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    • 1. 发明授权
    • Secondary working apparatus
    • 二次加工设备
    • US4479294A
    • 1984-10-30
    • US388135
    • 1982-06-14
    • Hironobu SekimotoNorio Sato
    • Hironobu SekimotoNorio Sato
    • B21H5/00B23F19/00B23F19/10B23F23/12B23P15/14B23F19/06
    • B23F19/00B23F19/10B23F23/1237Y10T29/49471Y10T409/101113Y10T409/101272Y10T409/107632
    • A secondary working apparatus for secondarily machining a blank preliminarily formed with internal serrations, splines or teeth on a cylindrical plane, comprising a stationary housing structure, support means for supporting the blank with the center axis of the cylindrical plane fixed with respect to the housing structure, a plurality of shafts each having a center axis parallel with the center axis of the cylindrical plane and rotatable with respect to the housing structure about an axis coincident with the center axis of the shaft and an axis coincident with the center axis of the cylindrical plane, each of the shafts having a cylindrical eccentric axial portion having a center axis parallel with and radially offset from the center axis of the shaft, and generally cylindrical machining tools coaxially carried on the eccentric axial portions of the shafts, respectively, and each having a center axis coincident with the center axis of the eccentric axial portion of each of the shafts, the machining tools including at least one finishing tool formed with external serrations to be in mesh with the internal serrations of the blank, and a deburring tool having surface portions engageable with crest face portions of the internal serrations of the blank.
    • 一种二次加工装置,用于二次加工在圆柱形平面上预先形成有内部锯齿,花键或齿的坯料,其包括固定的壳体结构,用于支撑坯料的支撑装置,其中圆柱形平面的中心轴线相对于壳体结构固定 多个轴,每个轴具有平行于所述圆柱形平面的中心轴线的中心轴线,并且可相对于所述壳体结构围绕与所述轴线的中心轴线重合的轴线和与所述圆柱形平面的中心轴线重合的轴线旋转 每个轴具有圆柱形的偏心轴向部分,其中心轴线平行于轴的中心轴线并且径向偏离轴的中心轴线,并且大致圆柱形的加工工具分别同轴地承载在轴的偏心轴向部分上,并且每个具有 中心轴与每个轴的偏心轴向部分的中心轴线重合, 所述加工工具包括至少一个精加工工具,其形成有与所述坯件的内部锯齿状啮合的外部锯齿,以及具有可与所述坯件的内部锯齿的顶部部分接合的表面部分的去毛刺工具。
    • 2. 发明授权
    • Secondary working apparatus
    • 二次加工设备
    • US4483055A
    • 1984-11-20
    • US388134
    • 1982-06-14
    • Hironobu SekimotoNorio Sato
    • Hironobu SekimotoNorio Sato
    • B21H5/00B23F19/00B23F23/06B23F23/12B23P15/14B23F19/06
    • B23F19/00B23F23/06B23F23/1237Y10T29/49471Y10T409/101113Y10T409/107632
    • A secondary working apparatus for secondarily machining a blank formed with internal serrations on a cylindrical plane, comprising a stationary housing structure, support means for supporting the blank with the center axis of the cylindrical plane fixed with respect to the housing structure, a plurality of shafts each having a center axis parallel with the center axis of the cylindrical plane and rotatable with respect to the housing structure about an axis coincident with the center axis of the shaft and an axis coincident with the center axis of the cylindrical plane, each of the shafts having a cylindrical eccentric axial portion having a center axis parallel with and radially offset from the center axis of the shaft, cylindrical machining tools coaxially carried on the eccentric axial portions of the shafts, respectively, and each having a center axis coincident with the center axis of the eccentric axial portion of each of the shafts, and an annular guide gear coaxially held in position about the center axis of the cylindrical plane and formed with internal teeth to be held in mesh with the internal serrations of the blank, the internal teeth being equal in number to the internal serrations of the blank and being cut with outwardly shifted tooth profiles, the guide gear being preferably constructed of highly elastic metal, such as spring steel.
    • 一种二次加工装置,用于二次加工在圆柱形平面上形成有内部锯齿的坯料,包括固定的壳体结构,用于支撑坯料的支撑装置,其中圆柱形平面的中心轴线相对于壳体结构固定;多个轴 每个轴具有与圆柱形平面的中心轴线平行的中心轴线,并且可相对于壳体结构围绕与轴的中心轴线重合的轴线和与圆柱形平面的中心轴线重合的轴线旋转,每个轴 具有与轴的中心轴平行且径向偏离的中心轴线的圆柱形偏心轴向部分,圆柱形加工工具分别同轴地承载在轴的偏心轴向部分上,每个具有与中心轴线重合的中心轴线 每个轴的偏心轴向部分和同轴地保持在po中的环形引导齿轮 围绕圆柱形平面的中心轴线形成并形成有内齿与坯料的内部锯齿状啮合的内齿,内齿的数量与坯料的内部锯齿相同,并且以向外移动的齿廓切割, 导向齿轮优选地由诸如弹簧钢的高弹性金属构成。
    • 3. 发明申请
    • CHARGED PARTICLE MICROSCOPE AND MEASUREMENT IMAGE CORRECTION METHOD THEREOF
    • 充电颗粒显微镜及其测量图像校正方法
    • US20130300854A1
    • 2013-11-14
    • US13981326
    • 2011-11-02
    • Shuangqi DongNorio SatoSusumu Koyama
    • Shuangqi DongNorio SatoSusumu Koyama
    • H04N5/217
    • H04N5/217H01J37/222H01J37/26H01J2237/153
    • A charged particle microscope corrects distortion in an image caused by effects of drift in the sampling stage by measuring the correction reference image in a shorter time than the observation image, making corrections by comparing the shape of the observation image with the shape of the correction reference image, and reducing distortion in the observation images. The reference image for distortion correction is measured at the same position and magnification as when acquiring images for observation. In order to reduce effects from drift, the reference image is at this time measured within a shorter time than the essential observation image. The shape of the observation image is corrected by comparing the shapes of the reference image and observation image, and correcting the shape of the observation image to match the reference image.
