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1. 发明授权

US09109869B2 Interferometer and fourier-transform spectroscopic analyzer 有权
标题翻译：干涉仪和傅立叶变换光谱分析仪
公开(公告)号：US09109869B2
公开(公告)日：2015-08-18
申请号：US13881562
申请日：2011-09-06
申请人： Yusuke Hirao
发明人： Yusuke Hirao
IPC分类号： G01B11/02 , G01B9/02 , G01J3/453
CPC分类号： G01B9/02061 , G01J3/4535
摘要： An interferometer (1) measures a measuring interference beam, while detecting the position of a moving mirror (16) on the basis of detection results obtained from a reference beam detector (25). In the interferometer, a reference beam source (21) is configured by including a light source (21a) composed of a semiconductor laser device. A reference optical system (20) has a collimating optical system (22) for a reference beam, said collimating optical system converting a laser beam outputted from the reference beam source (21) into a collimated beam, and the collimated beam is diagonally inputted to a fixed mirror (15).
摘要翻译：干涉仪（1）基于从参考光束检测器（25）获得的检测结果来检测移动镜（16）的位置，测量测量干涉光束。在干涉仪中，通过包括由半导体激光装置构成的光源（21a）构成参考光束源（21）。参考光学系统（20）具有用于参考光束的准直光学系统（22），所述准直光学系统将从参考光束源（21）输出的激光束转换为准直光束，并且准直光束被对角地输入到固定镜（15）。

2. 发明申请

US20140152993A1 INTERFEROMETER AND SPECTROMETER INCLUDING SAME 有权
标题翻译：干涉仪和测光仪包括相同
公开(公告)号：US20140152993A1
公开(公告)日：2014-06-05
申请号：US14131828
申请日：2012-06-14
申请人： Yusuke Hirao
发明人： Yusuke Hirao
IPC分类号： G01J3/453 , G01J9/02
CPC分类号： G01J3/4532 , G01J3/027 , G01J3/0289 , G01J3/45 , G01J3/4535 , G01J9/02
摘要： An optical path of measurement light emitted from a measurement light source is overlaid by a beam combiner on an optical path of reference light emitted from a reference light source. The measurement light emitted from the measurement light source includes light in the sensitivity wavelength range (S1) of a measurement light detector and light in the sensitivity wavelength range (S2) of a reference light detector. An interferometer includes a wavelength separation filter that cuts light in at least a part of the sensitivity wavelength range (S2) of the reference light detector, of light included in the wavelength range of the measurement light.
摘要翻译：从测量光源发射的测量光的光路由从参考光源发射的参考光的光路上的光束组合器重叠。从测量光源发射的测量光包括测量光检测器的灵敏度波长范围（S1）中的光和参考光检测器的灵敏度波长范围（S2）中的光。干涉仪包括：波长分离滤光器，其在包括在测量光的波长范围内的光中，在参考光检测器的灵敏度波长范围（S2）的至少一部分上切割光。

3. 发明授权

US08068291B2 Imaging lens, imaging device, portable terminal, and method for manufacturing imaging lens 有权
标题翻译：成像透镜，成像装置，便携式终端以及用于制造成像透镜的方法
公开(公告)号：US08068291B2
公开(公告)日：2011-11-29
申请号：US12520903
申请日：2008-02-19
申请人： Yusuke Hirao , Keiji Matsusaka
发明人： Yusuke Hirao , Keiji Matsusaka
IPC分类号： G02B9/04 , G02B3/02
CPC分类号： G02B13/0025 , B82Y20/00 , G02B7/028 , G02B13/003 , G02B13/0035 , G02B13/006 , G02B13/0085 , Y10T29/49826 , Y10T156/1052
摘要： An imaging lens (LN) includes one or two lens blocks (BK), and an aperture stop (ape). The lens block (BK) includes a plane-parallel lens substrate (LS) and a lens (L) formed of different materials. In the imaging lens (LN), a first lens block (BK1) disposed at the most object-side exerts a positive optical power, and a conditional formula defined by the absolute difference between the index of refraction of a first lens substrate (LS1) and the index of refraction of a lens (L[LS1o]) contiguous with an object-side substrate surface of the first lens substrate (LS) is fulfilled.
摘要翻译：成像透镜（LN）包括一个或两个透镜块（BK）和孔径光阑（ape）。透镜块（BK）包括平面平行透镜基板（LS）和由不同材料形成的透镜（L）。在成像透镜（LN）中，设置在最物体侧的第一透镜块（BK1）施加正光焦度，并且由第一透镜基板（LS1）的折射率之间的绝对差定义的条件公式，并且满足与第一透镜基板（LS）的物体侧基板表面相邻的透镜（L [LS1o]）的折射率。

