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    • 1. 发明授权
    • High-strength stainless steel for use as material of fuel injection
nozzle or needle for internal combustion engine, fuel injection nozzle
made of the stainless steel
    • 高强度不锈钢用作燃油喷嘴或内燃机针,不锈钢燃油喷嘴
    • US5492573A
    • 1996-02-20
    • US229005
    • 1994-04-18
    • Katsuaki FukushimaToshio OkunoMasakazu ItoKeizo TakeuchiToshiaki Terada
    • Katsuaki FukushimaToshio OkunoMasakazu ItoKeizo TakeuchiToshiaki Terada
    • C22C38/00C22C38/26C22C38/30F02M61/16F02M61/18C22C38/22
    • F02M61/166C22C38/26C22C38/30
    • A high-strength stainless steel for use as a material of a fuel injection nozzle or a fuel injection needle of an internal combustion engine. The stainless steel is an as annealed martensitic stainless steel which exhibits a hardness not less than HRC 58 after quenching and tempering heat-treatment. The limit swaging ratio of said as annealed martensitic stainless steel is not less than 75%. The hardness of said as annealed martensitic stainless steel is not higher than HB 157. Preferably, the number of carbides having sizes of 0.2 .mu.m or less occupies not more than 50% of the total carbides, and wherein the limit swaging ratio of said as annealed martensitic stainless steel is not less than 75% or the hardness of said as annealed martensitic stainless steel is not higher than HB 157. Preferably, the stainless steel has a chemical composition containing, by weight: 0.4 to 0.6% of C; not more than 0.5% of Si; not more than 0.5% of Mn; 8.0 to 13.0% of Cr; 0.1 to 2.0% of one or both of W and Mo in terms of W/2+Mo; one or both of 0.05 to 1.0% of one or both of Nb and V in terms of Nb/2+V, and 0.2 to 2.0% of Co; and the balance substantially Fe and incidental impurities.
    • 一种高强度不锈钢,用作燃料喷嘴或内燃机的燃料喷射针的材料。 不锈钢是退火马氏体不锈钢,淬火回火热处理后的硬度不低于HRC 58。 所述退火马氏体不锈钢的极限锻压比不小于75%。 所述退火的马氏体系不锈钢的硬度不高于HB157。优选地,尺寸为0.2μm以下的碳化物的数量不超过总碳化物的50%,并且其中所述作为退火的马氏体不锈钢的极限锻造比 退火的马氏体不锈钢不小于75%,或者所述退火的马氏体不锈钢的硬度不高于HB157。优选地,不锈钢具有以重量计含有:C = 0.4-0.6%的化学组成; 不超过0.5%的Si; 不超过0.5%的Mn; 8.0〜13.0%的Cr; 以W / 2 + Mo计,W和Mo中的一种或两种为0.1〜2.0% 以Nb / 2 + V表示的Nb和V中的一种或两种中的一种或两种中的一种或两种,以及Co的0.2〜2.0% 余量基本上是Fe和杂质。
    • 3. 发明授权
    • Multipoint conductive sheet
    • 多点导电片
    • US06217343B1
    • 2001-04-17
    • US09323036
    • 1999-06-01
    • Toshio Okuno
    • Toshio Okuno
    • H01R1200
    • H01L23/13H01L23/49827H01L23/49838H01L2924/0002H01L2924/00
    • A multipoint conductive sheet having a plurality of conductive electrons arranged, in a multipoint fashion, on an insulative sheet such that the conductive electrons extend from a first main surface of the insulative sheet all the way to a second main surface through a thickness of the insulative sheet, each of the conductive electrons being provided at one end thereof with a first contact end which is arranged, in a multipoint fashion, on the first main surface and at the other end with a second contact end which is arranged, in a multipoint fashion, on the second main surface, wherein a slit or a slot is formed adjacent to each of the conductive electrons in such a manner as to extend through the insulative sheet, the slit or slot is allowed to extend at least two ways of each of the conductive electrons, the conductive electrons are each arranged on a sheet piece at an inner region of each of the slits or slots, and the conductive electrons can be displaced towards the first and second main surfaces while flexing the sheet pieces.
    • 具有多个导电电子的多点导电片以多点的方式排列在绝缘片上,使得导电电子从绝缘片的第一主表面一直延伸到第二主表面,通过绝缘片的厚度 每个导电电子在其一端处设置有第一接触端,该第一接触端以多点的方式设置在第一主表面上,而在另一端具有以多点方式布置的第二接触端 在第二主表面上,其中以与每个导电电子相邻的方式形成狭缝或槽,以延伸穿过绝缘片,允许狭缝或狭槽延伸至少两个方向 导电电子,导电电子各自布置在每个狭缝或狭槽的内部区域上的片状片上,并且导电电子可以朝向第一和第二 在弯曲片材的同时主要表面。
    • 4. 发明授权
    • Probe unit
    • 探头单元
    • US06211691B1
    • 2001-04-03
    • US09323037
    • 1999-06-01
    • Toshio Okuno
    • Toshio Okuno
    • G01R3102
    • G01R1/06755G01R1/06733G01R1/07307G09G3/006
    • A probe unit having a plurality of elongate leads disposed longitudinally in an array on a surface of an insulative sheet. Tip portions of the leads aligned along an end edge of the sheet are capable of being brought into contact, under pressure, with corresponding electrode pads of an electronic part. An insulative material is embedded in at least those areas of grooves between the tip portions of the leads. Slots, which are smaller in width than the leads, are formed between the tip portions of the leads. The tip portions of the leads have a reduced width and are longitudinally disposed on wide comb tooth like pieces of the insulative sheet isolated by the slots, and the insulative materials isolated by the slots are longitudinally intimately disposed along the opposite ends of the tip portions of the leads.
