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    • 2. 发明公开
    • Improvements of finite differences methods
    • Verbesserungen von Finite-Differenzverfahren
    • EP2065819A2
    • 2009-06-03
    • EP08253092.4
    • 2008-09-22
    • Welkie, David G.
    • Welkie, David G.
    • G06F17/50
    • G06F17/13G06F17/5018G06F2217/16
    • Many important physical phenomena are described by partial differential equations (PDEs) of a function f(x,y,z) constrained by boundary conditions. Solutions of such 'boundary value problems' are often calculated numerically using so-called `finite differences' (FD) methods. Essentially, a regular array, or 'grid', of points is established in the spatial domain, and an array of difference equations are solved numerically to yield values of f(x,y,z) that are consistent with the boundary conditions at the locations of the grid points. However, the boundary conditions are often not initially specified precisely at the locations of grid points, in particular, when such boundary conditions are represented by curved or slanted surfaces which do not coincide precisely with grid point array.
      The present invention provides methods by which the values assigned to the boundary grid points are not the values of f(x,y,z) of non-coincident boundary surfaces proximal to the boundary grid points, but rather, values are assigned to the boundary grid points that more accurately account for the differences in locations between each original boundary surface and that of each respective proximal boundary grid point. Consequently, the subject invention provides methods by which the function f(x,y,z) may be calculated with FD methods with greater accuracy than methods. The invention is described herein particularly with regard to solving Laplace's equation to determine potential distributions in electron and/or ion optical devices.
    • 许多重要的物理现象由边界条件约束的函数f(x,y,z)的偏微分方程(PDE)描述。 这种“边界值问题”的解决方法通常使用所谓的“有限差分”(FD)方法数值计算。 本质上,在空间域中建立了一个常规数组或“网格”,并以数值方式求解差分方程数组,以产生与边界条件一致的f(x,y,z)值。 网格点的位置。 然而,边界条件通常不是最初在网格点的位置精确地指定,特别是当这种边界条件由与网格点阵列精确地不一致的弯曲或倾斜表面表示时。 本发明提供了分配给边界网格点的值不是接近边界网格点的非重合边界面的f(x,y,z)的值的方法,而是将值分配给边界 网格点更准确地说明每个原始边界表面与每个相应近边界网格点之间的位置差异。 因此,本发明提供了用方法以比方法更精确的方式计算函数f(x,y,z)的方法。 本文描述了本发明,特别是关于求解拉普拉斯方程以确定电子和/或离子光学器件中的电势分布的方法。
    • 3. 发明公开
    • Improvements of finite differences methods
    • 有限差分法的改进
    • EP2065819A3
    • 2010-02-17
    • EP08253092.4
    • 2008-09-22
    • Welkie, David G.
    • Welkie, David G.
    • G06F17/50
    • G06F17/13G06F17/5018G06F2217/16
    • Many important physical phenomena are described by partial differential equations (PDEs) of a function f(x,y,z) constrained by boundary conditions. Solutions of such 'boundary value problems' are often calculated numerically using so-called `finite differences' (FD) methods. Essentially, a regular array, or 'grid', of points is established in the spatial domain, and an array of difference equations are solved numerically to yield values of f(x,y,z) that are consistent with the boundary conditions at the locations of the grid points. However, the boundary conditions are often not initially specified precisely at the locations of grid points, in particular, when such boundary conditions are represented by curved or slanted surfaces which do not coincide precisely with grid point array.
      The present invention provides methods by which the values assigned to the boundary grid points are not the values of f(x,y,z) of non-coincident boundary surfaces proximal to the boundary grid points, but rather, values are assigned to the boundary grid points that more accurately account for the differences in locations between each original boundary surface and that of each respective proximal boundary grid point. Consequently, the subject invention provides methods by which the function f(x,y,z) may be calculated with FD methods with greater accuracy than methods. The invention is described herein particularly with regard to solving Laplace's equation to determine potential distributions in electron and/or ion optical devices.
