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    • 1. 发明申请
    • Detection of macromolecular complexes with harmonic cantilevers
    • 检测具有谐波悬臂的大分子复合物
    • US20100120023A1
    • 2010-05-13
    • US11404181
    • 2006-04-13
    • Ozgur SahinCalvin F. QuateOlav Solgaard
    • Ozgur SahinCalvin F. QuateOlav Solgaard
    • C12Q1/68G01N33/566G01N33/553G01N33/552G01N33/544
    • G01Q60/34
    • Method and apparatus which uses harmonic cantilevers, such as used in atomic force microscopy, to detect variations in the attractive and repulsive forces on a solid surface as a result of macromolecular binding, for example, hybridization of a single stranded DNA molecule attached to the surface with another DNA molecule. The complexed macromolecule is less flexible than an uncomplexed molecule. It will typically have more negative charge due to amino acids or DNA monomers. Both stiffness of the surface and the attractive capillary forces will change after binding and may be detected. By scanning the harmonic cantilever across a surface with macromolecules attached in tapping-mode and by recording the signals at the high frequency vibrations provided by harmonic cantilever, complexed molecules on a surface may be identified and quantified.
    • 使用诸如用于原子力显微镜的谐波悬臂的方法和装置来检测由于大分子结合而导致的固体表面上的吸引力和排斥力的变化,例如附着在表面上的单链DNA分子的杂交 与另一个DNA分子。 络合的大分子比未复合的分子灵活性低。 由于氨基酸或DNA单体,它通常会具有更多的负电荷。 表面的刚度和吸引的毛细管力将在结合后改变并且可以被检测。 通过用分接模式连接的大分子扫描谐波悬臂,并通过在由谐波悬臂提供的高频振动下记录信号,可以识别和量化表面上的复合分子。
    • 2. 发明授权
    • Harmonic cantilevers and imaging methods for atomic force microscopy
    • 用于原子力显微镜的谐波悬臂和成像方法
    • US07451638B1
    • 2008-11-18
    • US11187991
    • 2005-07-22
    • Ozgur SahinAbdullah AtalarCalvin F. QuateOlav Solgaard
    • Ozgur SahinAbdullah AtalarCalvin F. QuateOlav Solgaard
    • H01J37/00
    • G01Q60/38G01Q60/34G01Q70/10Y10S977/873
    • A harmonic cantilever for use in an atomic force microscope includes a cantilever arm and a probe tip. The cantilever arm has a shape selected to tune the fundamental resonance frequency or a resonance frequency of a selected higher order mode so that the fundamental and higher-order resonance frequencies have an integer ratio or near integer ratio. In one embodiment, the cantilever arm can be shaped to tune the fundamental resonance frequency. Alternately, the cantilever arm can include a geometric feature for tuning the resonance frequency of the fundamental mode or the selected higher order mode. An imaging method using the harmonic cantilever is disclosed whereby signals at the higher harmonics are measured to determine the material properties of a sample. In other embodiment, a cantilever includes a probe tip positioned at a location of minimum displacement of unwanted harmonics for suppressing signals associated with the unwanted harmonics.
    • 用于原子力显微镜的谐波悬臂包括悬臂和探针尖。 悬臂臂具有选择的形状来调谐基本共振频率或所选高阶模式的谐振频率,使得基波和高次谐振频率具有整数比或接近整数比。 在一个实施例中,悬臂可以成形为调谐基本共振频率。 或者,悬臂可以包括用于调谐基本模式或选择的较高阶模式的谐振频率的几何特征。 公开了使用谐波悬臂的成像方法,其中测量高次谐波的信号以确定样品的材料性质。 在另一个实施例中,悬臂包括位于最小位移处的不需要的谐波的探针尖端,用于抑制与不需要的谐波相关联的信号。
    • 3. 发明授权
    • Torsional harmonic cantilevers for detection of high frequency force components in atomic force microscopy
    • 用于在原子力显微镜检测高频力分量的扭转谐波悬臂
    • US07302833B2
    • 2007-12-04
    • US11456810
    • 2006-07-11
    • Ozgur SahinCalvin F. QuateOlav Solgaard
    • Ozgur SahinCalvin F. QuateOlav Solgaard
    • G01B5/28G01N13/10G12B21/08G12B21/22
    • G01Q60/38G01Q60/34
    • A method for measuring high frequency force of interaction between a tip of a cantilever and a sample includes providing a cantilever having a cantilever arm and a probe tip formed on a free end of the cantilever arm where the cantilever arm has a first shape and an axis of torsion associated with the first shape and the probe tip is positioned in an offset displacement from the axis of torsion, vibrating the cantilever at or near the fundamental flexural resonance frequency with a predetermined oscillation amplitude, bringing the cantilever to the vicinity of the sample, tapping the surface of the sample repeatedly using the probe tip, and detecting changes in the amplitude or the phase of a high frequency vibration harmonic of the cantilever as the cantilever is deflected in response to features on the surface of the sample.
