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    • 2. 发明申请
    • LIGHT-EMITTING ELEMENT DRIVE DEVICE AND LIGHT-EMITTING DEVICE
    • 发光元件驱动装置和发光装置
    • US20110032244A1
    • 2011-02-10
    • US12909068
    • 2010-10-21
    • Shinichiro KATAOKA
    • Shinichiro KATAOKA
    • G09G5/00
    • H05B33/0815H05B33/0827
    • Power loss and heat output are reduced in a current drive circuit unit of a light-emitting element. A light-emitting element drive device drives N (where N is an integer of 1 or more) light-emitting element groups, and includes a drive voltage generating circuit used as a feedback path of a minimum voltage detection circuit, N current drive circuits, and N or fewer voltage adjustment circuits. The N light-emitting element groups each include at least one light-emitting element. The drive voltage generating circuit supplies a specified voltage from a voltage source to the N light-emitting element groups. The N current drive circuits the N light-emitting element groups by current through the voltage adjustment circuits. Of the N current drive circuits connected to the minimum voltage detection circuit, the current drive circuit with the lowest end voltage is used in the feedback loop of the drive voltage generating circuit. Even if there is a voltage difference between the end voltages of the light-emitting element groups, the end voltage of the current drive circuit is reduced by the voltage adjustment circuit to a voltage equal to or greater than the minimum voltage required for the current drive circuit to operate.
    • 在发光元件的电流驱动电路单元中,功率损耗和热输出减小。 发光元件驱动装置驱动N(其中N是1以上的整数)发光元件组,并且包括用作最小电压检测电路的反馈路径的驱动电压产生电路,N个电流驱动电路, 和N个或更少的电压调节电路。 N个发光元件组各自包括至少一个发光元件。 驱动电压产生电路将来自电压源的指定电压提供给N个发光元件组。 N个电流驱动器通过电流通过电压调节电路对N个发光元件组进行电路。 在连接到最小电压检测电路的N个电流驱动电路中,在驱动电压产生电路的反馈回路中使用具有最低端电压的电流驱动电路。 即使发光元件组的端电压之间存在电压差,电流驱动电路的结束电压也被电压调节电路减小到等于或大于电流驱动所需的最小电压的电压 电路运行。
    • 3. 发明申请
    • SEMICONDUCTOR DEVICE AND METHOD FOR INSPECTING THE SAME
    • 半导体器件及其检测方法
    • US20080239605A1
    • 2008-10-02
    • US12054968
    • 2008-03-25
    • Shinichiro KATAOKATakehiro YANO
    • Shinichiro KATAOKATakehiro YANO
    • H02H3/24G01R31/26
    • G01R31/3012
    • A semiconductor device of the present invention includes: a power input terminal; an internal power supply circuit that converts a voltage supplied from the outside to the power input terminal into a predetermined voltage; an analog circuit connected to an output side of the internal power supply circuit; an internal power output terminal connected to the output side of the internal power supply circuit; a logic circuit power input terminal; a logic circuit connected to the logic circuit power input terminal; and interterminal wiring connecting the internal power output terminal to the logic circuit power input terminal. The internal power supply circuit has a configuration of supplying power to the analog circuit and the logic circuit, and in a package assembly (finished product), a resting current in the logic circuit can be inspected without being influence by a consumption current in the analog circuit.
    • 本发明的半导体器件包括:电源输入端子; 内部电源电路,其将从外部供给到电力输入端子的电压转换为预定电压; 连接到所述内部电源电路的输出侧的模拟电路; 内部电力输出端子,连接到内部电源电路的输出侧; 逻辑电路电源输入端; 连接到逻辑电路电源输入端的逻辑电路; 以及将内部功率输出端子连接到逻辑电路电源输入端子的互连线。 内部电源电路具有向模拟电路和逻辑电路供电的配置,并且在封装组件(成品)中,可以检查逻辑电路中的静止电流,而不受模拟量中的消耗电流的影响 电路。