    • 7. 发明申请
    • RF SURFACES AND RF ION GUIDES
    • 射频表面和射频指导
    • WO2005114705A3
    • 2006-10-05
    • PCT/US2005017748
    • 2005-05-20
    • WHITEHOUSE CRAIG MWELKIE DAVID GCOUSINS LISA
    • WHITEHOUSE CRAIG MWELKIE DAVID GCOUSINS LISA
    • H01J49/42H01J49/04H01J49/10H01J49/16H01J49/40
    • H01J49/42H01J49/062
    • Apparatus and methods are provided for trapping, manipulation and transferring ions along RF and DC potential surfaces and through RF ion guides. Potential wells are formed neap RF-field generating surfaces due to the overlap of the radio-frequency (RF) fields and electrostatic fields created by static potentials applied to surrounding electrodes. Ions can be constrained and accumulated overtime in such wells. During confinement, ions may be subjected to various processes, such as accumulation, fragmentation, collisional cooling, focusing, mass-to-charge filtering, spatial separation ion mobility and chemical interactions, leading to improved performance in subsequent processing and analysis steps, such as mass analysis. Alternatively, the motion of ions may be better manipulated during confinement to improve the efficiency of their transport to specific locations, such as an entrance aperture into vacuum from atmospheric pressure or into a subsequent vacuum stage.
    • 提供了设备和方法,用于沿着RF和DC电势表面以及通过RF离子导向器捕获,操纵和转移离子。 由于射频(RF)场和施加到周围电极的静电势产生的静电场的重叠,潜在的阱形成了近场的RF场产生表面。 这些井中的离子可以被限制和加班。 在限制期间,离子可以经历各种过程,例如累积,碎裂,碰撞冷却,聚焦,质量 - 电荷过滤,空间分离离子迁移和化学相互作用,导致后续处理和分析步骤中的改进的性能,例如 质量分析。 或者,可以在限制期间更好地操作离子的运动,以提高其运送到特定位置的效率,例如从大气压进入真空的入口孔或进入随后的真空级。
    • 8. 发明申请
    • RF SURFACES AND RF ION GUIDES
    • 射频表面和射频指导
    • WO2005114705A2
    • 2005-12-01
    • PCT/US2005/017748
    • 2005-05-20
    • WHITEHOUSE, Craig, M.WELKIE, David, G.COUSINS, Lisa
    • WHITEHOUSE, Craig, M.WELKIE, David, G.COUSINS, Lisa
    • H01J49/42
    • H01J49/42H01J49/062
    • Apparatus and methods are provided for trapping, manipulation and transferring ions along RF and DC potential surfaces and through RF ion guides. Potential wells are formed neap RF-field generating surfaces due to the overlap of the radio-frequency (RF) fields and electrostatic fields created by static potentials applied to surrounding electrodes. Ions can be constrained and accumulated overtime in such wells. During confinement, ions may be subjected to various processes, such as accumulation, fragmentation, collisional cooling, focusing, mass-to-charge filtering, spatial separation ion mobility and chemical interactions, leading to improved performance in subsequent processing and analysis steps, such as mass analysis. Alternatively, the motion of ions may be better manipulated during confinement to improve the efficiency of their transport to specific locations, such as an entrance aperture into vacuum from atmospheric pressure or into a subsequent vacuum stage.
