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    • 2. 发明申请
    • METHOD AND APPARATUS FOR QUANTITATING SURFACE-BINDING OPTICAL RESONANCE PROFILES
    • 用于定量表面结合光学共振谱的方法和装置
    • WO2005029031A2
    • 2005-03-31
    • PCT/US2004024788
    • 2004-08-02
    • HTS BIOSYSTEMS INCTRACY DAVID H
    • TRACY DAVID H
    • G01N21/55G01N
    • G01N21/274G01N21/553G01N21/648
    • Empirical Profile Fits are used to quantitate Surface-binding Optical Resonance profiles. The EPF process has two stages, Calibration and Fit. In the Calibration stage, a calibration surface-binding optical resonance scan is obtained with relatively fine angle or wavelength spacing over a range sufficient to include full resonance profiles for all regions. Smoothed, subsampled empirical profiles for each Region of Interest are generated by the main calibration module, together with first derivative curves and diagnostic information. Properties returned may include approximate resonance position, depth, and width. In the Fit stage, individual ROI scans are used for measurement of resonance shifts relative to the empirical profile. The fitting module identifies the region of the experimental scan encompassing the resonance and fits that region using the previously stored empirical profiles, quantifying and returning the desired values, including the shift in the resonance as compared to its location at calibration, estimated absolute angles or wavelengths, time of resonance minimum, and additional diagnostic and quality information. Optionally, data obtained from either Calibration or Fit stages may be exported for analysis on other systems. In a preferred embodiment, Instrument Control and Data Acquisition Software sets internal parameters in the EPF Calibration module and sends raw data from a calibration scan to the EPF Calibration module, which funnels the data through a Subsampler and a Savitsky-Golay smoothing routine before taking derivatives and characterizing the data to create an empirical profile for the chip. The empirical profiles are then optionally stored. Next, Instrument Control and Data Acquisition Software sets internal parameters in the EPF Fitting module and sends raw data from a run-time scan performed utilizing the chip to the EPF Fitting module, which qualifies it, queries the EPF Calibration module for the empirical profile for the chip, and fits the curve, iterating when necessary. Results from the fitting process are then returned and thereby provided to the user.
    • 经验描述适合用于定量表面结合光学共振特征。 EPF过程有两个阶段:校准和拟合。 在校准阶段,在足以包括所有区域的完整共振分布的范围内,获得具有相对精细的角度或波长间隔的校准表面结合光学共振扫描。 每个感兴趣区域的平滑,二次抽样经验概况由主校准模块,一阶导数曲线和诊断信息一起生成。 返回的属性可能包括近似共振位置,深度和宽度。 在Fit阶段,单独的ROI扫描用于相对于经验分布的谐振偏移的测量。 拟合模块识别包含谐振的实验扫描的区域,并使用先前存储的经验曲线拟合该区域,量化并返回期望值,包括与其在校准时的位置相比较的谐振偏移,估计绝对角度或波长 ,谐振时间最小,以及额外的诊断和质量信息。 可选地,可以导出从校准或拟合阶段获得的数据,以便在其他系统上进行分析。 在优选实施例中,仪器控制和数据采集软件在EPF校准模块中设置内部参数,并将原始数据从校准扫描发送到EPF校准模块,EPF校准模块通过采样器和Savitsky-Golay平滑程序在获取衍生物之前漏出数据 并表征数据以创建芯片的经验概况。 然后可选地存储经验概况。 接下来,仪器控制和数据采集软件在EPF Fitting模块中设置内部参数,并将使用芯片执行的运行时扫描的原始数据发送到EPF Fitting模块(符合此要求),查询EPF校准模块的经验配置文件 芯片,并适合曲线,必要时进行迭代。 然后从装配过程中得到的结果返回给用户。