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    • 2. 发明申请
    • METHOD FOR CONTACTLESS CAPACITIVE THICKNESS MEASUREMENTS
    • 无接触电容厚度测量方法
    • WO2009027037A1
    • 2009-03-05
    • PCT/EP2008/006811
    • 2008-08-19
    • PLAST-CONTROL GMBHKONERMANN, StefanSTEIN, Markus
    • KONERMANN, StefanSTEIN, Markus
    • G01B7/06
    • G01B7/087
    • A method for contactless capacitive thickness measurement of a flat material (10) that is placed in the fringe field (32) of a capacitor (C1, C2), with simultaneous measurement of the width L of an air gap (16) between the flat material and the capacitor plates, characterised in that the capacities g L , k L of two capacitors (C1, C2) are measured whose fringe fields (32) decay at different rates towards the flat material (10), and in that both, the thickness D of the flat material (10) and the width L of the air gap (16) are determined on the basis of the condition that, for each capacitor (C1, C2), the measured capacity g L , k L is equal to the integral of the capacity gradient g', k' over the thickness of the flat material (10).
    • 一种放置在电容器(C1,C2)的边缘区域(32)中的扁平材料(10)的非接触电容厚度测量方法,同时测量平坦的空气间隙(16)的宽度L 材料和电容器板,其特征在于测量两个电容器(C1,C2)的电容gL,kL,其边缘区域(32)以不同的速率朝着平坦材料(10)衰减,并且其中厚度D 根据对于每个电容器(C1,C2)的条件,确定平坦材料(10)的宽度L和气隙(16)的宽度L,测量的容量gL,kL等于 容量梯度g',k'超过扁平材料(10)的厚度。