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    • 3. 发明专利
    • Semiconductor device
    • 半导体器件
    • JP2014160826A
    • 2014-09-04
    • JP2014045961
    • 2014-03-10
    • Semiconductor Energy Lab Co Ltd株式会社半導体エネルギー研究所
    • OTANI HISASHISUGIYAMA EIJI
    • H01L27/092G06K19/07H01L21/822H01L21/8238H01L27/04
    • H01L23/295H01L21/56H01L23/3157H01L2924/0002H01L2924/12044H01L2924/19041H01L2924/00
    • PROBLEM TO BE SOLVED: To provide a semiconductor device which can increase reliability against an external force, especially a pressing force while ensuring a circuit scale or a memory capacity.SOLUTION: A semiconductor device comprises: a pair of structures in each of which a plurality of layers, especially three and more layers of fiber bodies of an organic compound or an inorganic compound are laminated and an organic resin is impregnated in the laminate; and an element layer provided between the pair of structures. The element layer and the structures can be fastened to each other by thermal compression bond. Or, a layer for fastening the element layer and the structures may be provided. Or, by layering a plurality of fiber bodies on the element layer and subsequently impregnating the organic resin in the fiber bodies, the structure fastened to the element layer can be formed.
    • 要解决的问题:提供一种能够在确保电路规模或存储容量的同时提高抵抗外力,特别是按压力的可靠性的半导体器件。解决方案:半导体器件包括:一对结构,其中每一个都具有多个 的层,特别是有机化合物或无机化合物的三层以上的纤维体层叠,有机树脂浸渍在层叠体中; 以及设置在所述一对结构之间的元件层。 元件层和结构可以通过热压接而彼此紧固。 或者,可以提供用于紧固元件层和结构的层。 或者,通过在元件层上层叠多个纤维体并随后将有机树脂浸渍在纤维体中,可以形成紧固到元件层的结构。
    • 5. 发明专利
    • Semiconductor device
    • 半导体器件
    • JP2012212917A
    • 2012-11-01
    • JP2012139924
    • 2012-06-21
    • Semiconductor Energy Lab Co Ltd株式会社半導体エネルギー研究所
    • OTANI HISASHISUGIYAMA EIJI
    • H01L23/29G06K19/07G06K19/077H01L23/31
    • H01L23/295H01L21/56H01L23/3157H01L2924/0002H01L2924/12044H01L2924/19041H01L2924/00
    • PROBLEM TO BE SOLVED: To provide a semiconductor device whose reliability can be increased against an external force, particularly a pressing force, while securing a circuit scale or a memory capacity.SOLUTION: A semiconductor device includes: a pair of structures 101 and 102 in which a stack of plural layers, especially three or more layers, of organic or inorganic compound fiber bodies 101a to 101c and 102a to 102c is impregnated with an organic resin 104; and an element layer 103 provided between the pair of structures 101 and 102. The element layer 103 and the structures 101 and 102 can be fastened by thermal crimping. Alternatively, a layer may be provided for fastening the element layer 103 and the structures 101 and 102. Further alternatively, after the plural fiber bodies 101a to 101c and 102a to 102c are overlapped on the element layer 103, the fiber bodies 101a to 101c and 102a to 102c are impregnated with the organic resin 104, so that the structures 101 and 102 fastened on the element layer 103 can be formed.
