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1. 发明专利

JP2010169493A Spectroradiometer 审中-公开
标题翻译：分光辐射度计
公开(公告)号：JP2010169493A
公开(公告)日：2010-08-05
申请号：JP2009011480
申请日：2009-01-22
申请人： National Institute Of Advanced Industrial Science & Technology , Nisshinbo Holdings Inc , Ok Lab Kk , Opt Res:Kk , Yamashita Denso Kk , オーケーラボ有限会社 , 山下電装株式会社 , 日清紡ホールディングス株式会社 , 株式会社オプトリサーチ , 独立行政法人産業技術総合研究所
发明人： IGARI SHINICHI , KIKUCHI KAZUHIKO , OKI KOICHI , SHIMOTOMAI MITSUHIRO , TAKEDA SHUNSUKE
IPC分类号： G01J3/12
CPC分类号： G01J3/36 , G01J3/02 , G01J3/0205 , G01J3/0208 , G01J3/0218 , G01J3/0291 , G01J3/18
摘要： PROBLEM TO BE SOLVED: To provide an inexpensive, small, and light-weight spectroradiometer of high-speed, high-resolution, high-efficiency, and wide-band for measuring spectral characteristics of flash.
SOLUTION: The spectroradiometer includes: an incidence slit 2 on which light to be measured is incident; an optical element 3 collimating the light to be measured passing through the incidence slit 2; a spectral element 4 subjecting the light to be measured emitted from the optical element 3 to spectral separation; first and second light detection means 8, 9 detecting the spectral light separated by the spectral element 4; and a dichroic filter 5 provided in an optical system between the spectral element 4 and the first and second light detection means 8, 9. The first light detection means 8 detects the spectral light in a first wavelength band transmitted through the dichroic filter 5, and the second light detection means 9 detects the spectral light in a second wavelength band different from the first wavelength band reflected by the dichroic filter 5.
COPYRIGHT: (C)2010,JPO&INPIT
摘要翻译：要解决的问题：为了提供用于测量闪光的光谱特性的高速，高分辨率，高效率和宽带的廉价，小型和轻量级的光谱辐射计。解决方案：光谱辐射计包括：入射狭缝2，待测光; 光学元件3使穿过入射狭缝2的待测光准直; 对从光学元件3发射的光进行光谱分离的光谱元件4; 第一和第二光检测装置8,9检测由光谱元件4分离的光谱光; 以及分光元件4和第一和第二光检测装置8,9之间的光学系统中的二向色滤光器5.第一光检测装置8检测通过二向色滤光器5透射的第一波长带中的光谱光，以及第二光检测装置9检测与由二向色滤光器5反射的第一波长带不同的第二波长带中的光谱光。（C）2010，JPO＆INPIT

2. 发明专利

JP2010169492A Standard spectroradiometer 有权
标题翻译：标准光谱仪
公开(公告)号：JP2010169492A
公开(公告)日：2010-08-05
申请号：JP2009011478
申请日：2009-01-22
申请人： National Institute Of Advanced Industrial Science & Technology , Nisshinbo Holdings Inc , Ok Lab Kk , Opt Res:Kk , Yamashita Denso Kk , オーケーラボ有限会社 , 山下電装株式会社 , 日清紡ホールディングス株式会社 , 株式会社オプトリサーチ , 独立行政法人産業技術総合研究所
发明人： IGARI SHINICHI , KIKUCHI KAZUHIKO , OKI KOICHI , SHIMOTOMAI MITSUHIRO , TAKEDA SHUNSUKE
IPC分类号： G01J3/36 , G01J1/42
CPC分类号： G01J3/443 , G01J1/4257 , G01J3/02 , G01J3/0218 , G01J3/0264 , G01J3/027 , G01J3/36 , G01J11/00 , G01J2001/4238 , G01J2001/4247 , H02S50/10
摘要： PROBLEM TO BE SOLVED: To provide a standard spectroradiometer precisely measuring spectral radiance characteristics of a solar simulator and also including a function of diagnosing a light source lamp and its lighting circuit. SOLUTION: In the standard spectroradiometer branching and conducting flash emitted from the pulse-lighting type solar simulator 2 by a plurality of optical fibers 71 to 75, subjecting the conducted flash to spectral separation by respective spectrometers 81 to 85, and including first light detection means 91 to 95 detecting the separated spectral light, respectively, the standard spectroradiometer includes: a second light detection means 10 detecting the flash emitted from the solar simulator 2; a threshold determination circuit 13 comparing a detection voltage detected by the second light detection means 10 with a threshold reference voltage and outputting a determination signal when the detection voltage is equal to or more than the threshold reference voltage; and a delay time generation circuit 14 inputting the determination signal and outputting a measurement start signal. When the measurement start signal is input, each of the first light detection means 91 to 95 performs the detection. COPYRIGHT: (C)2010,JPO&INPIT
摘要翻译：要解决的问题：提供一种精确测量太阳能模拟器的光谱辐射特性的标准光谱仪，还包括诊断光源灯及其照明电路的功能。解决方案：在通过多根光纤71至75从脉冲照明型太阳能模拟器2发射的标准分光光度计分支和导电闪光中，对所传导的闪光进行各光谱仪81至85的光谱分离，并且包括第一光检测装置91至95分别检测分离的光谱光，标准光谱辐射计包括：第二光检测装置10，用于检测从太阳模拟器2发射的闪光; 阈值确定电路13，比较由第二光检测装置10检测的检测电压与阈值参考电压，并在检测电压等于或大于阈值参考电压时输出确定信号; 以及延迟时间生成电路14，输入判定信号并输出测定开始信号。当输入测量开始信号时，第一光检测装置91至95中的每一个进行检测。版权所有（C）2010，JPO＆INPIT

