会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 7. 发明专利
    • STRESS MEASURING METHOD BY X-RAY DIFFRACTION USING CURVE METHOD
    • JPS60146136A
    • 1985-08-01
    • JP249484
    • 1984-01-10
    • KURITA MASANORI
    • KURITA MASANORIISHII MASAMI
    • G01L1/00G01L1/25G01N23/207
    • PURPOSE:To enhance accuracy of a peak position and to shorten stress measuring time, by obtaining correcting value (z) for all X-ray intensities, which are measured at a specified step and exceed 0.8zmax. CONSTITUTION:The peak position of the diffraction line of a steel material having no stress is about 156 deg.. Therefore X-ray intensity is measured from a point A on the side larger than that angle at a specified step width (c). A correcting value (z) for the intensity is plotted. Here, the (x) coordinates of the starting point A for measurement and an initial point C, where the correcting value (z) of the X rays exceeds 0.8zmax, are made to be xa and xc, respectively. When the difference angle (x) is gradually decreased and as soon as it passes the peak of the diffraction angle, a computer computes the maximum value zmax of the correcting value (z). When the diffraction angle (x) becomes smaller and the correcting value (z) of the X-ray intensity (z) becomes smaller than 0.8zmax, the measurement of the X-ray intensity is finished by the instruction from the computer and the measurement at the next X-ray incident angle is started. Therefore in the measurement of X-ray intensity of the low angle side, the necessary points can be measured efficiently except the last one point R, which is smaller than 0.8zmax.