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    • 2. 发明申请
    • PROBES, STYLI, SYSTEMS INCORPORATING SAME AND METHODS OF MANUFACTURE
    • 探针,STYLI,系统及其制造方法和制造方法
    • WO2016057222A2
    • 2016-04-14
    • PCT/US2015/051778
    • 2015-09-23
    • US SYNTHETIC CORPORATION
    • MIESS, DavidCHAPMAN, MarkLINGWALL, Brent A.
    • G01B5/016G01B1/00
    • A probe for use with measuring equipment, such as a coordinate measuring machine (CMM) or a profilometer includes a shaft and a probe tip coupled with the shaft. At least a portion of the probe tip comprises a superabrasive material such as polycrystalline diamond. The probe tip may exhibit a variety of different geometries including, for example, substantially spherical, substantially cylindrical with a high aspect (length to diameter) ratio, or substantially disc-shaped. In other embodiments, the tip may include a converging portion leading to a fine-radiussed end point. The tip may be manufactured by forming a body using a high-pressure, high-temperature (HPHT) process and the shaping the body using a process such as electrical discharge machining (EDM), grinding or laser cutting.
    • 用于测量设备的探头,例如坐标测量机(CMM)或轮廓仪,包括轴和与轴连接的探头。 探针尖端的至少一部分包括超研磨材料,例如多晶金刚石。 探针尖端可以呈现各种不同的几何形状,包括例如基本上球形的,基本上圆柱形的,具有高的方面(长度与直径)的比例,或基本上为圆盘状。 在其他实施例中,尖端可以包括通向细圆角端点的会聚部分。 尖端可以通过使用高压,高温(HPHT)方法形成主体并且使用诸如放电加工(EDM),研磨或激光切割的工艺成形身体来制造。