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    • 6. 发明申请
    • Phototransistors, Methods of Making Phototransistors, and Methods of Detecting Light
    • 光电晶体管,制造光电晶体管的方法和检测光的方法
    • US20080203425A1
    • 2008-08-28
    • US10586193
    • 2005-01-24
    • Oleg Sulima
    • Oleg Sulima
    • H01L31/0304H01L31/11G01J1/02
    • H01L31/1105H01L31/03046Y02E10/544
    • A phototransistor (400) comprises an emitter (43) comprising antimony, a base (42) comprising antimony, and a collector (41) comprising antimony. Preferably, the emitter, the base and the collector each comprises at least one of AlInGaAsSb, AlGaAsSb, AlGaSb, GaSb and InGaAsSb. The base comprises an emitter-contacting portion (41b) with a base-contacting portion (43a) of the emitter. The collector comprises a base-contacting portion (41b) which is in contact with a collector-contacting portion (421a) of the base. The phototransistor produces an internal gain upon being contacted with light within a receivable wavelength range, preferably greater than 1.7 micrometers. Also, a method of detecting light using such a phototransistor.
    • 光电晶体管(400)包括包含锑的发射器(43),包含锑的基底(42)和包含锑的收集器(41)。 优选地,发射极,基极和集电极各自包括AlInGaAsSb,AlGaAsSb,AlGaSb,GaSb和InGaAsSb中的至少一种。 基座包括具有发射极的基极接触部分(43a)的发射极接触部分(41b)。 集电器包括与基座的集电极接触部分(421a)接触的基部接触部分(41a)。 在可接收的波长范围内,优选大于1.7微米的光接触时,光电晶体管产生内部增益。 此外,使用这种光电晶体管检测光的方法。