    • 带电粒子显微镜通过在比观察图像更短的时间内测量校正参考图像来校正由采样阶段的漂移效应引起的图像中的失真,通过将观察图像的形状与校正基准的形状进行比较来进行校正 图像,减少观察图像的失真。 与获取观察图像时相同的位置和倍率测量用于失真校正的参考图像。 为了减少漂移的影响,此时在比基本观察图像更短的时间内测量参考图像。 通过比较参考图像和观察图像的形状以及校正观察图像的形状以匹配参考图像来校正观察图像的形状。
    • 4. 发明申请
    • SEMICONDUCTOR WAFER TESTING APPARATUS
    • 半导体测试仪器
    • US20110279143A1
    • 2011-11-17
    • US13133970
    • 2009-09-18
    • Tadanobu TobaKatsunori HiranoNorio SatoMasahiro Ohashi
    • Tadanobu TobaKatsunori HiranoNorio SatoMasahiro Ohashi
    • G01R31/26
    • G01B15/00G01R31/307H01L22/12
    • Disclosed is a semiconductor wafer testing apparatus that resolves the following problems which arise when semiconductor wafers become larger: (1) complexity of stage acceleration/deceleration control; (2) throughput reduction; and (3) increased vibration of the stage support platform during the stage inversion operation (deterioration in resolution). In the semiconductor wafer testing apparatus for resolving these problems, a wafer is rotated, an electro beam is irradiated onto the rotating wafer from a scanning electron microscope, and secondary electrons emitted from the wafer are detected. The detected secondary electrons are A/D converted by an image processing unit, realigned by an image data realignment unit, and then image-processed for display. As a result, image information of all dies of a wafer can be acquired without a large amount of movement of the stage in the X and the Y directions.
    • 公开了一种半导体晶片测试装置,其解决了当半导体晶片变大时出现的以下问题:(1)阶段加速/减速控制的复杂性; (2)吞吐量减少; 和(3)在舞台反转操作期间舞台支撑平台的振动增加(分辨率降低)。 在用于解决这些问题的半导体晶片测试装置中,旋转晶片,电子束从扫描电子显微镜照射到旋转晶片上,并且检测从晶片发射的二次电子。 所检测的二次电子被图像处理单元进行A / D转换,由图像数据重新对准单元重新对准,然后进行图像处理以进行显示。 结果,可以获得晶片的所有管芯的图像信息,而不需要在X和Y方向上的台的大量移动。
    • 6. 发明授权
    • Step zoom lens camera
    • US06493512B2
    • 2002-12-10
    • US09941642
    • 2001-08-30
    • Norio Sato
    • Norio Sato
    • G03B1700
    • G03B17/00
    • A step zoom lens camera includes a rotatable cam ring, a cam groove formed on the cam ring, including step areas, a linear movement member which is connected to the cam ring, and a cam-guided lens group which is guided by the linear movement member to move linearly in the optical axis direction in accordance with the cam groove so as to move to an in-focus position of an object within each step area of the cam groove. The cam ring is provided on the rear end surface thereof with step area indicating indexes representing the corresponding step areas. The linear movement member is provided with a reference index at a predetermined circumferential position thereof, so that the position of use of the cam groove can be visually confirmed by viewing the position of the step area indicating indexes relative to the reference index.
    • 9. 发明授权
    • Clutch apparatus for zoom lens barrel
    • 变焦镜筒离合器
    • US5701208A
    • 1997-12-23
    • US540539
    • 1995-10-06
    • Norio SatoHitoshi Tanaka
    • Norio SatoHitoshi Tanaka
    • G02B7/04G02B7/10G02B7/02
    • G02B7/10
    • A driving apparatus for a zoom lens barrel has a driving ring for moving a lens system and a mechanism for movably supporting the driving ring for movement along an optical axis of the lens system. A gear train is supported by the supporting mechanism, a power source is provided in a camera body, and a mechanism for transmitting torque generated by the power source to the driving ring is provided. The torque transmitting mechanism includes the gear train, and a mechanism for disconnecting the torque transmission path from the power source to the driving ring if a torque above a predetermined value is applied to the driving ring. The disconnection mechanism is disposed in the gear train and is supported by the supporting mechanism.
    • 用于变焦镜头的驱动装置具有用于移动透镜系统的驱动环和用于可移动地支撑驱动环以沿着透镜系统的光轴移动的机构。 齿轮系被支撑机构支撑,电源设置在照相机主体中,并且设置有用于将由电源产生的扭矩传递到驱动环的机构。 扭矩传递机构包括齿轮系,以及用于如果将高于预定值的扭矩施加到驱动环上,则将扭矩传递路径从动力源驱动到驱动环的机构。 断路机构设置在齿轮系中,由支承机构支承。