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    • 1. 发明申请
    • IMAGING OPTICAL SYSTEM FOR MICROLITHOGRAPHY
    • 成像光学系统
    • WO2012041459A2
    • 2012-04-05
    • PCT/EP2011/004744
    • 2011-09-22
    • CARL ZEISS SMT GMBHROGALSKY, OlafSCHNEIDER, SonjaBITTNER, BorisKUGLER, JensGELLRICH, BernhardFREIMANN, Rolf
    • ROGALSKY, OlafSCHNEIDER, SonjaBITTNER, BorisKUGLER, JensGELLRICH, BernhardFREIMANN, Rolf
    • G03F7/20
    • G02B17/06G02B17/0663G02B27/0012G03F7/70258G03F7/70308G03F7/70891
    • An imaging optical system (10), in particular a projection objective, for microlithography, comprises optical elements (M1-M6) configured to guide electromagnetic radiation (19) with a wavelength λ in an imaging beam path for imaging an object field (13) into an image plane (14), and a pupil (24), having coordinates (p, q) which, together with the image field (16), having coordinates (x, y), of the optical system (10), spans an extended 4-dimensional pupil space, having coordinates (x, y, p, q) as a function of which a wavefront W(x, y, p, q) of the radiation (19) passing through the optical system is defined. At least a first of the optical elements (M1-M6) has a non-rotationally symmetrical surface (26) having a respective surface deviation in relation to every rotationally symmetrical surface (28), which two-dimensional surface has a difference between its greatest elevation and its deepest valley of at least λ. A sub-aperture ratio of the non- rotationally symmetrical surface deviates at every point (Ο 1 , O 2 ) of the object field (13) by at least 0.01 from the sub-aperture ratio of every other surface of the optical elements, which is located in the imaging beam path, at the respective point (O 1 , O 2 ) of the object field (13). Furthermore, the surface (26) of the first optical element (M4) is configured such that by displacing the first optical element relative to the other optical elements a change to the wavefront of the optical system (10) can be brought about which has a portion with at least 2-fold symmetry, the maximum value of the wavefront change in the extended 4- dimensional pupil space being at least 1 x 10 -5 of the wavelength λ.
    • 用于微光刻的成像光学系统(10),特别是投影物镜,包括被配置为在成像光束路径中引导具有波长λ的电磁辐射(19)的光学元件(M1-M6) 用于将物场(13)成像到图像平面(14)中,以及瞳孔(24),其具有与图像场(16)一起具有坐标(x,y)的坐标(p,q), 光学系统(10)跨越具有坐标(x,y,p,q)的扩展的4维光瞳空间,其作为辐射(19)的波前W(x,y,p,q) 通过光学系统的定义。 至少第一光学元件(M1-M6)具有相对于每个旋转对称表面(28)具有各自的表面偏差的非旋转对称表面(26),该二维表面具有其最大值 海拔及其最深的谷至少为λ。 非旋转对称表面的子孔径比在物场(13)的每个点(0 1,0 2,0 2)处偏离至少0.01 位于成像光束路径中的光学元件的每个其他表面的子孔径比在物体的各个点(0 1,0 2,2) 字段(13)。 此外,第一光学元件(M4)的表面(26)被配置为使得通过相对于其他光学元件移位第一光学元件,可以实现对光学系统(10)的波前的改变,其具有 部分具有至少2倍对称性,扩展的四维光瞳空间中波前变化的最大值至少为波长λ的1×10-5。