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1. 发明专利

JP2020090881A 地盤変位観測システム审中-公开
公开(公告)号：JP2020090881A
公开(公告)日：2020-06-11
申请号：JP2018237757
申请日：2018-12-03
申请人： SHEN HONG , CYBERNET TECH CO LTD
发明人： SHEN HONG , WANG LIDUAN
IPC分类号： E02D1/00 , E02D17/20 , G01C7/02
摘要：【課題】土砂崩れなどが発生する恐れのある危険な斜面への作業者によるメンテナンス及び確認のための立ち入る必要がなく、観測する地盤の土砂崩れに伴う地表変位を早期に検出する地盤変位観測システムを提供する。【解決手段】地盤変位観測システムは、観測対象の地盤4に差し込んで固定する固定部2と、傾斜角度を測定するセンサーとセンサーの測定データを情報収集装置に伝達する装置及び電気供給装置を備える可動部1で観測ユニットを構成する。固定部に対して各方向一定の角度範囲内で動くことの可能な接続3方法で可動部1を取り付ける構造を地盤変位観測エリアに設置する。【選択図】図1

2. 发明公开

EP0409271A2 Method and apparatus for determining a material's characteristics by photoreflectance using improved computer control 失效
标题翻译：用于通过测量使用改进的计算机控制的反射照片确定材料的性质的方法和装置。
公开(公告)号：EP0409271A2
公开(公告)日：1991-01-23
申请号：EP90113969.1
申请日：1990-07-20
申请人： Pollak, Fred H. , Shen, Hong-En
发明人： Pollak, Fred H. , Shen, Hong-En
IPC分类号： G01N21/55 , G01N21/17
CPC分类号： G01N21/1717 , G01J2001/242 , G01N21/55 , G01N2021/1719 , G01N2021/1725 , G01N2021/8461 , G01N2201/0695
摘要： A method and apparatus for determining the characteristics of materials, particularly of semiconductors, semiconductor heterostructures and semiconductor interfaces by the use of photoreflectance, in which monochromatic light and modulated light beam reflected from the sample (62) is detected to produce a d.c. signal and an a.c. signal, whereby the d.c. signal is applied to one input of a computer (70) and the a.c. signal is used with another input of the computer (70) which controls the light intensity of the monochromatic light impinging on the sample (62) to maintain the d.c. signal substantially constant. A stepping motor (53) is preferably utilized for varying the light intensity of the monochromatic light which is controlled by a computer (70) to re-establish rapidly a predetermined d.c. signal established during normalization procedures when the light intensity of the monochromatic light changes, especially during change of its wavelength. Additionally, the modulation frequency of the modulated beam and/or the wavelength of the monochromatic light can also be varied by the computer (70).
摘要翻译：检测到一个用于确定性采矿方法和装置的材料特性特别是半导体，半导体异质结构和半导体界面通过使用光反射的，其中单色光和调制的光束从所述样品（62）反射，以产生一个直流信号和交流信号，由此所述直流信号被施加到一台计算机的一个输入端（70）和所述交流信号与所述计算机（70），其控制所述单色光照射在样品（62）的光强度的另一个输入端用于保持直流大致恒定信号。步进电机（53）优选地用于由计算机（70）改变所述单色光的光强度所有这一切都被控制以重新建立快速预定直流期间归一化程序信号时建立的单色光的变化的光强度，其波长的变化期间爱更是如此。另外，调制的束和/或单色的光的波长的调制频率因此可以由计算机（70）改变。

