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    • 1. 发明申请
    • BATTERY
    • 电池
    • US20120156552A1
    • 2012-06-21
    • US13392949
    • 2010-07-23
    • Yasuhito MiyazakiTakuya KinoshitaTakaaki AbeYoshio Shimoida
    • Yasuhito MiyazakiTakuya KinoshitaTakaaki AbeYoshio Shimoida
    • H01M2/02H01M2/30
    • H01M2/26H01M2/22H01M2/30H01M10/0413H01M10/0525H01M10/0585
    • Disclosed is a battery having an improved life. Specifically disclosed is a battery which comprises an electric power generating element in which one or more unit cell layers are stacked, each being constituted by sequentially laminating or stacking a positive electrode, an electrolyte and a negative electrode; a first collector plate which is provided on the outermost positive electrode surface of the electric power generating element; a second collector plate which is provided on the outermost negative electrode surface of the electric power generating element; a convex or protruding portion provided on the first collector plate and/or the second collector plate with a width that is not less than a half of the width of the end edge of the collector plate; and a terminal which is attached to the convex portion for retrieving electric current from the convex portion.
    • 公开了具有改善寿命的电池。 具体公开了一种电池,其包括其中堆叠一个或多个单元电池层的发电元件,其分别通过顺序层叠或堆叠正电极,电解质和负电极而构成; 设置在所述发电元件的最外侧正极面上的第一集电板; 设置在所述发电元件的最外侧负极面上的第二集电板; 设置在所述第一集电板和/或所述第二集电板上的凸部或突出部的宽度不小于所述集电板的端缘宽度的一半的宽度; 以及附接到凸部以从凸部取回电流的端子。
    • 7. 发明授权
    • Method of manufacturing semiconductor device
    • 制造半导体器件的方法
    • US07531396B2
    • 2009-05-12
    • US11374418
    • 2006-03-14
    • Tetsuya HayashiMasakatsu HoshiYoshio ShimoidaHideaki Tanaka
    • Tetsuya HayashiMasakatsu HoshiYoshio ShimoidaHideaki Tanaka
    • H01L21/338H01L21/066
    • H01L29/66068H01L21/8213H01L29/0619H01L29/0623H01L29/0847H01L29/1608H01L29/267H01L29/41741H01L29/41766H01L29/4236H01L29/7828
    • A method of manufacturing a semiconductor device is disclosed. The semiconductor device includes a semiconductor body of a first conductivity type, a hetero semiconductor region adjacent to one main surface of the semiconductor body and having a band gap different from that of the semiconductor body, and a gate electrode formed in a junction portion between the hetero semiconductor region and the semiconductor body through a gate insulating film. The method includes a first process of forming a predetermined trench by using a mask layer having a predetermined opening on one main surface side of the semiconductor body, a second process of forming a buried region adjacent to at least a side wall of the trench and so as to extend from the trench, a third process of forming a hetero semiconductor layer so as to adjoin the semiconductor body and the buried region, and a fourth process of forming the hetero semiconductor region by patterning the hetero semiconductor layer.
