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    • 2. 发明专利
    • MEASURING METHOD FOR CONCENTRATION OF SOLUTE ELEMENT IN MOLTEN METAL
    • JPH10185863A
    • 1998-07-14
    • JP35622896
    • 1996-12-24
    • KAWASO DENKI KOGYOIWASE MASANORI
    • IWASE MASANORIGOMYO KENICHI
    • G01N27/411G01N20060101G01N33/20
    • PROBLEM TO BE SOLVED: To obtain a measuring method by which the concentration itself of an element as an object to be measured can be measured, by using an electrochemical sensor, which measures the activity of the object to be measured in molten metal and computing the concentration by using a specific expression on the basis of a detected electromotive force and on the basis of the temperature of the molten metal. SOLUTION: An electrochemical sensor, which measures the activity of an object to be measured in a molten metal is used in such a way that a solid electrolyte, which is oxygen ion-conductive and an inorganic substance containing the oxide of an element identical to an element as an object to be measured, with which a subelectrode or the solid electrolyte is to be coated are combined or that a solid electrolyte, which contains the oxide of the element identical to the element as the object to be measured and which is oxygen ion-conductive is used. Then, on the basis of an electromotive force E detected by a sensor and on the basis of the temperature T of a liquid metal, the concentration [%M] of the element as the object to be measured is computed by an expression: log[%M]+C0 [%M]=C1 +C2 (E/T)+C3 /T-ΣCi[%X] (where C0 , C1 , C2 , C3 and Ci represent constant, and [%X] represents a solute element other tham a component M in the molten metal).
    • 4. 发明专利
    • METHOD FOR SAMPLING SPECIMEN OF MOLTEN STEEL IN REFINING FACILITY OF SPECIAL STEEL
    • JPH04346068A
    • 1992-12-01
    • JP14947491
    • 1991-05-24
    • KAWASO DENKI KOGYO
    • GOMYO KENICHI
    • G01N33/20
    • PURPOSE:To sample a coagulation specimen which is suited for analysis by an equipment by storing a denitriding agent in a sample specimen container and then allowing nitrogen within a welded steel to react with the denitrogen agent. CONSTITUTION:A denitriding agent is housed within a sample specimen container previously when sampling a special steel which is refined by blowing nitrogen gas in and then is dipped into the molten steel. Nitrogen within the molten steel which flew into the container reacts with a denitriding agent and then is fixed into a coagulated specimen as a nitrogen compound or is floated and separated. As a result, when the specimen is coagulated, only nitrogen below a saturation solubility exists and no cavity is formed within the specimen since no gas is generated. The denitriding agent uses one single substance or two or more complexes which are selected from Al, Ti, Zr, Tr, Hf, Si, V, Ce, Se, B, and Nb and a coagulated specimen which is suited for analysis of an equipment can be sampled by setting the amount of use to a value above 0.5wt.% and below 5wt.% for the weight of the sample.
    • 9. 发明专利
    • APPARATUS FOR MEASURING CONCENTRATION OF SILICON IN MOLTEN METAL
    • JPS63191056A
    • 1988-08-08
    • JP2335387
    • 1987-02-02
    • KAWASO DENKI KOGYO
    • GOMYO KENICHI
    • G01N27/416G01N27/27G01N27/411G01N33/20
    • PURPOSE:To stabilize the output of a sensor by eliminating the variation in silicon activity due to the variation in the amount of carbon in a molten metal specimen, by providing a carbon supply means to the circumference of a silicon sensor element. CONSTITUTION:A silicon sensor element 1, a molten metal electrode 6 and a thermometric element 8 are embedded and held in refractory cement 10. The silicon sensor element 1 is constituted by providing a reference electrode in a cylindrical body formed of a solid electrolyte 2 having oxygen ion conductivity and an auxiliary electrode having silicon oxide films mounted thereto in a spot form to the outer surface of the cylindrical body. Then, the silicon sensor element 1, the molten metal electrode 6 and the thermometric element 8 are surrounded by a partition body 15 provided with opening parts 16a, 16b. For example, by forming the partition body 15 from carbon graphite, carbon in the specimen stagnated in a molten metal stagnation chamber 17 can be brought to a saturated state and the variation in silicon activity due to the variation in the amount of carbon in the specimen can be eliminated.
    • 10. 发明专利
    • RADIATION-TEMPERATURE MEASURING METHOD
    • JPH10170344A
    • 1998-06-26
    • JP32882396
    • 1996-12-09
    • KAWASO DENKI KOGYOCHUGAI RO KOGYO KAISHA LTD
    • GOMYO KENICHIHIGASHIYAMA DAISUKETANABE MASAO
    • G01J5/60
    • PROBLEM TO BE SOLVED: To make it possible to measure a temperature with high accuracy in a wide temperature range by a method wherein the logarithmic value of an emissivity at every wavelength is expressed by the relational expression of a luminance temperature detected at every wavelength and the expression is set up simultaneously with the logarithmic expression of an emissivity which is expressed by Wien's expression and by Plank's second contact. SOLUTION: Luminance temperatures from beams of light of wavelengths λ1 , α2 , which are radiated from an object to be measured are designated as T1 , T2 , and emissivities at the wavelengths α1 , λ2 are designated as ε1 , ε2 . When a true temperature to be found is designated as T, the logarithm of an emissivity is expressed as Expression I by using Wien's expression of a thermal radiation (where C represents Plank's second constant). At this time, a logarithmic emissivity is expressed recursively as Expression II (where (i) represents 1 or 2, (j) represents the order of an expression such as Aj , Bj or the like, and C represents a constant). When the wavelength λ1 is fixed to, e.g. 1μm, the term of Bi or the like is a constant, and a multiple order expression about only a temperature is obtained as in Expression III (where C represents a constant). Expression I and Expression II are set up simultaneously, the value of (j) is changed to 1 or 2, and a temperature is found as a simple expression or a quadratic expression. Therefore, the temperature close to a true temperature can be measured in a wide range.