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1. 发明申请

WO2012151104A1 COMPLIANT CONTACT PLATE FOR USE IN TESTING INTEGRATED CIRCUITS 审中-公开
标题翻译：用于测试集成电路的合规接触板
公开(公告)号：WO2012151104A1
公开(公告)日：2012-11-08
申请号：PCT/US2012/035162
申请日：2012-04-26
申请人： JOHNSTECH INTERNATIONAL CORPORATION , ERDMAN, Joel N.
发明人： ERDMAN, Joel N.
IPC分类号： H01R13/64
CPC分类号： G01R1/0466
摘要： A floating or compliant plate test socket device and method is disclosed. Three primary components, a fixed frame 20 receives a floating or compliant plate 22, sit together atop a housing 24 which contains contact pins used for the electrical test of the DUT (device under test). In fixed plate 20 are bearings for reducing friction when the floating plate is driven downward by the DUT inserter. Embedded in sidewalls 40 are a plurality of vertical raceways 46 which receive bearings 48. The raceways are borings, which have gap in the boring, in the fixed plate sidewalls 40 with the boring center spaced from the sidewall sufficiently that part of the bore removes part of the sidewall but allows the ball bearings to partially protrude from the gap formed in the incomplete semicircular boarding without the bearings being able to freely escape.
摘要翻译：公开了浮动或柔性板测试插座装置和方法。三个主要部件，固定框架20接收浮动或柔性板22，它们位于壳体24的顶部，壳体24包含用于DUT（待测设备）的电气测试的接触销。固定板20是当浮动板被DUT插入器向下驱动时减小摩擦的轴承。嵌入在侧壁40中的是多个垂直滚道46，其接收轴承48.滚道是在固定板侧壁40中具有在钻孔中的间隙的钻孔，其中钻孔中心与侧壁充分间隔开，的侧壁，但是允许球轴承部分地从形成在不完全半圆形登机板上的间隙突出，而轴承能够自由地逸出。

2. 发明申请

WO2013059249A1 IMPROVED ELECTRICALLY CONDUCTIVE KELVIN CONTACTS FOR MICROCIRCUIT TESTER 审中-公开
标题翻译：用于微型测试仪的改进的导电电磁触头
公开(公告)号：WO2013059249A1
公开(公告)日：2013-04-25
申请号：PCT/US2012/060512
申请日：2012-10-17
申请人： JOHNSTECH INTERNATIONAL CORPORATION , ERDMAN, Joel N. , SHERRY, Jeffrey C. , MICHALKO, Gary W.
发明人： ERDMAN, Joel N. , SHERRY, Jeffrey C. , MICHALKO, Gary W.
IPC分类号： G01R31/02
CPC分类号： G01R1/0466
摘要： Terminals (2, 502) of a device under test (DUT) are connected to corresponding contact pads or leads by a series of electrically conductive contacts. Each terminal testing connects with both a "force" contact and a "sense" contact. In one embodiment, the sense contact (770) partially or completely laterally surrounds the force contact (700). In order to increase the contact surface, the force contact, in a spring pin (700) configuration contacts the device under test terminal at that portion of the lead which is curved or angled, rather than orthogonal to the pin.
摘要翻译：被测器件（DUT）的端子（2，502）通过一系列导电触点连接到相应的触点焊盘或引线。每个终端测试都与“强制”接触和“感觉”联系。在一个实施例中，感测触头（770）部分地或完全地横向围绕力接触件（700）。为了增加接触表面，弹簧销（700）构造中的力接触件在引线的弯曲或倾斜的部分处接触被测试端子，而不是与引脚正交。

3. 发明申请

WO2010123991A2 ELECTRICALLY CONDUCTIVE KELVIN CONTACTS FOR MICROCIRCUIT TESTER 审中-公开
标题翻译： MICROCIRCUIT测试仪的电导式KELVIN触点
公开(公告)号：WO2010123991A2
公开(公告)日：2010-10-28
申请号：PCT/US2010/031896
申请日：2010-04-21
申请人： JOHNSTECH INTERNATIONAL CORPORATION , ERDMAN, Joel N. , SHERRY, Jeffrey C. , MICHALKO, Gary W.
发明人： ERDMAN, Joel N. , SHERRY, Jeffrey C. , MICHALKO, Gary W.
IPC分类号： G01R31/02
CPC分类号： G01R1/067 , G01R1/0466 , G01R1/07378
摘要： Terminals of a device under test are connected to corresponding contact pads or leads by a series of electrically conductive contacts. Each terminal testing connects with both a "force" contact and a "sense" contact. In one embodiment, the sense contact partially or completely laterally surrounds the force contact, so that it need not have its own resiliency. The sense contact has a forked end with prongs that extend to opposite sides of the force contact. Alternatively, the sense contact surrounds the force contact and slides laterally to match a lateral translation component of a lateral cross-section of the force contact during longitudinal compression of the force contact. Alternatively, the sense contact includes rods that have ends on opposite sides of the force contact, and extend parallel.
摘要翻译：被测器件的端子通过一系列导电触点连接到对应的接触焊盘或引线。每个终端测试都与“强制”接触和“感觉”联系。在一个实施例中，感测触头部分或完全横向地围绕力接触，使得其不需要具有其自身的弹性。感觉触点具有分叉端部，其分叉延伸到力接触件的相对侧。或者，感测触头围绕力接触并且横向滑动以匹配力接触件的纵向压缩期间力接触件的横向横截面的横向平移部件。或者，感测触点包括在力接触的相对侧上具有端部并且平行延伸的杆。

4. 发明公开

EP2422205A2 ELECTRICALLY CONDUCTIVE KELVIN CONTACTS FOR MICROCIRCUIT TESTER 有权
标题翻译：电力高级KELVIN联系微电路测试器
公开(公告)号：EP2422205A2
公开(公告)日：2012-02-29
申请号：EP10767700.7
申请日：2010-04-21
申请人： JohnsTech International Corporation
发明人： ERDMAN, Joel N. , SHERRY, Jeffrey C. , MICHALKO, Gary W.
IPC分类号： G01R31/02
CPC分类号： G01R1/067 , G01R1/0466 , G01R1/07378
摘要： Terminals of a device under test are connected to corresponding contact pads or leads by a series of electrically conductive contacts. Each terminal testing connects with both a "force" contact and a "sense" contact. In one embodiment, the sense contact partially or completely laterally surrounds the force contact, so that it need not have its own resiliency. The sense contact has a forked end with prongs that extend to opposite sides of the force contact. Alternatively, the sense contact surrounds the force contact and slides laterally to match a lateral translation component of a lateral cross-section of the force contact during longitudinal compression of the force contact. Alternatively, the sense contact includes rods that have ends on opposite sides of the force contact, and extend parallel.

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