    • 一种探针单元,其具有多个细长的引线,其纵向排列在绝缘片的表面上。 沿着片材的端边缘排列的引线的尖端部分能够在压力下与电子部件的相应的电极焊盘接触。 绝缘材料至少嵌入在引线的尖端部分之间的沟槽区域中。 在引线的尖端部分之间形成有宽度小于引线的插槽。 引线的尖端部分的宽度减小,并纵向设置在由槽隔开的绝缘片的宽梳齿状的片上,并且由槽隔开的绝缘材料沿着尖端部的相对端纵向紧密地设置 线索。
    • 9. 发明授权
    • Apparatus for inspecting display board or circuit board
    • 显示板或电路板检查装置
    • US06590406B2
    • 2003-07-08
    • US09974895
    • 2001-10-12
    • Toshio OkunoGunji MizutaniMasatomo NagashimaTadashi Furumi
    • Toshio OkunoGunji MizutaniMasatomo NagashimaTadashi Furumi
    • G01R3102
    • G09G3/006
    • An apparatus for inspecting a display board or a circuit board in which an inspection terminal 4 of an inspection probe block B is pressed into contact with an electrode pad 3 of a display board or a circuit portion P for inspection. A probe block supporting frame member 2 has an expandable and contractible structure, and when the probe block supporting frame member 2 is expanded, a board supporting frame member 1 can be relatively advanced. Due to the relative advancement of the board supporting frame member 1, the display board or the circuit board P protrudes forward of a distal end of the terminal 4 of the probe block B through an enlarged opening area 16 of the probe supporting frame member 2, so that the display board or the circuit board P supported on the board supporting frame member 1 can be exchanged with another board.
    • 用于检查显示板或电路板的装置,其中检查探针块B的检查端子4与显示板的电极焊盘3或电路部分P接触以进行检查。 探针块支撑框架构件2具有可扩张和收缩的结构,并且当探针块支撑框架构件2膨胀时,板支撑框架构件1可以相对前进。 由于板支撑框架构件1的相对推进,显示板或电路板P通过探针支撑框架构件2的扩大的开口区域16在探针块B的端子4的远端的前方突出, 使得支撑在板支撑框架构件1上的显示板或电路板P可以与另一个板交换。
    • 10. 发明授权
    • Unit with inspection probe blocks mounted thereon in parallel
    • 具有安装在其上的检查探针块的单元
    • US06577145B2
    • 2003-06-10
    • US09986073
    • 2001-11-07
    • Toshio OkunoMasatomo NagashimaAtsushi OgumaTadashi Furumi
    • Toshio OkunoMasatomo NagashimaAtsushi OgumaTadashi Furumi
    • G01R3162
    • G01R1/07364
    • A unit has inspection block blocks mounted thereon in parallel, wherein a plurality of inspection probe blocks are inserted into and removed from a guide rail through a slider so that the probe blocks can be loaded or replaced. Each probe block is slidingly moved along the guide rail so that its positional adjustment can be made in an extension length of the guide rail. Only one kind of support base can commonly be used by inserting and removing different probe blocks with respect to the support base and the positional adjustment can be done. The unit with inspection probe blocks mounted thereon in parallel includes a support base and a plurality of inspection probe blocks each having a plurality of blocks and arranged on the support base in parallel. The probes of each inspection probe block are contacted with electrodes of a display panel or wiring circuit board so that inspection can be carried out, wherein a guide rail is disposed on the support base, the inspection probe blocks are slidably fitted to the guide rail through a slider, and each inspection probe block is fixed to the support base at a predetermined slide position.
    • 单元具有平行安装在其上的检查块块,其中多个检查探针块通过滑块插入导轨中并从导轨移除,使得可以装载或更换探针块。 每个探针块沿着导轨滑动移动,使得其可以在导轨的延伸长度上进行位置调节。 通常可以通过相对于支撑基座插入和移除不同的探针块而可以使用一种支撑基座,并且可以进行位置调整。 安装在其上的检查探针块的单元包括支撑基座和多个检查探针块,每个具有多个块并且平行地布置在支撑基座上。 每个检查探针块的探针与显示面板或布线电路板的电极接触,从而可以进行检查,其中导轨设置在支撑基座上,检查探针块可滑动地装配到导轨上 滑块,并且每个检查探针块在预定的滑动位置固定到支撑基座。