专利快速检索-快速检索全球专利，免费商用专利数据库-IPRDB

1. 发明专利

JP2007078660A Apparatus for measuring electron emission distribution 有权
标题翻译：用于测量电子发射分布的装置
公开(公告)号：JP2007078660A
公开(公告)日：2007-03-29
申请号：JP2005270889
申请日：2005-09-16
申请人： Univ Of Tsukuba , 国立大学法人筑波大学
发明人： SASAKI MASAHIRO , SATO TAKANOBU , SAIDA MORIHIKO
IPC分类号： G01B7/34 , G01Q10/04 , G01Q10/06 , G01Q30/02 , G01Q30/04 , G01Q60/00 , G01Q60/02 , G01Q60/10 , G01Q60/12
摘要： PROBLEM TO BE SOLVED: To provide an apparatus for measuring an electron emission distribution capable of also measuring a high dissolving power electron emission distribution in a scanning tunnel microscope. SOLUTION: The apparatus includes a probe 6, a piezoelectric element for moving the probe 6 with respect to a sample 7, a bias voltage applying circuit for applying bias voltage to the sample 7, a preamplifier 10 for converting the tunnel current flowing across the probe 6 and the sample 7 to voltage and STM control circuits 3 successively provided on the output side of the preamplifier 10. A sample holding circuit 22 is provided between the preamplifier 10 and the STM control circuits 3 not only to measure (form) an STM image but also to measure (form) the electron emission distribution image. COPYRIGHT: (C)2007,JPO&INPIT
摘要翻译：要解决的问题：提供一种用于测量扫描隧道显微镜中也可测量高溶解度电子发射分布的电子发射分布的装置。解决方案：该装置包括探针6，用于相对于样品7移动探针6的压电元件，向样品7施加偏置电压的偏置电压施加电路，用于转换隧道电流流过的前置放大器10 跨越探针6和样品7到连续提供在前置放大器10的输出侧的电压和STM控制电路3.样品保持电路22设置在前置放大器10和STM控制电路3之间，不仅测量（形式） STM图像，但也用于测量（形成）电子发射分布图像。版权所有（C）2007，JPO＆INPIT

IPRDB

热门服务

关于我们

友情链接

联系方式