3. 发明专利

JP2011128089A Linearity inspection device and linearity inspection method 有权
标题翻译：线性检测装置和线性检测方法
公开(公告)号：JP2011128089A
公开(公告)日：2011-06-30
申请号：JP2009288546
申请日：2009-12-20
申请人： National Institute Of Advanced Industrial Science & Technology , Ok Lab Kk , オーケーラボ有限会社 , 独立行政法人産業技術総合研究所
发明人： IGARI SHINICHI , OKI KOICHI
IPC分类号： G01M11/00
摘要： PROBLEM TO BE SOLVED: To provide a linearity inspection device and a linearity inspection method for inspecting linearity of a detector such as a spectroradiometer for measuring an emission spectrum of strong light of a solar simulator or the like.
SOLUTION: This linearity inspection device includes: a light source 2 switchable for each wavelength, capable of outputting strong light of a solar simulator grade in each of a plurality of kinds of wavelengths; a rotating disk 9 or an opening plate having a plurality of kinds of dynamic transmittances wherein a dynamic transmittance for transmitting optical output from the light source 2 is decided; and a reference detector 12 in each of a plurality of kinds of wavelengths provided switchably in correspondence with switching of each wavelength, for receiving light transmitted through the rotating disk 9 or the opening plate. In the device, linearity of an unknown detector 16 is inspected by acquiring a light reception amount detected by the unknown detector 16 for receiving the light transmitted through the rotating disk 9 or the opening plate, relative to the light reception amount detected by the reference detector 12 in each wavelength.
COPYRIGHT: (C)2011,JPO&INPIT
摘要翻译：要解决的问题：提供一种用于检查诸如用于测量太阳模拟器等的强光的发射光谱的分光辐射计的检测器的线性的线性检查装置和线性检查方法。该线性检查装置包括：能够针对每个波长切换的能够输出多种波长的太阳模拟器等级的强光的光源2; 旋转盘9或具有多种动态透射率的开口板，其中决定了用于从光源2发送光学输出的动态透射率; 以及与各波长的切换对应地可切换地设置的多种波长的基准检测器12，用于接收透过旋转盘9或开口板的光。在该装置中，通过获取由未知检测器16检测到的光接收量来检测未知检测器16的线性，用于接收通过旋转盘9或开口板传输的光，相对于由参考检测器检测到的光接收量每个波长12。版权所有（C）2011，JPO＆INPIT

