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    • 2. 发明专利
    • High throughput sem tool
    • 高通量扫描仪刀具
    • JP2013232422A
    • 2013-11-14
    • JP2013125732
    • 2013-06-14
    • Applied Materials Israel Ltdアプライド マテリアルズ イスラエル リミテッド
    • GILAD ALMOGYAVISHAI BARTOVJUERGEN FROSIENPAVEL ADAMECHELMUT BANZHOF
    • H01J37/28H01L21/66
    • H01J37/05H01J37/10H01J37/147H01J37/28H01J2237/0635H01J2237/1508H01J2237/2449H01J2237/2817
    • PROBLEM TO BE SOLVED: To provide a multi-beam scanning type electron beam device.SOLUTION: A multi-beam scanning type electron beam device having a column comprises: a multi-beam emitter for emitting plural electron beams; at least one common electron beam optical element having a common aperture for at least two of the plural electron beams and constituted to commonly act on at least two of the plural electron beams; at least one individual electron beam optical element for individually acting on the plural electron beams; a common objective lens assembly for converging the plural electron beams having common magnetization for converging at least two of the plural electron beams, and constituted to converge the plural electron beams on a specimen for generating plural signal beams; and a detection assembly for individually detecting each signal beam on a corresponding detection element.
    • 要解决的问题:提供一种多光束扫描型电子束装置。解决方案:具有列的多光束扫描型电子束装置包括:用于发射多个电子束的多光束发射器; 至少一个共用电子束光学元件具有用于所述多个电子束中的至少两个的公共孔,并且被构造成共同作用于所述多个电子束中的至少两个; 至少一个单独的电子束光学元件,用于单独地作用在所述多个电子束上; 用于会聚具有用于会聚多个电子束中的至少两个的共同磁化的多个电子束的公共物镜组件,并且被构造成将多个电子束会聚在用于产生多个信号光束的样本上; 以及检测组件,用于单独地检测相应的检测元件上的每个信号光束。