    • 提供了设备和方法,用于沿着RF和DC电势表面以及通过RF离子导向器捕获,操纵和转移离子。 由于射频(RF)场和施加到周围电极的静电势产生的静电场的重叠,潜在的阱形成了近场的RF场产生表面。 这些井中的离子可以被限制和加班。 在限制期间,离子可以经历各种过程,例如累积,碎裂,碰撞冷却,聚焦,质量 - 电荷过滤,空间分离离子迁移和化学相互作用,导致后续处理和分析步骤中的改进的性能,例如 质量分析。 或者,可以在限制期间更好地操作离子的运动,以提高其运送到特定位置的效率,例如从大气压进入真空的入口孔或进入随后的真空级。
    • 9. 发明申请
    • ELECTROSTATIC LENSES AND SYSTEMS INCLUDING THE SAME
    • 静电镜和系统包括它们
    • WO2012122036A3
    • 2014-04-17
    • PCT/US2012027547
    • 2012-03-02
    • PERKINELMER HEALTH SCI INCWELKIE DAVID G
    • WELKIE DAVID G
    • H01J37/147
    • H01J49/061H01J37/12H01J37/1472H01J49/06H01J49/063H01J49/22H01J49/26
    • A system includes an electrostatic lens positioned between a charged-particle source and a detector. The lens includes: a first electrode having a first aperture in the path and aligned with a first axis; a second electrode in the path between the first electrode and the charged-particle detector, the second electrode having a second aperture positioned in the path and aligned with a second axis parallel to the first axis and displaced from the first axis along a first direction; a third electrode in the path between the first electrode and the second electrode; and a potential generator coupled to the first, second, and third electrodes. During operation, the potential generator applies first, second, and third potentials to the first, second, and third electrodes, respectively, so that the electrostatic lens directs a beam of charged particles from the charged-particle source propagating along the first axis to propagate along the second axis.
    • 系统包括位于带电粒子源和检测器之间的静电透镜。 所述透镜包括:第一电极,其具有在所述路径中的与第一轴对准的第一孔; 在第一电极和带电粒子检测器之间的路径中的第二电极,第二电极具有位于路径中的第二孔,并且与第一轴对准,并且与第一轴平行,并沿着第一方向从第一轴移位; 在第一电极和第二电极之间的路径中的第三电极; 以及耦合到第一,第二和第三电极的电位发生器。 在操作期间,电位发生器分别将第一,第二和第三电位施加到第一,第二和第三电极,使得静电透镜引导来自沿着第一轴传播的带电粒子源的带电粒子束传播 沿第二轴。
    • 10. 发明申请
    • ELECTROSTATIC LENSES AND SYSTEMS INCLUDING THE SAME
    • 静电镜和系统包括它们
    • WO2012122036A2
    • 2012-09-13
    • PCT/US2012/027547
    • 2012-03-02
    • PERKINELMER HEALTH SCIENCES, INC.WELKIE, David G.
    • WELKIE, David G.
    • H01J3/20H01J3/18
    • H01J49/061H01J37/12H01J37/1472H01J49/06H01J49/063H01J49/22H01J49/26
    • A system includes an electrostatic lens positioned between a charged-particle source and a detector. The lens includes: a first electrode having a first aperture in the path and aligned with a first axis; a second electrode in the path between the first electrode and the charged-particle detector, the second electrode having a second aperture positioned in the path and aligned with a second axis parallel to the first axis and displaced from the first axis along a first direction; a third electrode in the path between the first electrode and the second electrode; and a potential generator coupled to the first, second, and third electrodes. During operation, the potential generator applies first, second, and third potentials to the first, second, and third electrodes, respectively, so that the electrostatic lens directs a beam of charged particles from the charged-particle source propagating along the first axis to propagate along the second axis.
    • 系统包括位于带电粒子源和检测器之间的静电透镜。 所述透镜包括:第一电极,其具有在所述路径中的与第一轴对准的第一孔; 在第一电极和带电粒子检测器之间的路径中的第二电极,第二电极具有位于路径中的第二孔,并且与第一轴平行的第二轴对齐并沿着第一方向从第一轴移位; 在第一电极和第二电极之间的路径中的第三电极; 以及耦合到第一,第二和第三电极的电位发生器。 在操作期间,电位发生器分别将第一,第二和第三电位施加到第一,第二和第三电极,使得静电透镜引导来自沿着第一轴传播的带电粒子源的带电粒子束传播 沿第二轴。