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    • 1. 发明专利
    • Memory system
    • 记忆系统
    • JP2007164787A
    • 2007-06-28
    • JP2006331050
    • 2006-12-07
    • Samsung Electronics Co Ltd三星電子株式会社Samsung Electronics Co.,Ltd.
    • LEE JAE-JUNCHOI JOO-SUNKIM KYU-HYOUNPARK KWANG-SOO
    • G06F12/00G06F12/06G06F13/16
    • G11C5/066G11C5/02
    • PROBLEM TO BE SOLVED: To provide point-to-point link between memory devices. SOLUTION: This memory system has first and second primary memories and first and second auxiliary memories coupled to the first and second primary memories, respectively, the coupling comprising at least one point-to-point connection. A memory module includes at least two of the first and second primary and first and second auxiliary memories. A first connection element, like a connector or a soldered, one connects at least one of the other first and second primary and first and second auxiliary memories to a mother board. At least one of the memories on the first memory module is coupled to at least one of the other memories. The memory system also includes a memory controller which is connected to the primary memories by a point-to-two-point link. COPYRIGHT: (C)2007,JPO&INPIT
    • 要解决的问题:提供存储器件之间的点对点链接。 解决方案:该存储器系统具有第一和第二主存储器以及分别耦合到第一和第二主存储器的第一和第二辅助存储器,耦合器包括至少一个点到点连接。 存储器模块包括第一和第二主要和第一和第二辅助存储器中的至少两个。 诸如连接器或焊接的第一连接元件将第一和第二主要和第一和第二辅助存储器中的至少一个连接到母板。 第一存储器模块上的至少一个存储器耦合到至少一个其他存储器。 存储器系统还包括存储器控制器,该存储器控制器通过点对二点链接连接到主存储器。 版权所有(C)2007,JPO&INPIT
    • 4. 发明专利
    • Clock generating circuit and method for generating clock signals
    • 时钟生成电路和产生时钟信号的方法
    • JP2007124660A
    • 2007-05-17
    • JP2006291563
    • 2006-10-26
    • Samsung Electronics Co Ltd三星電子株式会社Samsung Electronics Co.,Ltd.
    • KIM KYU-HYOUN
    • H03K5/15G06F1/04G06F1/06H03K3/03H03L7/06
    • H03K3/0315H03K5/15033H03K2005/00052
    • PROBLEM TO BE SOLVED: To provide a clock generating circuit and method for generating clock signals. SOLUTION: A clock generating circuit comprises: an inverter which directly receives an external clock signal and generates an inverted external clock signal; M loop circuits LC 1 -LC M in which a first loop circuit receives the inverted external clock signal, each of which includes (n) nodes ((n) is a constant of ≥2), in which each of M-1 (M is a constant of ≥1) loop circuits generates (n) intermediate internal clock signal from corresponding one of the (n) nodes, and which are arrayed in series wherein a frequency of the (n) intermediate internal clock signals is a multiple of a frequency of the external clock signal and the inverted external clock signal; and (n) inverter sets each of which includes M-1 inverters connected in series to receive a corresponding intermediate internal clock signal from a previous loop circuit and to output the corresponding intermediate internal clock signal to the next loop circuit. COPYRIGHT: (C)2007,JPO&INPIT
    • 解决的问题:提供一种用于产生时钟信号的时钟发生电路和方法。 解决方案:时钟发生电路包括:逆变器,其直接接收外部时钟信号并产生反相的外部时钟信号; 其中第一环路电路接收反相的外部时钟信号,其中每个包括(n)个节点((n)为常数)的M个回路电路LC 1 其中M-1(M是≥1的常数)环路电路中的每一个产生(n)来自(n)个节点中的一个节点的中间内部时钟信号,并且它们串联排列,其中频率 (n)个中间内部时钟信号是外部时钟信号和反相外部时钟信号的频率的倍数; 和(n)个逆变器组,每个逆变器组包括串联连接的M-1个反相器,以接收来自先前环路电路的对应的中间内部时钟信号,并将相应的中间内部时钟信号输出到下一个环路电路。 版权所有(C)2007,JPO&INPIT
    • 5. 发明专利
    • Impedance adjustment circuit, integrated circuit including the same and impedance adjustment method of output driver using the same
    • 阻抗调整电路,包括相同的集成电路和使用其的输出驱动器的阻抗调整方法
    • JP2006115489A
    • 2006-04-27
    • JP2005276474
    • 2005-09-22
    • Samsung Electronics Co Ltd三星電子株式会社Samsung Electronics Co.,Ltd.