4. 发明申请

US20110013070A1 LENS UNIT, IMAGE CAPTURING LENS, IMAGE CAPTURING DEVICE AND PORTABLE TERMINAL 有权
标题翻译：镜头单元，图像捕获镜头，图像捕获设备和便携式终端
公开(公告)号：US20110013070A1
公开(公告)日：2011-01-20
申请号：US12866537
申请日：2009-02-10
申请人： Yusuke Hirao , Keiji Matsusaka
发明人： Yusuke Hirao , Keiji Matsusaka
IPC分类号： H04N5/225 , G02B7/02 , G02B13/18 , B29D11/00
CPC分类号： G02B13/0085 , G02B7/008 , G02B9/10 , G02B13/003 , G02B13/006 , H04N5/2257
摘要： A lens unit LU in which a lens portion L is formed at least on either a light-receiving surface or a light-emitting surface of a lens holding plate P, wherein a difference in coefficients of linear expansion of the lens holding plate P and the lens portion L is used to suppress mis-focusing by causing changes in a paraxial image point position of the entire lens system due to changes in the surface shape of the lens portion L which accompany temperature changes, and changes in the paraxial image point position of the entire lens system due to changes in the refraction index to cancel each other out. Furthermore, deterioration of performance of the entire lens system caused by rising temperature is suppressed by satisfying a predetermined conditional expression.
摘要翻译：至少在透镜保持板P的光接收表面或发光表面上形成透镜部分L的透镜单元LU，其中透镜保持板P的线性膨胀系数与透镜部分L用于通过由于伴随温度变化的透镜部分L的表面形状的变化引起整个透镜系统的近轴图像点位置的变化来抑制误聚焦，并且近轴图像点位置的变化整个镜头系统由于折射率的变化而相互抵消。此外，通过满足预定的条件表达式来抑制由温度升高引起的整个透镜系统的性能的劣化。

5. 发明授权

US07841785B2 Imaging lens, imaging device, portable terminal, and method for manufacturing imaging lens 有权
标题翻译：成像透镜，成像装置，便携式终端以及用于制造成像透镜的方法
公开(公告)号：US07841785B2
公开(公告)日：2010-11-30
申请号：US12521321
申请日：2008-02-19
申请人： Yusuke Hirao , Keiji Matsusaka
发明人： Yusuke Hirao , Keiji Matsusaka
IPC分类号： G02B9/00
CPC分类号： G02B13/006 , G02B13/0025 , G02B13/003 , G02B13/0035 , G02B13/004 , G02B13/0085 , G02B13/18 , Y10T156/1052
摘要： An imaging lens (LN) includes at least one lens block (BK), and an aperture stop (ape). The lens block (BK) includes parallel flat lens substrates (LS) formed of different materials, and a lens (L). In the imaging lens (LN), a first lens block (BK1) positioned closest to an object includes a first lens substrate (LS1) and a lens (L[LS1o], and a prescribed conditional expression is satisfied.
摘要翻译：成像透镜（LN）包括至少一个透镜块（BK）和孔径光阑（ape）。透镜块（BK）包括由不同材料形成的平行平面透镜基板（LS）和透镜（L）。在成像透镜（LN）中，最靠近物体的第一透镜块（BK1）包括第一透镜基板（LS1）和透镜（L [LS1o]），并且满足规定的条件表达式。