4. 发明专利

JP2011039354A Optical fiber transmission system 有权
标题翻译：光纤传输系统
公开(公告)号：JP2011039354A
公开(公告)日：2011-02-24
申请号：JP2009188012
申请日：2009-08-14
申请人： National Institute Of Advanced Industrial Science & Technology , Ok Lab Kk , オーケーラボ有限会社 , 独立行政法人産業技術総合研究所
发明人： IGARI SHINICHI , OKI KOICHI
IPC分类号： G02B6/00 , G01J3/02 , G02B6/44
摘要： PROBLEM TO BE SOLVED: To provide an optical fiber transmission system in which the variation in spectral transmission characteristics is very smaller over a wide wavelength band than conventional systems. SOLUTION: The optical fiber transmission system, which transmits spectrum in an optical fiber 1, includes tubes 2, 3 which circulate a temperature-adjusted fluid 5 in them, wherein the tubes 2, 3 are arranged to enclose the optical fiber 1 or along the transmission direction on the outside face of the optical fiber 1, a plurality of temperature measurement bodies are provided at appropriate positions on the outside of the optical fiber 1, the temperature of the fluid 5 circulating in the tubes 2, 3 is controlled with a temperature controller 6 on the basis of the measured data measured by the temperature measurement bodies, and the outside face of the tube 3 is covered with a heat insulating material 4. COPYRIGHT: (C)2011,JPO&INPIT
摘要翻译：要解决的问题：提供一种光纤传输系统，其中光谱传输特性的变化在宽波段上比常规系统小得多。解决方案：在光纤1中透射光谱的光纤传输系统包括在其中循环温度调节流体5的管2,3，其中管2,3被设置成将光纤1包围或者沿着光纤1的外侧的透射方向，在光纤1的外侧的适当位置设置多个温度测量体，控制在管2,3中循环的流体5的温度基于由温度测量体测量的测量数据，温度控制器6，并且管3的外表面被隔热材料4覆盖。版权所有（C）2011，JPO＆INPIT

5. 发明专利

JP2008249506A Microscopic photoluminescence measuring instrument and measuring method 有权
标题翻译：微量光度法测量仪器和测量方法
公开(公告)号：JP2008249506A
公开(公告)日：2008-10-16
申请号：JP2007091467
申请日：2007-03-30
申请人： Ok Lab Kk , Saitama Univ , オーケーラボ有限会社 , 国立大学法人埼玉大学
发明人： KAMATA NORIHIKO , OKI KOICHI
IPC分类号： G01N21/64 , G02B21/00 , H01L21/66
摘要： PROBLEM TO BE SOLVED: To provide a microscopic photoluminescence measuring instrument capable of specifying easily an observation area, and allowing compact constitution. SOLUTION: This microscopic photoluminescence measuring instrument is provided with microscope tubes 151, 152, a bundle fiber 20 for guiding lights emitted from the microscope tubes 151, 152 to a photoanalytical means, a position regulating means 33 for regulating a position of the bundle fiber, epi-illumination observation means 34, 36 for guiding a light from illumination light source into the microscope tubes and for observing a reflected light from a sample 14, an excitation light source for an excitation light for exciting the sample, and a view field diaphragm 30 for selecting an observation area of the sample emitting photoluminescence (PL) by the excitation due to the excitation light. The instrument observes a surface of the sample by the epi-illumination observation means, selects the PL observation area by the view field diaphragm 30, and regulates the position of the bundle fiber by the position regulating means 33 to make a light flux converged by the view field diaphragm get properly into the bundle fiber 20. The PL observation area is specified highly precisely, and the observation area is set easily to allow the observation under the optimum condition. COPYRIGHT: (C)2009,JPO&INPIT
摘要翻译：要解决的问题：提供能够容易地指定观察区域的微观光致发光测量仪器，并且允许紧凑的构造。解决方案：该微观光致发光测量仪器配有显微镜管151,152，用于将从显微镜管151,152发出的光引导到光分析装置的束纤维20，用于调节束光纤，外照射观察装置34,36，用于将来自照明光源的光引导到显微管中，并且用于观察来自样品14的反射光，用于激发样品的激发光的激发光源和视野场光阑30，用于通过由激发光引起的激发来选择发射光致发光（PL）的样本的观察区域。仪器通过外照射观察装置观察样品的表面，通过视野光阑30选择PL观察区域，并通过位置调节装置33调节束光纤的位置，使光束会聚在视场光阑适当地插入束光纤20中。高精度地指定PL观察区域，并且容易地设定观察区域以允许在最佳条件下观察。版权所有（C）2009，JPO＆INPIT

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