3. 发明公开

EP0417551A2 Photoreflectance method and apparatus utilizing acousto-optic modulation 失效
标题翻译：用于测量使用声光调制的光反射率的方法和装置。
公开(公告)号：EP0417551A2
公开(公告)日：1991-03-20
申请号：EP90116600.9
申请日：1990-08-29
申请人： Pollak, Fred H. , Shen, Hong-En
发明人： Pollak, Fred H. , Shen, Hong-En
IPC分类号： G01N21/55 , G01N21/17
CPC分类号： G01N21/1717 , G01J1/24 , G01J2003/063 , G01J2003/066 , G01N21/55 , G01N2021/1725 , G01N2201/0695 , G01N2201/126
摘要： In an apparatus for determining characteristics of materials by photoreflectance the sample (62) is irradiated by light from a monochromatic light source (50, 51) and a pump beam source (63). The reflected ligth is analyzed by a detector (56), a lock-in amplifier (55), a A/D converter (66) and a computer (70). The d.c. signal of the detector (56) is kept constant for a certain measurement by means of a variable neutral density filter (58) in the monochromatic light beam. By varying the pump beam wavelength and its modulation frequency by the use of an acousto-optical modulator the component layers, their quality and the properties of the various interfaces in the sample (62) are determined.
摘要翻译：在通过光反射的材料确定性采矿特性的装置的样品（62）是由光从单色光源（50，51）和泵束源（63）照射。该反射LIGTH由检测器（56）分析，一个锁相放大器（55），一个A / D转换器（66）和计算机（70）。直流所述检测器（56）的信号，用于通过在单色光束的可变的中性密度滤光器（58）的手段某个测量保持恒定。由通过使用声光调制器的变化的泵浦光束的波长和它的频率调制成分的层，它们的质量和样品（62）中的各种接口的性质是确定的开采。

4. 发明公开

EP0409270A2 Method for determining interface properties of semiconductor materials by photoreflectance 失效
标题翻译：对于通过光反射率的测定，确定半导体材料的界面性质的方法。
公开(公告)号：EP0409270A2
公开(公告)日：1991-01-23
申请号：EP90113968.3
申请日：1990-07-20
申请人： Pollak, Fred H. , Shen, Hong-En , Lucovsky, Gerald
发明人： Pollak, Fred H. , Shen, Hong-En , Lucovsky, Gerald
IPC分类号： G01N21/55 , G01N21/17
CPC分类号： G01N21/1717 , G01N21/55 , G01N21/636 , G01N2021/1782 , G01N2021/8461
摘要： A method for determining information about properties at interfaces of semi-conductor materials in which a probe beam monochromatic light is directed onto a material sample which is itself electromodulated by a modulated pump beam, whereby the light reflected from the sample is detected to produce a d.c. signal and an a.c. signal, and after normalizing the procedure, the shifts of energy gaps in the band gaps are evaluated to obtain information about at least one externally applied parameter crossing such shift.
摘要翻译：检测在哪一个探测光束单色光被引导到材料样品的所有其本身是由一个调制泵浦光，由此，光从样品反射electromodulated在半导体材料的接口有关属性的确定性采矿信息的方法，以产生一个直流信号和交流信号，并且归一化过程之后，在带隙能隙的偏移进行评估，以获得关于至少一个外部施加的参数已审查交叉移位信息。

5. 发明公开

EP0417551A3 Photoreflectance method and apparatus utilizing acousto-optic modulation 失效
标题翻译：使用光学调制的光电方法和装置
公开(公告)号：EP0417551A3
公开(公告)日：1991-06-19
申请号：EP90116600.9
申请日：1990-08-29
申请人： Pollak, Fred H. , Shen, Hong-En
发明人： Pollak, Fred H. , Shen, Hong-En
IPC分类号： G01N21/55 , G01N21/17
CPC分类号： G01N21/1717 , G01J1/24 , G01J2003/063 , G01J2003/066 , G01N21/55 , G01N2021/1725 , G01N2201/0695 , G01N2201/126
摘要： In an apparatus for determining characteristics of materials by photoreflectance the sample (62) is irradiated by light from a monochromatic light source (50, 51) and a pump beam source (63). The reflected ligth is analyzed by a detector (56), a lock-in amplifier (55), a A/D converter (66) and a computer (70). The d.c. signal of the detector (56) is kept constant for a certain measurement by means of a variable neutral density filter (58) in the monochromatic light beam. By varying the pump beam wavelength and its modulation frequency by the use of an acousto-optical modulator the component layers, their quality and the properties of the various interfaces in the sample (62) are determined.