6. 发明申请

US20100188555A1 IMAGING LENS, IMAGING DEVICE, AND MOBILE TERMINAL 失效
标题翻译：成像镜头，成像设备和移动终端
公开(公告)号：US20100188555A1
公开(公告)日：2010-07-29
申请号：US12667252
申请日：2008-06-25
申请人： Yusuke Hirao , Keiji Matsusaka , Yasunari Fukuta
发明人： Yusuke Hirao , Keiji Matsusaka , Yasunari Fukuta
IPC分类号： G02B13/18 , H04N5/225 , G02B3/00 , G02B11/08
CPC分类号： G02B13/006 , G02B13/0035 , G02B13/004 , G02B13/0085
摘要： Provided are a wafer scale lens, which is so short in an optical total length with respect to an image height that it can correct an aberration satisfactory, and an optical system including the wafer scale lens and having a thin lens element on the side closest to the image. The optical system includes a first lens having a positive refractive power relative to an object, and a second lens arranged on the side of the image of the first lens and having a recessed shape on the side of the object. At least one lens is arranged on the side of the second lens. When that one of the lenses arranged on the side of the image of the second lens, which is arranged on the side closest to the image, is an i-th lens (i>3), this i-th lens includes an i-th lens flat plate and is formed on the object side of the i-th lens flat plate but has a refractive index different from that of the i-th lens flat plate, and a lens element having a convex shape on the object side where the main light ray of the maximum image height passes. Moreover, the ratio between the optical axial distance (or the lens distance) between a (i−1)-th lens and the i-th lens and the optical axis distance (or the optical total length) from the object side face of the first lens to the image face is 0.01 to 0.15.
摘要翻译：本发明提供一种晶片级透镜，其相对于能够校正像差的图像高度的光学全长相当短，以及包括晶片标尺透镜的光学系统，并且在最靠近图片。光学系统包括相对于物体具有正折射力的第一透镜和布置在第一透镜的图像侧并且在物体侧具有凹陷形状的第二透镜。至少一个透镜布置在第二透镜的侧面上。当布置在布置在最靠近图像的一侧的第二透镜的图像侧的那一个透镜是第i个透镜（i> 3）时，该第i个透镜包括i- 并且形成在第i个透镜平板的物体侧上，但是具有与第i个透镜平板的折射率不同的折射率，以及在物体侧具有凸形的透镜元件，最大图像高度的主光线通过。此外，第（i-1）个透镜和第i个透镜之间的光学轴向距离（或透镜距离）与距离物体侧面的光轴距离（或光学总长度）之间的比率第一个镜头到图像面是0.01到0.15。

7. 发明申请

US20100166413A1 IMAGING LENS, IMAGING DEVICE, PORTABLE TERMINAL, AND METHOD FOR MANUFACTURING IMAGING LENS 有权
标题翻译：成像镜头，成像装置，便携式终端和制造成像镜片的方法
公开(公告)号：US20100166413A1
公开(公告)日：2010-07-01
申请号：US12521321
申请日：2008-02-19
申请人： Yusuke Hirao , Keiji Matsusaka
发明人： Yusuke Hirao , Keiji Matsusaka
IPC分类号： G03B17/00 , G02B9/00 , C03C27/12
CPC分类号： G02B13/006 , G02B13/0025 , G02B13/003 , G02B13/0035 , G02B13/004 , G02B13/0085 , G02B13/18 , Y10T156/1052
摘要： An imaging lens (LN) includes at least one lens block (BK), and an aperture stop (ape). The lens block (BK) includes parallel flat lens substrates (LS) formed of different materials, and a lens (L). In the imaging lens (LN), a first lens block (BK1) positioned closest to an object includes a first lens substrate (LS1) and a lens (L[LS1o], and a prescribed conditional expression is satisfied.
摘要翻译：成像透镜（LN）包括至少一个透镜块（BK）和孔径光阑（ape）。透镜块（BK）包括由不同材料形成的平行平面透镜基板（LS）和透镜（L）。在成像透镜（LN）中，最靠近物体的第一透镜块（BK1）包括第一透镜基板（LS1）和透镜（L [LS1o]），并且满足规定的条件表达式。