    • 要解决的问题:提供一种半导体器件,其在确保电路规模或存储器容量的同时可以抵抗外力,特别是按压力而增加其可靠性。 解决方案:半导体器件包括:一对结构101和102,其中有机或无机复合纤维体101a至101c和102a至102c的多层,特别是三层或更多层的堆叠浸渍有机 树脂104; 以及设置在一对结构101和102之间的元件层103.元件层103和结构101和102可以通过热卷曲紧固。 或者,可以提供用于紧固元件层103和结构101和102的层。或者,在多个纤维体101a至101c和102a至102c重叠在元件层103上之后,纤维体101a至101c和 102a-102c用有机树脂104浸渍,从而可以形成紧固在元件层103上的结构101和102。 版权所有(C)2013,JPO&INPIT
    • 7. 发明专利
    • Semiconductor device
    • 半导体器件
    • JP2009016808A
    • 2009-01-22
    • JP2008146459
    • 2008-06-04
    • Semiconductor Energy Lab Co Ltd株式会社半導体エネルギー研究所
    • OTANI HISASHISUGIYAMA EIJI
    • H01L23/29G06K19/07G06K19/077H01L23/31
    • H01L23/295H01L21/56H01L23/3157H01L2924/0002H01L2924/12044H01L2924/19041H01L2924/00
    • PROBLEM TO BE SOLVED: To provide a semiconductor device having improved reliability against outer force, particularly, pressing while securing a circuit scale or a memory capacity. SOLUTION: The semiconductor device includes a pair of structures each having organic or inorganic compound fabrics built up in a plurality of layers, particularly, in three or more layers and impregnated with an organic resin, and an element layer provided between the pair of structures. The element layer and the structures are fixed to each other with heat press bonding. It is acceptable to provide a layer for fixing the element layer to the structures. Otherwise, after the plurality of fabrics are laid on the element layer, the fabrics are impregnated with the organic resin to form the structures fixed to the element layer. COPYRIGHT: (C)2009,JPO&INPIT
    • 要解决的问题:提供一种具有提高的抵抗外力的可靠性的半导体器件,特别是在确保电路规模或存储器容量的同时进行压制。 解决方案:半导体器件包括一对结构,每个结构都具有以多层,特别是三层或更多层形成并浸渍有机树脂的有机或无机复合织物,以及设置在该对之间的元件层 的结构。 元件层和结构通过热压粘合彼此固定。 提供用于将元件层固定到结构体的层是可以接受的。 否则,在将多个织物放置在元件层上之后,织物用有机树脂浸渍以形成固定在元件层上的结构。 版权所有(C)2009,JPO&INPIT
    • 9. 发明专利
    • Method of fabricating semiconductor device
    • 制造半导体器件的方法
    • JP2007073948A
    • 2007-03-22
    • JP2006217695
    • 2006-08-10
    • Semiconductor Energy Lab Co Ltd株式会社半導体エネルギー研究所
    • TAKAHASHI HIDEKAZUSUGIYAMA EIJI
    • H01L21/02G06K19/07G06K19/077H01L21/336H01L27/12H01L29/786
    • H01L2924/01047
    • PROBLEM TO BE SOLVED: To provide a method of fabricating a semiconductor device with higher reliability. SOLUTION: The method of fabricating the semiconductor device includes a step of forming a first conductive layer on a substrate; a step of forming a second conductive layer containing conductive particles (also referred to as conductive fine particles) of gold, silver, or copper, and a resin on the first conductive layer; and a step of irradiating the second conductive layer with a laser beam to expand an area (part), where the first conductive layer and the second conductive layer come into contact with each other. Since the method includes the step of irradiating the second conductive layer with the laser beam, even when the second conductive layer composed of the conductive particles and the resin is formed on the first conductive layer, it is possible to expand the part where the first conductive layer and the second conductive layer come into contact with each other, and to repair an faulty electrical connection between the first conductive layer and the second conductive layer. COPYRIGHT: (C)2007,JPO&INPIT
    • 要解决的问题:提供一种制造具有更高可靠性的半导体器件的方法。 解决方案:制造半导体器件的方法包括在衬底上形成第一导电层的步骤; 在第一导电层上形成含有金,银或铜的导电性微粒(也称为导电性微粒)和树脂的第二导电层的工序; 以及用激光束照射第二导电层以扩大第一导电层和第二导电层彼此接触的区域(部分)的步骤。 由于该方法包括用激光束照射第二导电层的步骤,所以即使在第一导电层上形成由导电粒子和树脂构成的第二导电层,也可以扩大第一导电性 层和第二导电层彼此接触,并且修复第一导电层和第二导电层之间的故障电连接。 版权所有(C)2007,JPO&INPIT