    • CHUNG HOE-JULEE JAE-JUNKIM KYU-HYOUN
    • H03K19/0175H04L25/02
    • H04L25/0278
    • PROBLEM TO BE SOLVED: To provide an impedance calibration circuit, integrated circuit including the same, and impedance adjustment method of an output driver utilizing the same. SOLUTION: The present invention relates to an impedance adjustment circuit including a calibration circuit, a first register and a second register. The calibration circuit generates a reference current by supplying an internal voltage to an external resistor connected to a calibration terminal and outputs first and second calibration signals in response to the reference current, first and second reference voltages and first and second impedance control signals. The first register increases/decreases a bit value of the first impedance control signal in response to the first calibration signal. The second register increases/decreases a bit value of the second impedance control signal in response to the second calibration signal. Thus, the skew of a signal transmitted by the output driver can be decreased. COPYRIGHT: (C)2006,JPO&NCIPI
    • 要解决的问题:提供一种阻抗校准电路,包括该阻抗校准电路的集成电路和使用该阻抗校正电路的输出驱动器的阻抗调节方法。 阻抗调整电路技术领域本发明涉及一种包括校准电路,第一寄存器和第二寄存器的阻抗调整电路。 校准电路通过向连接到校准端子的外部电阻器提供内部电压来产生参考电流,并响应于参考电流,第一和第二参考电压以及第一和第二阻抗控制信号而输出第一和第二校准信号。 第一寄存器响应于第一校准信号增加/减少第一阻抗控制信号的位值。 第二寄存器响应于第二校准信号增加/减少第二阻抗控制信号的位值。 因此,可以减少由输出驱动器发送的信号的偏斜。 版权所有(C)2006,JPO&NCIPI
    • 6. 发明专利
    • Phase locked loop circuit and method of locking phase
    • 相锁闭环电路和锁相方法
    • JP2007006492A
    • 2007-01-11
    • JP2006171573
    • 2006-06-21
    • Samsung Electronics Co Ltd三星電子株式会社Samsung Electronics Co.,Ltd.
    • PARK MOON-SOOKKIM KYU-HYOUN
    • H03L7/099G06F1/08H03K3/03H03K5/26
    • H03L7/0995G11C7/22G11C7/222H03L7/093
    • PROBLEM TO BE SOLVED: To provide a phase locked loop and method in which various high-frequency clock signals can be generated even when a power supply voltage level becomes low. SOLUTION: A phase locked loop circuit may include a phase detector receiving an external clock signal and a feedback clock signal and outputting an up signal when a phase of the external clock signal leads a phase of the feedback clock signal and outputting a down signal when the phase of the external clock signal lags the phase of the feedback clock signal, a loop filter circuit increasing a control voltage in response to the up signal and decreasing the control voltage in response to the down signal, and a voltage controlled oscillator circuit receiving the control voltage and directly generating at least n (where n is an integer ≥4) internal clock signals. The phase locked loop circuit may also include a voltage controlled oscillator circuit, including at least four loops, receiving the control voltage and generating multiple internal clock signals. COPYRIGHT: (C)2007,JPO&INPIT
    • 解决的问题:提供即使在电源电压变低时也能够产生各种高频时钟信号的锁相环和方法。 解决方案:锁相环电路可以包括接收外部时钟信号和反馈时钟信号的相位检测器,并且当外部时钟信号的相位引导反馈时钟信号的相位并输出下降沿时输出上升信号 信号,当外部时钟信号的相位滞后于反馈时钟信号的相位时,环路滤波器电路响应于上升信号增加控制电压并响应于下降信号降低控制电压,以及压控振荡器电路 接收控制电压并直接产生n(其中n为整数≥4)内部时钟信号。 锁相环电路还可以包括压控振荡器电路,其包括至少四个环路,接收控制电压并产生多个内部时钟信号。 版权所有(C)2007,JPO&INPIT
    • 8. 发明专利
    • Semiconductor memory device and memory system including the same
    • 半导体存储器件和包括其的存储器系统
    • JP2007220278A
    • 2007-08-30
    • JP2007029753
    • 2007-02-08
    • Samsung Electronics Co Ltd三星電子株式会社Samsung Electronics Co.,Ltd.
    • CHUNG HOE-JUKIM KYU-HYOUN
    • G11C29/42
    • H03M13/29G06F11/08G06F11/1008G11C7/1006G11C29/42G11C2029/0411G11C2207/104
    • PROBLEM TO BE SOLVED: To disclose a semiconductor memory device and a memory system including the same. SOLUTION: The semiconductor memory device is provided with a first memory cell array block for generating first data, a second memory cell array for generating second data, a first error detection code generator for generating a first error detection code for the first data, and generating a first final error detection signal by combining a portion of bits of the first error detection code with a portion of bits of a second error detection code, and a second error detection code generator for generating a second error detection code for the second data, and generating a second final error detection signal by combining remaining bits excluding the portion of bits of the second error detection code with remaining bits excluding the portion of bits of the first error detection code. COPYRIGHT: (C)2007,JPO&INPIT
    • 要解决的问题:公开半导体存储器件和包括该半导体存储器件的存储器系统。 解决方案:半导体存储器件设置有用于产生第一数据的第一存储单元阵列块,用于产生第二数据的第二存储单元阵列,用于产生第一数据的第一错误检测码的第一错误检测码产生器 并且通过将第一错误检测码的位的一部分与第二错误检测码的位的一部分组合来产生第一最终错误检测信号,以及第二错误检测码发生器,用于生成第二错误检测码的第二错误检测码 数据,并且通过将排除第二错误检测码的位的部分的剩余比特与除了第一错误检测码的比特的部分之外的剩余比特来生成第二最终错误检测信号。 版权所有(C)2007,JPO&INPIT