8. 发明申请

US20100046096A1 IMAGE PICKUP LENS, IMAGE PICKUP APPARATUS AND MOBILE TERMINAL 有权
标题翻译：图像拾取镜头，图像拾取装置和移动终端
公开(公告)号：US20100046096A1
公开(公告)日：2010-02-25
申请号：US12522580
申请日：2008-02-07
申请人： Yusuke Hirao , Keiji Matsusaka
发明人： Yusuke Hirao , Keiji Matsusaka
IPC分类号： G02B9/04
CPC分类号： G02B13/0025 , B82Y20/00 , G02B7/028 , G02B13/003 , G02B13/0035 , G02B13/006 , G02B13/0085 , Y10T29/49826 , Y10T156/1052
摘要： Provided is an imaging lens using a wafer scale lens which can easily be produced in a mass production. The entire optical length can be reduced without increasing a lens substrate or a lens formed on the substrate or without using a diffracting plane. The aberration can be preferably corrected. The imaging lens forms a first lens having a positive refractive power and Abbe number v1 on the object side and a second lens having a negative refractive power and Abbe number v2 on the image side of the first lens substrate. The difference between the Abbe number v1 and the Abbe number (v1−v2) is set to be a value greater than 10.
摘要翻译：提供一种使用能够容易地在批量生产中制造的晶片鳞片透镜的成像透镜。可以在不增加透镜基板或形成在基板上的透镜或不使用衍射平面的情况下减小整个光学长度。可以优选校正像差。成像透镜在第一透镜基板的像侧上形成具有正折光力和物镜侧的阿贝数v1的第一透镜和具有负折光力的第二透镜和阿贝数v2。阿贝数v1和阿贝数（v1-v2）之间的差异被设置为大于10的值。

9. 发明申请

US20130222790A1 INTERFEROMETER AND FOURIER-TRANSFORM SPECTROSCOPIC ANALYZER 有权
标题翻译：干涉仪和FOURIER-TRANSFORM光谱分析仪
公开(公告)号：US20130222790A1
公开(公告)日：2013-08-29
申请号：US13881562
申请日：2011-09-06
申请人： Yusuke Hirao
发明人： Yusuke Hirao
IPC分类号： G01B9/02
CPC分类号： G01B9/02061 , G01J3/4535
摘要： An interferometer (1) measures a measuring interference beam, while detecting the position of a moving mirror (16) on the basis of detection results obtained from a reference beam detector (25). In the interferometer, a reference beam source (21) is configured by including a light source (21a) composed of a semiconductor laser device. A reference optical system (20) has a collimating optical system (22) for a reference beam, said collimating optical system converting a laser beam outputted from the reference beam source (21) into a collimated beam, and the collimated beam is diagonally inputted to a fixed mirror (15).
摘要翻译：干涉仪（1）基于从参考光束检测器（25）获得的检测结果来检测移动镜（16）的位置，测量测量干涉光束。在干涉仪中，通过包括由半导体激光装置构成的光源（21a）构成参考光束源（21）。参考光学系统（20）具有用于参考光束的准直光学系统（22），所述准直光学系统将从参考光束源（21）输出的激光束转换为准直光束，并且准直光束被对角地输入到固定镜（15）。

10. 发明申请

US20120287439A1 Interferometer and Fourier Spectrometer using same 有权
标题翻译：干涉仪和傅立叶光谱仪使用相同
公开(公告)号：US20120287439A1
公开(公告)日：2012-11-15
申请号：US13515250
申请日：2010-12-08
申请人： Yusuke Hirao
发明人： Yusuke Hirao
IPC分类号： G01J3/45 , G01B9/02
CPC分类号： G01J3/4535 , G01J3/02 , G01J3/0208 , G01J3/021 , G01J3/027
摘要： Provided is a small, highly accurate Fourier spectrometer which enables highly accurate detection of an optical path difference in an interferometer. An element for changing to a narrow band is provided to return reflected light to a second light source (4), and the wavelength of light emitted by the second light source is locked, whereby the position of a movable mirror (8) is measured highly accurately and an optical path length (1) and an optical path length (2) match highly accurately.
摘要翻译：提供了一种小型，高精度的傅立叶光谱仪，其能够高精度地检测干涉仪中的光程差。设置用于变换为窄带的元件以将反射光返回到第二光源（4），并且由第二光源发射的光的波长被锁定，由此高度地测量可移动镜（8）的位置光路长度（1）和光路长度（2）准确地匹配。

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