6. 发明公开

EP0409271A3 Method and apparatus for determining a material's characteristics by photoreflectance using improved computer control 失效
标题翻译：使用改进的计算机控制通过光电确定材料特性的方法和装置
公开(公告)号：EP0409271A3
公开(公告)日：1991-07-03
申请号：EP90113969.1
申请日：1990-07-20
申请人： Pollak, Fred H. , Shen, Hong-En
发明人： Pollak, Fred H. , Shen, Hong-En
IPC分类号： G01N21/55 , G01N21/17
CPC分类号： G01N21/1717 , G01J2001/242 , G01N21/55 , G01N2021/1719 , G01N2021/1725 , G01N2021/8461 , G01N2201/0695
摘要： A method and apparatus for determining the characteristics of materials, particularly of semiconductors, semiconductor heterostructures and semiconductor interfaces by the use of photoreflectance, in which monochromatic light and modulated light beam reflected from the sample (62) is detected to produce a d.c. signal and an a.c. signal, whereby the d.c. signal is applied to one input of a computer (70) and the a.c. signal is used with another input of the computer (70) which controls the light intensity of the monochromatic light impinging on the sample (62) to maintain the d.c. signal substantially constant. A stepping motor (53) is preferably utilized for varying the light intensity of the monochromatic light which is controlled by a computer (70) to re-establish rapidly a predetermined d.c. signal established during normalization procedures when the light intensity of the monochromatic light changes, especially during change of its wavelength. Additionally, the modulation frequency of the modulated beam and/or the wavelength of the monochromatic light can also be varied by the computer (70).

7. 发明公开

EP0409270A3 Method for determining interface properties of semiconductor materials by photoreflectance 失效
标题翻译：用于通过光电测定半导体材料的界面特性的方法
公开(公告)号：EP0409270A3
公开(公告)日：1991-06-12
申请号：EP90113968.3
申请日：1990-07-20
申请人： Pollak, Fred H. , Shen, Hong-En , Lucovsky, Gerald
发明人： Pollak, Fred H. , Shen, Hong-En , Lucovsky, Gerald
IPC分类号： G01N21/55 , G01N21/17
CPC分类号： G01N21/1717 , G01N21/55 , G01N21/636 , G01N2021/1782 , G01N2021/8461
摘要： A method for determining information about properties at interfaces of semi-conductor materials in which a probe beam monochromatic light is directed onto a material sample which is itself electromodulated by a modulated pump beam, whereby the light reflected from the sample is detected to produce a d.c. signal and an a.c. signal, and after normalizing the procedure, the shifts of energy gaps in the band gaps are evaluated to obtain information about at least one externally applied parameter crossing such shift.
摘要翻译：一种用于确定半导体材料界面的信息的方法，其中探针光束单色光被引导到材料样品上，该材料样本本身由调制的泵浦光束电调制，由此检测从样品反射的光以产生直流。信号和a.c. 信号，并且在规范化程序之后，评估带隙中的能隙的偏移以获得关于穿过这种偏移的至少一个外部施加的参数的信息。

8. 发明申请

WO2012082956A2 METHODS FOR METAL PLATING AND RELATED DEVICES 审中-公开
标题翻译：金属镀层和相关器件的方法
公开(公告)号：WO2012082956A2
公开(公告)日：2012-06-21
申请号：PCT/US2011/064997
申请日：2011-12-14
申请人： SKYWORKS SOLUTIONS, INC. , SHEN, Hong
发明人： SHEN, Hong
IPC分类号： H01L21/28
CPC分类号： H01L23/5286 , C23C18/1651 , C23C18/1653 , C23C18/1879 , C23C18/32 , C23C18/38 , C23C18/42 , C23C18/50 , H01L21/288 , H01L21/76873 , H01L21/76874 , H01L21/76898 , H01L2221/1089 , H01L2924/0002 , H01L2924/00
摘要： Methods for plating metal over features of a semiconductor wafer and devices that can be formed by these methods are disclosed. One such method includes forming a barrier layer over the substrate using electroless plating and forming a copper layer over the barrier layer. In some implementations, the semiconductor wafer is a GaAs wafer. Alternatively or additionally, the feature over which metal is plated can be a through-wafer via. In some implementations, a seed layer over the barrier layer can be formed using electroless plating.
摘要翻译：公开了用于在半导体晶片的特征上电镀金属的方法以及可以通过这些方法形成的器件。一种这样的方法包括使用无电镀在衬底上形成阻挡层并在阻挡层上形成铜层。在一些实施方式中，半导体晶片是GaAs晶片。可选地或附加地，金属被镀敷的特征可以是贯穿晶片的通孔。在一些实施方式中，可以使用化学镀形成阻挡层上的晶种层。

