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2. 发明授权

US4377869A Procedure for measuring coating rates 失效
标题翻译：测量涂层率的程序
公开(公告)号：US4377869A
公开(公告)日：1983-03-22
申请号：US259496
申请日：1981-05-01
申请人： Heikki Venalainen , Rauno Rantanen , Rertti Puumalainen
发明人： Heikki Venalainen , Rauno Rantanen , Rertti Puumalainen
IPC分类号： G01N23/223 , G01N23/22
CPC分类号： G01N23/223 , G01N2223/076
摘要： The invention concerns a procedure for measurement of the material quantities in coating layers applied upon a base material, by utilizing x-ray radiation. The procedure is particularly suited for use in a paper or cardboard manufacturing process wherein onto a material web in continuous motion are applied by steps one or several coating courses. The radiation source and detector are both placed on one side of the moving web, and the procedure is based on measurement of the fluorescence radiation excited by the primary x-ray radiation obtained from the radiation source in the material underlying the coating layer that is to be measured. The primary and secondary radiation both are thereby compelled to pass through the coating layer under measurement before the arrival of the fluorescence radiation at the detector. The moving web may be equipped with a plurality of consecutive pairs of radiation source and detector, the first pair measuring the fluorescence radiation from the base material before application of the coating layer and the latter measuring the equivalent fluorescence radiation after applying the coating layer, in above-presented manner. It is alternatively possible to use one single radiation source and detector and to measure simultaneously the fluorescence radiation produced both in the coating layer under measurement and in the underlying base material.
摘要翻译：本发明涉及通过利用x射线辐射测量施加在基材上的涂层中的材料量的方法。该方法特别适用于纸或纸板的制造过程，其中连续运动的材料幅材通过步骤一或多个涂布过程施加。辐射源和检测器都放置在移动幅材的一侧上，并且该过程基于由在涂层下面的材料中从辐射源获得的初级x射线辐射激发的荧光辐射的测量，被测量。因此，在荧光辐射到达检测器之前，主要和次要辐射两者都被迫通过测量的涂层。移动网可以配备有多个连续的辐射源和检测器对，第一对在施加涂层之前测量来自基底材料的荧光辐射，并且后者测量施加涂层后的等效荧光辐射，以上呈现方式。或者可以使用一个单一的辐射源和检测器，并同时测量在测量的涂层和下面的基底材料中产生的荧光辐射。

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