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    • 1. 发明公开
    • SYSTEM AND METHOD TO DETERMINE CHROMATIC DISPERSION IN SHORT LENGTHS OF WAVEGUIDES USING A 3-WAVE INTERFERENCE PATTERN AND A SINGLE-ARM INTERFEROMETER
    • 利用3波干涉图案和单臂干涉仪确定波长短波长色散的系统和方法
    • EP2201348A1
    • 2010-06-30
    • EP07815975.3
    • 2007-10-15
    • Galle, MichaelMohammed, WaleedQian, Li
    • Galle, MichaelMohammed, WaleedQian, Li
    • G01M11/02G01J9/02H04B10/08
    • G01M11/3163
    • The present invention relates to a system and method to determine chromatic dispersion in short lengths of waveguides using a three wave interference pattern and a single-arm interferometer. Specifically the invention comprises a radiation source operable to emit radiation connected to a means for separating incident and reflected waves; the means for separating incident and reflected waves having an output arm adjacent to a first end of the waveguide; the means for separating incident and reflected waves connected to a detector; a collimating means positioned at a second end of the waveguide; and a reflecting means positioned at a balanced distance from the collimating means operable to reflect a test emission from the radiation source back through the collimating means, the waveguide, and the means for separating incident and reflected waves thereby generating an interference pattern that is recorded by the detector.
    • 本发明涉及一种使用三波干涉图案和单臂干涉仪来确定短波导中的色散的系统和方法。 具体地说,本发明包括辐射源,其可操作以发射连接到用于分离入射波和反射波的装置的辐射; 用于分离入射波和反射波的装置,其具有与波导的第一端相邻的输出臂; 用于分离连接到检测器的入射波和反射波的装置; 定位在波导的第二端的准直装置; 以及位于与准直装置平衡距离处的反射装置,该反射装置可操作用于将来自辐射源的测试发射反射回准直装置,波导和用于分离入射波和反射波的装置,从而产生干涉图案,该干涉图案由 探测器。