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    • 5. 发明授权
    • Method and apparatus for electrical test of CMOS pixel sensor arrays
    • CMOS像素传感器阵列的电气测试方法和装置
    • US6118482A
    • 2000-09-12
    • US986499
    • 1997-12-08
    • Lawrence T. ClarkMark A. BeileyEric J. Hoffman
    • Lawrence T. ClarkMark A. BeileyEric J. Hoffman
    • H04N5/367H04N17/00H04N5/335
    • H04N5/367H04N17/002
    • CMOS pixel sensors have been of interest as replacements for CCD's in imaging applications. Such devices promise lower power and simpler system level design through fewer power supply voltages and higher functional integration. It is difficult and cost ineffective to utilize images to test active pixel sensors. Here, a method and apparatus for electrical testing of CMOS pixel sensors is described which involves electrically writing a pattern into the CMOS pixel sensors for the detection of adjacent cell shorts or stuck at faults as well as verification of read-channel circuit functionality and performance. The invention provides for an electrical testing of CMOS pixel array that is simple, time efficient and cost effective for use in, for example, production.
    • 作为CCD成像应用中的替代品,CMOS像素传感器已经成为关注的焦点。 这样的器件通过更少的电源电压和更高的功能集成来承诺更低的功率和更简单的系统级设计。 利用图像测试有源像素传感器是困难和成本无效的。 这里描述了用于CMOS像素传感器的电测试的方法和装置,其涉及将图案电学写入CMOS像素传感器,用于检测相邻单元短路或卡在故障以及读通道电路功能和性能的验证。 本发明提供了CMOS像素阵列的电气测试,其简单,时间高效并且在例如生产中使用成本有效。