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    • 1. 发明授权
    • Manufacturing method and system of target
    • 目标的制造方法和制度
    • US09043193B2
    • 2015-05-26
    • US13428568
    • 2012-03-23
    • Jikai ZhangJiyu WanHongjiang WuSeungmoo Rim
    • Jikai ZhangJiyu WanHongjiang WuSeungmoo Rim
    • G01B21/18C23C14/34H01J37/34
    • G01B21/18C23C14/3414G01B2210/56H01J37/3414H01J37/3491
    • The disclosed technology provides a manufacturing method of a target comprising obtaining an initial mass and a residual mass of the target sample, and calculating an etching mass; determining a relative etching depth of the target sample; calculating a relative etching mass based on the etching mass and the relative etching depth; determining a utilization parameter of the target sample based on the relative etching mass and the initial mass of the target sample before being used; and performing a simulation and optimization process on the utilization parameter of the target sample, obtaining target parameters corresponding to a preset value of the utilization parameter, and outputting the target parameters to a manufacturing control center for manufacturing a target. The disclosed technology also provides a manufacturing system of a target.
    • 所公开的技术提供了一种靶的制造方法,包括获得目标样品的初始质量和剩余质量,并计算蚀刻质量; 确定目标样品的相对蚀刻深度; 基于蚀刻质量和相对蚀刻深度计算相对蚀刻质量; 在使用前基于相对蚀刻质量和目标样品的初始质量确定目标样品的利用参数; 对所述目标样本的利用参数进行模拟和优化处理,获得与所述利用参数的预设值相对应的目标参数,并将所述目标参数输出到制造对象的制造控制中心。 所公开的技术还提供了目标的制造系统。
    • 4. 发明申请
    • DISPLAY SYSTEM
    • 显示系统
    • US20130187853A1
    • 2013-07-25
    • US13700075
    • 2012-07-16
    • Jianfeng YuanJiannan ZhangSeungmoo RimZhenyu ZhangQiang Zheng
    • Jianfeng YuanJiannan ZhangSeungmoo RimZhenyu ZhangQiang Zheng
    • G06F3/03
    • G06F3/0308G06F3/0304G06F3/03542G06F3/0412G06F3/042
    • An embodiment of the present invention provides a display system, and the display system comprises a light beam emitting device, emitting a first light beam for marking an input position and a second light beam for confirming the input position, the first light beam being visible light, and the second light beam differing from the first light beam; and a display device, comprising a displaying area, photo-sensitive devices distributed within the displaying area, processing devices coupled with the photo-sensitive devices. The photo-sensitive devices are used for sensing the second light beam projected upon the displaying area and achieving a sensing result; the processing devices are used for determining the projecting position of the second light beam upon the displaying area according to the sensing result, and performing a corresponding operation based on the sensing result. The present invention is capable of performing remote touch operation on the display device.
    • 本发明的实施例提供了一种显示系统,并且显示系统包括发射用于标记输入位置的第一光束的光束发射装置和用于确认输入位置的第二光束,第一光束是可见光 ,并且所述第二光束与所述第一光束不同; 以及显示装置,包括显示区域,分布在显示区域内的感光装置,与感光装置耦合的处理装置。 感光装置用于感测投射在显示区域上的第二光束并实现感测结果; 处理装置用于根据感测结果确定第二光束在显示区域上的投影位置,并且基于感测结果执行相应的操作。 本发明能够在显示装置上执行远程触摸操作。
    • 7. 发明申请
    • MANUFACTURING METHOD AND SYSTEM OF TARGET
    • 目标的制造方法和系统
    • US20120245725A1
    • 2012-09-27
    • US13428568
    • 2012-03-23
    • Jikai ZHANGJiyu WANHongjiang WUSeungmoo RIM
    • Jikai ZHANGJiyu WANHongjiang WUSeungmoo RIM
    • G06F19/00
    • G01B21/18C23C14/3414G01B2210/56H01J37/3414H01J37/3491
    • The disclosed technology provides a manufacturing method of a target comprising obtaining an initial mass and a residual mass of the target sample, and calculating an etching mass; determining a relative etching depth of the target sample; calculating a relative etching mass based on the etching mass and the relative etching depth; determining a utilization parameter of the target sample based on the relative etching mass and the initial mass of the target sample before being used; and performing a simulation and optimization process on the utilization parameter of the target sample, obtaining target parameters corresponding to a preset value of the utilization parameter, and outputting the target parameters to a manufacturing control center for manufacturing a target. The disclosed technology also provides a manufacturing system of a target.
    • 所公开的技术提供了一种靶的制造方法,包括获得目标样品的初始质量和剩余质量,并计算蚀刻质量; 确定目标样品的相对蚀刻深度; 基于蚀刻质量和相对蚀刻深度计算相对蚀刻质量; 在使用前基于相对蚀刻质量和目标样品的初始质量确定目标样品的利用参数; 对所述目标样本的利用参数进行模拟和优化处理,获得与所述利用参数的预设值相对应的目标参数,并将所述目标参数输出到制造对象的制造控制中心。 所公开的技术还提供了目标的制造系统。