    • 用于测量悬臂的尖端和样品之间的高频力的相互作用的方法包括提供悬臂,悬臂具有悬臂和形成在悬臂的自由端上的探针尖,其中悬臂具有第一形状和轴 与第一形状和探针尖端相关联的扭转位于与扭转轴线偏移的位置,以预定的振荡幅度在基本弯曲共振频率处或附近振动悬臂,使悬臂到达样本附近, 使用探针尖端重复使用样品的表面,并且响应于样品表面上的特征,当悬臂被偏转时,检测悬臂的高频振动谐波的振幅或相位的变化。
    • 4. 发明授权
    • Torsional harmonic cantilevers for detection of high frequency force components in atomic force microscopy
    • 用于在原子力显微镜检测高频力分量的扭转谐波悬臂
    • US07089787B2
    • 2006-08-15
    • US10887608
    • 2004-07-08
    • Ozgur SahinCalvin F. QuateOlav Solgaard
    • Ozgur SahinCalvin F. QuateOlav Solgaard
    • G01B5/28G01N13/16G12B21/08
    • G01Q60/38G01Q60/34
    • A cantilever for the use in atomic force microscopy includes a cantilever arm having a fixed end being attached to a base member and a free end where the cantilever arm has a first shape and an axis of torsion associated with the first shape, and a probe tip projecting from the cantilever arm near the free end where the probe tip is positioned in an offset displacement from the axis of torsion. Alternately, the cantilever arm has a first shape selected to tune a torsional resonance frequency of a selected torsional mode or the fundamental flexural resonance frequency of the fundamental mode so that the torsional resonance frequency and the fundamental flexural resonance frequency has an integer ratio. In this manner, the torsional motion of the torsional harmonic cantilever at that harmonic frequency will be largely enhanced by the corresponding torsional resonance.
    • 在原子力显微镜中使用的悬臂包括悬臂,其具有附接到基部构件的固定端和悬臂具有与第一形状相关联的第一形状和扭转轴线的自由端,以及探针尖端 从探针尖端位于与扭转轴线偏移位置的自由端附近的悬臂臂突出。 或者,悬臂臂具有选择的第一形状,以调节所选扭转模式的扭转共振频率或基模的基本弯曲共振频率,使得扭转共振频率和基本弯曲共振频率具有整数比。 以这种方式,在谐波频率下的扭转谐波悬臂的扭转运动将通过相应的扭转共振大大增强。
    • 6. 发明授权
    • Scanning probe potentiometer
    • 扫描探头电位器
    • US6002131A
    • 1999-12-14
    • US47887
    • 1998-03-25
    • Scott R. ManalisStephen C. MinneCalvin F. Quate
    • Scott R. ManalisStephen C. MinneCalvin F. Quate
    • C25F3/00G01N27/24G01Q10/00G01Q30/14G01Q70/16G01R31/308G01R29/12
    • G01Q60/60G01N27/24B82Y35/00Y10S977/854
    • A system for scanning and measuring a surface charge of a sample immersed in a conductive medium, such as an aqueous electrolytic solution or a gel, or positioned on a conducting plate. The system has a semiconductor with a probing surface clad in a charge-sensitive layer. The probing surface moves over the sample during scanning while a bias voltage V.sub.BIAS is applied to create a depletion layer in the semiconductor and to induce the system to alter a measurable electrical property. The electrical property is monitored with the aid of a measuring device and the measurement is correlated to the sample's surface charge. In a preferred embodiment the semiconductor is a part of a cantilever structure of the type having a probing tip and the probing surface is located on the apex of the probing tip thereby enabling examination of the topology and surface charge of the sample concurrently.
    • 一种用于扫描和测量浸渍在诸如电解质水溶液或凝胶的导电介质中的样品的表面电荷或定位在导电板上的系统。 该系统具有包含在电荷敏感层中的探测表面的半导体。 探测表面在扫描期间移动到样品上方,同时施加偏置电压VBIAS以在半导体中产生耗尽层并诱导系统改变可测量的电性能。 借助于测量装置监测电气特性,测量与样品的表面电荷相关。 在优选实施例中,半导体是具有探测尖端的类型的悬臂结构的一部分,并且探测表面位于探测尖端的顶点上,从而能够同时检查样品的拓扑和表面电荷。