9. 发明申请

WO2009020574A3 FEATURE PROCESSING FOR LUNG NODULES IN COMPUTER ASSISTED DIAGNOSIS 审中-公开
标题翻译：肺计算机辅助诊断中的特征处理
公开(公告)号：WO2009020574A3
公开(公告)日：2009-03-26
申请号：PCT/US2008009361
申请日：2008-08-04
申请人： SIEMENS MEDICAL SOLUTIONS , HONG LIN , ALVINO CHRISTOPHER V , SHEN HONG
发明人： HONG LIN , ALVINO CHRISTOPHER V , SHEN HONG
IPC分类号： G06T7/00
CPC分类号： G06T7/0012 , G06T2207/30061 , G06T2207/30064
摘要： Feature processing is provided for lung nodules in computer-assisted diagnosis. A feature that may better distinguish nodules from background is extracted (22) using a Hough transform. Rather than relying on a specific boundary shape, the Hough transform accumulates (26) evidence associated with a region, such as a ring region. The accumulated evidence provides a feature score without requiring a nodule to fit a specific shape. In another approach, a background level is determined (36) from extracted features. Rather than attempting to normalize an image prior to extraction, the features are normalized (38). The feature normalization and generalized Hough transform extraction may be used together or alone.
摘要翻译：在计算机辅助诊断中为肺结节提供特征处理。使用霍夫变换提取（22）可以更好地区分结节与背景的特征。霍夫变换不是依赖于特定的边界形状，而是积累（26）与区域相关的证据，例如环区域。累积的证据提供了特征评分，而不需要结节来适应特定的形状。在另一种方法中，从提取的特征中确定（36）背景级别。在提取之前，不是试图对图像进行归一化，而是对这些特征进行归一化（38）。特征归一化和广义霍夫变换提取可以一起或单独使用。

10. 发明申请

WO2007120575A3 NIACIN RECEPTOR AGONISTS, COMPOSITIONS CONTAINING SUCH COMPOUNDS AND METHODS OF TREATMENT 审中-公开
标题翻译： NIACIN受体激素，包含这些化合物的组合物和治疗方法
公开(公告)号：WO2007120575A3
公开(公告)日：2008-10-09
申请号：PCT/US2007008584
申请日：2007-04-06
申请人： MERCK & CO INC , COLLETTI STEVEN L , TATA JAMES R , CHEN WEICHUN , BERESIS RICHARD T , DING FA-XIANG , SCHMIDT DARBY RYE , SHEN HONG , RAGHAVAN SUBHAREKHA
发明人： COLLETTI STEVEN L , TATA JAMES R , CHEN WEICHUN , BERESIS RICHARD T , DING FA-XIANG , SCHMIDT DARBY RYE , SHEN HONG , RAGHAVAN SUBHAREKHA
IPC分类号： C07D333/02 , A61K31/381 , A61K31/425 , C07D327/06
CPC分类号： C07D333/38 , C07D277/56 , C07D333/40 , C07D413/14
摘要： The present invention encompasses compounds of Formula (I) as well as pharmaceutically acceptable salts and hydrates thereof, that are useful for treating atherosclerosis, dysliptdemias and the like. Pharmaceutical compositions and methods of use are also included.
摘要翻译：本发明包括式（I）化合物及其药学上可接受的盐和水合物，它们可用于治疗动脉粥样硬化，排尿困难等。还包括药物组合物和使用方法。

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