    • 公开了制造半导体器件的方法。 半导体器件包括第一导电类型的半导体本体,与半导体本体的一个主表面相邻且具有与半导体本体不同的带隙的异质半导体区域,以及形成在该半导体器件之间的接合部分中的栅电极 异质半导体区域和半导体本体通过栅极绝缘膜。 该方法包括通过使用在半导体主体的一个主表面侧上具有预定开口的掩模层来形成预定沟槽的第一工艺,形成与沟槽的至少侧壁相邻的掩埋区域的第二工艺 从沟槽延伸,形成与半导体本体和掩埋区相邻的异质半导体层的第三工序,以及通过图案化杂半导体层形成异质半导体区的第四工序。
    • 9. 发明申请
    • Semiconductor device and manufacturing method thereof
    • 半导体装置及其制造方法
    • US20070252173A1
    • 2007-11-01
    • US11790791
    • 2007-04-27
    • Tetsuya HayashiMasakatsu HoshiYoshio ShimoidaHideaki TanakaShigeharu Yamagami
    • Tetsuya HayashiMasakatsu HoshiYoshio ShimoidaHideaki TanakaShigeharu Yamagami
    • H01L29/739
    • H01L29/0847H01L29/1033H01L29/1608H01L29/267H01L29/4916H01L29/66068H01L29/7828
    • A semiconductor device is provided with: a semiconductor substrate of a predetermined electroconduction type; a hetero semiconductor region contacted with a first main surface of the semiconductor substrate and comprising a semiconductor material having a bandgap different from that of the semiconductor substrate; a gate electrode formed through a gate insulator layer at a position adjacent to a junction region between the hetero semiconductor region and the semiconductor substrate; a source electrode connected to the hetero semiconductor region; and a drain electrode connected to the semiconductor substrate; wherein the hetero semiconductor region includes a contact portion contacted with the source electrode, at least a partial region of the contact portion is of the same electroconduction type as the electroconduction type of the semiconductor substrate, and the partial region has an impurity concentration higher than an impurity concentration of at least that partial region of a gate-electrode facing portion in the hetero semiconductor region which is positioned to face toward the gate electrode through the gate insulator layer.
    • 半导体器件具有:预定的导电型的半导体衬底; 与所述半导体衬底的第一主表面接触并且包括具有与所述半导体衬底的带隙不同的带隙的半导体材料的异质半导体区域; 在与所述异质半导体区域和所述半导体基板之间的接合区域相邻的位置处形成的栅极电极, 连接到所述异质半导体区的源电极; 和连接到半导体衬底的漏电极; 其中所述异质半导体区域包括与所述源电极接触的接触部分,所述接触部分的至少一部分区域具有与所述半导体衬底的导电型相同的导电类型,并且所述部分区域的杂质浓度高于 至少通过栅极绝缘体层位于面向栅电极的异质半导体区域中的栅电极面对部分的部分区域的杂质浓度。
    • 10. 发明申请
    • Semiconductor device and manufacturing method thereof
    • 半导体器件及其制造方法
    • US20070252171A1
    • 2007-11-01
    • US11790679
    • 2007-04-26
    • Shigeharu YamagamiMasakatsu HoshiYoshio ShimoidaTetsuya HayashiHideaki Tanaka
    • Shigeharu YamagamiMasakatsu HoshiYoshio ShimoidaTetsuya HayashiHideaki Tanaka
    • H01L29/732
    • H01L29/8613H01L21/0465H01L21/0475H01L29/0615H01L29/1608H01L29/267H01L29/6606H01L29/66136
    • As semiconductor regions in contact with a first main surface of a semiconductor base composed by forming an N− silicon carbide epitaxial layer on an N+ silicon carbide substrate connected to a cathode electrode, there are provided both of an N+ polycrystalline silicon layer of a same conduction type as a conduction type of the semiconductor base and a P+ polycrystalline silicon layer of a conduction type different from the conduction type of the semiconductor base. Both of the N+ polycrystalline silicon layer and the P+ polycrystalline silicon layer are hetero-joined to the semiconductor base, and are ohmically connected to the anode electrode. Moreover, the N+ polycrystalline silicon layer of the same conduction type as the conduction type of the semiconductor base is formed so as to contact the first main surface of the semiconductor base, and the P+ polycrystalline silicon layer of the conduction type different from the conduction type of the semiconductor base is formed in trenches dug on the first main surface of the semiconductor base.
    • 作为与通过在与阴极连接的N +碳化硅衬底上形成N-碳化硅外延层而构成的半导体衬底的第一主表面接触的半导体区域,提供了具有相同导电性的N +多晶硅层 类型为半导体基底的导电类型和不同于半导体基底的导电类型的导电类型的P +多晶硅层。 N +多晶硅层和P +多晶硅层都与半导体基体异相接合,并与欧姆连接到阳极电极。 此外,形成与半导体基底的导电类型相同的导电类型的N +多晶硅层,以便与半导体基底的第一主表面接触,并且与导电类型不同的导电类型的P +多晶硅层 形成在半导体基底的第一主表面上的沟槽中。