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    • 3. 发明授权
    • Temperature-adaptive capacitor block and temperature-compensated crystal oscillator using it
    • 使用温度自适应电容器块和温度补偿晶体振荡器
    • US06281761B1
    • 2001-08-28
    • US09570484
    • 2000-05-12
    • Hyung Cheol ShinHoi Jun YooMin Kyu JeSeung Ho Han
    • Hyung Cheol ShinHoi Jun YooMin Kyu JeSeung Ho Han
    • H01G438
    • H01L27/0629H03J2200/10H03L1/026
    • A temperature-adaptive capacitor array used in a TCXO so that the TCXO effectively conducts temperature-compensating in the resonant frequency without the non-monotonicity while a smaller silicon area is used in producing the capacitor array. A number of capacitor arrays allocated in two capacitor banks. Each of the capacitor arrays comprises two or more unit cells, and in turn each unit cell consists of a unit capacitor and a switching element, respectively. All of unit capacitors included in the capacitor arrays are connected each other through a decoder assembly to provide a crystal oscillator with a load capacitance. The unit capacitors belonging to one of the capacitor arrays have the same capacitance with each other. Two unit capacitors belonging to different capacitor arrays, however, have different capacitances from each other. The capacitance of the unit capacitors belonging to each capacitor array is set in consideration of control preciseness required in compensating a frequency deviation in the resonant frequency of the crystal oscillator as the temperature varies in at least a portion of a practical temperature range, within which the crystal oscillator operates.
    • 在TCXO中使用的温度自适应电容器阵列,使得TCXO在不产生非单调性的同时有效地进行谐振频率的温度补偿,而在制造电容器阵列时使用较小的硅面积。 分配在两个电容器组中的多个电容器阵列。 每个电容器阵列包括两个或更多个单元电池,并且依次分别由单位电容器和开关元件组成。 包括在电容器阵列中的所有单位电容器通过解码器组件彼此连接,以提供具有负载电容的晶体振荡器。 属于电容器阵列之一的单位电容器具有彼此相同的电容。 然而,属于不同电容器阵列的两个单位电容器具有彼此不同的电容。 考虑到在实际温度范围的至少一部分温度变化时补偿晶体振荡器的谐振频率的频率偏差所需的控制精度来设定属于每个电容器阵列的单位电容器的电容,其中 晶振操作。
    • 4. 发明申请
    • Method for determining physical properties of a multilayered periodic structure
    • 用于确定多层周期结构的物理性质的方法
    • US20080297770A1
    • 2008-12-04
    • US12070717
    • 2008-02-20
    • Young Dong KimJin Mo ChungSeung Ho Han
    • Young Dong KimJin Mo ChungSeung Ho Han
    • G01N21/00
    • G01N21/95607G01N2021/95615
    • There is provided a method of calculating physical properties of a periodic structure. At least one physical property related to reflectivity or transmittance of a periodic structure is measured, and then, at least one physical property related to reflectivity or transmittance of a virtual periodic structure is calculated to obtain corresponding physical properties from the virtual periodic structure. The at least one calculated physical property is compared with the at least one measured physical property. When the virtual periodic structure is horizontally divided into a plurality of layers, at least three substances can have horizontally repeated periods in the middle layers of the divided structure. In accordance with an embodiment of the present invention, the microscopic formation of the periodic structure including a native oxide layer formed on the periodic structure or an intentionally formed surface coating layer thereon can be nondestructively and accurately tested.
    • 提供了计算周期性结构的物理性质的方法。 测量与周期性结构的反射率或透射率有关的至少一个物理性质,然后计算与虚拟周期结构的反射率或透射率相关的至少一个物理性质,以从虚拟周期性结构获得相应的物理性质。 将所述至少一个计算的物理性质与所述至少一个测量的物理性质进行比较。 当虚拟周期结构被水平分割成多个层时,至少三个物质可以在分割结构的中间层中具有水平重复的周期。 根据本发明的实施例,可以非破坏性地和精确地测试包括在周期性结构上形成的自然氧化物层或其上有意形成的表面涂层的周期性结构的微观形成。
    • 5. 发明授权
    • Method for determining physical properties of a multilayered periodic structure
    • 用于确定多层周期结构的物理性质的方法
    • US07599072B2
    • 2009-10-06
    • US12070717
    • 2008-02-20
    • Young Dong KimJin Mo ChungSeung Ho Han
    • Young Dong KimJin Mo ChungSeung Ho Han
    • G01B11/24G01N21/55
    • G01N21/95607G01N2021/95615
    • There is provided a method of calculating physical properties of a periodic structure. At least one physical property related to reflectivity or transmittance of a periodic structure is measured, and then, at least one physical property related to reflectivity or transmittance of a virtual periodic structure is calculated to obtain corresponding physical properties from the virtual periodic structure. The at least one calculated physical property is compared with the at least one measured physical property. When the virtual periodic structure is horizontally divided into a plurality of layers, at least three substances can have horizontally repeated periods in the middle layers of the divided structure. In accordance with an embodiment of the present invention, the microscopic formation of the periodic structure including a native oxide layer formed on the periodic structure or an intentionally formed surface coating layer thereon can be nondestructively and accurately tested.
    • 提供了计算周期性结构的物理性质的方法。 测量与周期性结构的反射率或透射率有关的至少一个物理性质,然后计算与虚拟周期结构的反射率或透射率相关的至少一个物理性质,以从虚拟周期性结构获得相应的物理性质。 将所述至少一个计算的物理性质与所述至少一个测量的物理性质进行比较。 当虚拟周期结构被水平分割成多个层时,至少三个物质可以在分割结构的中间层中具有水平重复的周期。 根据本发明的实施例,可以非破坏性地和精确地测试包括在周期性结构上形成的自然氧化物层或其上有意形成的表面涂层的周期性结构的微观形成。