
    • MIYAMOTO TAKEHIKOURATA TOSHIMITSU
    • G01N27/90
    • PURPOSE:To save trouble of an expert, and to curtail the quantity of clerical work by leading in a computer, etc., for putting in order a data of a defect inspection of a thin pipe. CONSTITUTION:A probe coil is inserted into the inside of a pipe to be inspected, a probe is moved at a prescribed speed by applying a high frequency voltage to the coil, and a variation of a coil impedance is outputted from an eddy current flaw detector as a signal by a Lissajous' waveform, and recorded in a portable type analysis processing unit. By analyzing this recording, a defect of a thin pipe is inspected. This analysis processing unit contains a computer having a function for calibrating the eddy current flaw detector, a threshold value managing function for eliminating a dead minute defect and a noise, a function for managing a pipe number, and a signal analysis function. In this state, by this analysis processing unit, a pipe number designating device, and a data recorder, an output record from the eddy current flaw detector is recorded in a recording medium in a measuring job site. Subsequently, it is processed by an evaluating, counting-up and recording computer, and a result of inspection is displayed, recorded, and brought to save-recording.