会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 1. 发明授权
    • Thin-film structure with insulating and smoothing layers between
crossing conductive lines
    • 薄膜结构在交叉导线之间具有绝缘和平滑层
    • US5486939A
    • 1996-01-23
    • US284885
    • 1994-04-28
    • Ronald T. Fulks
    • Ronald T. Fulks
    • H01L23/498G02F1/1333H01L23/48
    • H01L23/49866H01L2924/0002H01L2924/3011
    • A thin-film structure includes conductive lines that cross in a crossover region. A first insulating layer covers the lower conductive line. A second insulating layer is sufficiently thick to isolate signals in the lines and to prevent coupling. Each of the lower conductive line and the second insulating layer can have an edge. A smoothing layer is formed over the edges so that the upper conductive line forms continuously, providing an electrical connection between two points on opposite sides of the edges. The insulating layers can be nitride, separated by an undoped layer of amorphous silicon, so that the same layer sequence can be used as in a thin-film transistor. The smoothing layer can be n+ doped amorphous silicon. The conductive lines can be scan and data lines in an AMLCD or other array.
    • 薄膜结构包括在交叉区域中交叉的导线。 第一绝缘层覆盖下导电线。 第二绝缘层足够厚以隔离线路中的信号并防止耦合。 下导电线和第二绝缘层中的每一个可以具有边缘。 在边缘上形成平滑层,使得上导电线连续地形成,从而在边缘的相对侧上的两个点之间提供电连接。 绝缘层可以是氮化物,由未掺杂的非晶硅层分离,使得可以像薄膜晶体管那样使用相同的层序列。 平滑层可以是n +掺杂的非晶硅。 导线可以是AMLCD或其他阵列中的扫描和数据线。
    • 5. 发明授权
    • Sensor with doped microcrystalline silicon channel leads with bubble
formation protection means
    • 具有掺杂微晶硅通道的传感器带有气泡形成保护装置
    • US5959312A
    • 1999-09-28
    • US714934
    • 1996-09-27
    • Chuang-Chuang TsaiWilliam W. YaoRonald T. Fulks
    • Chuang-Chuang TsaiWilliam W. YaoRonald T. Fulks
    • H01L27/146H01L29/786G01T1/24
    • H01L27/14676H01L27/14603H01L27/14692
    • A sensor device includes a sensing element and a thin film transistor (TFT), and the TFT's channel leads include semiconductor channel leads formed in a layer of microcrystalline silicon (.mu.c-Si). The sensing element is formed in a semiconductor layer that includes silicon-based material and is over the .mu.c-Si layer. Each of the semiconductor channel leads has a structure that prevents formation of bubbles at the lower and upper sides of the .mu.c-Si layer during production of the sensing element. The TFT's channel can be formed in a layer of intrinsic silicon-based material under the .mu.c-Si layer and the .mu.c-Si layer can be a deposited doped layer; or the TFT's channel can be formed in an intrinsic .mu.c-Si layer in which the leads are formed by implanting a dopant. The .mu.c-Si layer can include a sufficiently small amount of hydrogen to prevent formation of bubbles; it can include crystalline grain structures permitting hydrogen to dissipate at a sufficient rate to prevent formation of bubbles; or it can have interfaces sufficiently stable to prevent formation of bubbles.
    • 传感器装置包括感测元件和薄膜晶体管(TFT),TFT的沟道引线包括形成在微晶硅层(mu c-Si)中的半导体沟道引线。 感测元件形成在包括硅基材料并在μ-Si-Si层之上的半导体层中。 每个半导体通道引线具有防止在感测元件的制造过程中在mu-Si层的下侧和上侧形成气泡的结构。 TFT沟道可以形成在μ-Si层下的本征硅基材料层中,并且μ-Si层可以是沉积的掺杂层; 或者TFT的沟道可以形成在其中通过注入掺杂剂形成引线的本征mu c-Si层中。 mu c-Si层可以包括足够少量的氢以防止气泡的形成; 它可以包括允许氢以足够的速率散发以防止气泡形成的晶粒结构; 或者它可以具有足够稳定的界面以防止形成气泡。