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    • 5. 发明专利
    • MANUFACTURE OF X-RAY LITHOGRAPHY MASK
    • JPH02222521A
    • 1990-09-05
    • JP33298289
    • 1989-12-25
    • TECHNION RES & DEV FOUNDATION
    • YOOZEFU YAHAROMU
    • G03F1/22H01L21/027
    • PURPOSE: To provide a method of manufacturing X-ray lithographic mask capable of easily manufacturing and sustaining the shape accuracy causing no distortion at all by a method wherein an oxide metallic layer is deposited on a part of a substrate surface while the hack of the substrate is etched away so as to form a metallic oxide membrane supported by the substrate. CONSTITUTION: A part of the surface of a substrate 1 is protected to deposit an oxide metallic layer on one part of the not yet protected part of the surface and then the back of the substrate 1 is etched away to produce an oxide metallic membrane 2 supported by another substrate 3 for the formation of a pattern on the membrane 2. For example, a silicon wafer is coated with chrome 50Å thick, Au 50Å thick and aluminum 3000Å thick and after coating the back of the wafer with photoresist, the aluminum on the upper surface is anodized. Next, after making a window by exposing through a mask having a round window therein, the wafer is etched away in a solution of HF-H2 O2 -nitric acid to be cleaned up in deionized water for producing the aluminum oxide membrane 2 to form an Au pattern on the membrane 2.